CURRENT SENSING APPARATUS AND METHOD FOR A CAPACITANCE-SENSING DEVICE

• US 20120268145A1
• Filed: 04/20/2011
• Published: 10/25/2012
• Est. Priority Date: 04/20/2011
• Status: Active Grant

• Current Assignee: Parade Technologies, Ltd.
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Grivna, Edward, Chandra, Lokesh
• Granted Patent: US 8,786,295 B2
• Time in Patent Office: Days
• US Class Current: 324/686
• CPC Class Codes: G06F 3/04166 Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving Synchronisation with the driving of the display or the backlighting unit to avoid interferences generated internally G06F3/04184
• CPC Class Codes: G06F 3/044 by capacitive means
• CPC Class Codes: H03K 2217/960735 characterised by circuit details

Abstract

A capacitance-sensing device including a current-to-voltage converter and an analog-to-digital converter is described. A sense element is coupled to an input of the current-to-voltage converter. The current-to-voltage converter is configured to convert current changes in the coupled sense element to an output voltage and to maintain a constant voltage at the input. The analog-to-digital converter is configured to convert the output voltage generated by the current-to-voltage converter to a digital value.

Claims

1. An apparatus, comprising:

a current-to-voltage converter having an input coupled to receive a current representing a capacitance of a sense element, wherein the current-to-voltage converter is configured to convert the current to an output voltage; and

an analog-to-digital converter (ADC) coupled to receive the output voltage of the current-to-voltage converter, wherein the ADC is configured to convert the output voltage to a digital value, and wherein the current-to-voltage converter is configured to maintain an approximately constant voltage at the input of the current-to-voltage converter.

2. The apparatus of claim 1, wherein the current-to-voltage converter is a transimpedance amplifier that comprises an operational amplifier with a negative feedback.

3. The apparatus of claim 2, wherein the input of the current-to-voltage converter is a negative input of the operational amplifier of the transimpedance amplifier.

4. The apparatus of claim 3, further comprising a programmable current source coupled to the negative input of the operational amplifier, wherein the programmable current source is configured to generate a programmable current to offset a current drawn by parasitic capacitance of the sense element.

5. The apparatus of claim 4, wherein the programmable current is approximately equal to the current drawn by the parasitic capacitance of the sense element.

6. The apparatus of claim 4, wherein the programmable current source and the negative input of the operational amplifier are coupled to the sense element via an analog mux bus.

7. The apparatus of claim 2, wherein a reference voltage is coupled to a positive input of the operational amplifier of the transimpedance amplifier.

8. The apparatus of claim 7, wherein the reference voltage is approximately equal to the constant voltage.

9. The apparatus of claim 1, further comprising a switch system coupled between the sense element and the input of the current-to-voltage converter, wherein the switch system is configured to either connect the sense element to or disconnect the sense element from the input of the current-to-voltage converter at a switch frequency.

10. The apparatus of claim 1, further comprising a low pass filter coupled between the current-to-voltage converter and the ADC.

11. A method, comprising:

sensing current changes in a sense element coupled to an input of a capacitance-sensing device;

converting the sensed current changes to an output voltage by the capacitance-sensing device; and

measuring capacitance changes of the sense element by converting the output voltage to a digital value.

12. The method of claim 11, further comprising maintaining an approximately constant voltage at the input of the capacitance-sensing device.

13. The method of claim 11, further comprising generating a programmable current to offset a current drawn by a parasitic capacitance of the sense element.

14. The method of claim 13, wherein the programmable current is programmed to be equal to the current drawn by the parasitic capacitance of the sense element.

15. The method of claim 11, further comprising switching the sense element at a switch frequency.

16. The method of claim 15, wherein the switching the sense element at the switch frequency further comprising:

connecting the sense element to the input of the capacitance-sensing device;

charging the sense element;

disconnecting the sense element from the input of the capacitance-sensing device; and

discharging the sense element.

17. The method of claim 11, further comprising waiting for 15 to 20 μ

s after the converting the sensed current changes to the output voltage before said converting the output voltage to the digital value.

18. The method of claim 11, wherein said converting the output voltage to the digital value is performed substantially instantaneously of said sensing and said converting.

19. An apparatus, comprising:

means for sensing current changes in a sense element coupled to an input of a capacitance-sensing device;

means for converting the sensed current changes to an output voltage by the capacitance-sensing device; and

means for measuring capacitance changes of the sense element by converting the output voltage to a digital value; and

means for maintaining a constant voltage at the input of the capacitance-sensing device.

20. The apparatus of claim 19, further comprising means for generating a programmable current to offset a current drawn by parasitic capacitance of the sense element.