METHOD OF FABRICATING A DUMMY GATE STRUCTURE IN A GATE LAST PROCESS
First Claim
1. A method of semiconductor device fabrication, comprising:
- forming a plurality of gate structures in a first portion of a substrate;
forming a first metal gate structure in a second portion of the substrate, the first metal gate structure being surrounded by an isolation region; and
forming a plurality of dummy gate structures in the second portion of the substrate, wherein the plurality of dummy gate structures are configured in a ring formation encircling the metal gate structure and the isolation region, wherein the plurality of dummy structures have a top surface that is substantially planar with a top surface of the plurality of gate structures, and wherein the first polishing stopper covers at least 5% of a pattern density of the second portion of the substrate.
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Accused Products
Abstract
A method of semiconductor device fabrication including forming a plurality of gate structures in a first portion of a substrate, wherein the plurality of gate structures have a first height. A first metal gate structure is formed in a second portion of the substrate, the first metal gate structure being surrounded by an isolation region. A plurality of dummy gate structures is formed in the second portion of the substrate. The plurality of dummy gate structures are configured in a ring formation encircling the metal gate structure and the isolation region. The plurality of dummy structures have a top surface that is substantially planar with the plurality of gate structures and covers at least 5% of a pattern density of the second portion of the substrate.
10 Citations
20 Claims
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1. A method of semiconductor device fabrication, comprising:
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forming a plurality of gate structures in a first portion of a substrate; forming a first metal gate structure in a second portion of the substrate, the first metal gate structure being surrounded by an isolation region; and forming a plurality of dummy gate structures in the second portion of the substrate, wherein the plurality of dummy gate structures are configured in a ring formation encircling the metal gate structure and the isolation region, wherein the plurality of dummy structures have a top surface that is substantially planar with a top surface of the plurality of gate structures, and wherein the first polishing stopper covers at least 5% of a pattern density of the second portion of the substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method of fabricating a semiconductor device, comprising:
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forming an isolation region in a semiconductor substrate, thereby defining a first area and a second area, the first and second areas being interposed by the isolation region; forming a plurality of transistors formed in the first area, wherein the forming the plurality of transistors includes; forming a first plurality of dummy polysilicon gate structures; removing a layer of each of the first plurality of dummy polysilicon gate structures to provide trenches; and forming metal gate electrodes in the trenches; forming a device element formed in the second area, wherein the device element is one of a MOS device, a BJT device, a diode, and a resistor; and forming a polishing stopper in the second area, wherein forming the polishing stopper includes forming a second plurality of dummy polysilicon gate structures in a ring encircling the device element, wherein the second plurality of dummy polysilicon gate structures are formed concurrently with forming the first dummy polysilicon gate structures of the plurality of transistors. - View Dependent Claims (14, 15)
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16. A method of semiconductor device fabrication, comprising:
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forming a plurality of gate structures in a first portion of a substrate, wherein the plurality of gate structures have a first height; forming a first metal gate structure in a second portion of the substrate, the first metal gate structure being surrounded by an isolation region; and forming a first plurality of dummy gate structures in the second portion of the substrate, wherein the first plurality of dummy gate structures are configured in a ring formation encircling the metal gate structure and the isolation region, wherein first the plurality of dummy structures have a top surface that is substantially planar with the plurality of gate structures; forming an alignment mark in a third portion of the substrate; forming a second plurality of dummy gate structures in the third portion of the substrate, wherein the second plurality of dummy gate structures are formed concurrently with the first plurality of dummy gate structures; and using the alignment mark to align a photomask and the semiconductor substrate during a photolithography process. - View Dependent Claims (17, 18, 19, 20)
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Specification