×

TWO DEGREE OF FREEDOM DITHERING PLATFORM FOR MEMS SENSOR CALIBRATION

  • US 20120272731A1
  • Filed: 01/06/2012
  • Published: 11/01/2012
  • Est. Priority Date: 04/27/2011
  • Status: Active Grant
First Claim
Patent Images

1. A micro-electromechanical system (MEMS) sensing device, the device comprising:

  • a MEMS sensor formed in a plane of a MEMS sensor layer;

    an in-plane rotator configured to dither the MEMS sensor in the plane of the MEMS sensor layer; and

    an out-of-plane rotator configured to dither the MEMS sensor about an axis in the plane of the MEMS sensor layer.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×