METHOD FOR DE-EMBEDDING IN NETWORK ANALYSIS
First Claim
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1. A method for calculating one or more device under test network parameters, comprising the steps of:
- measuring one or more measurement phase system network parameters for a system comprising a device under test and one or more connection elements;
calculating a measurement phase connection element impedance profile for each of the one or more connection elements in accordance with at least the measured measurement phase system network parameters, each measurement phase connection element impedance profile spanning an electrical length;
generating a measurement phase connection element representative model of each of the one or more connection elements in accordance with at least the corresponding calculated measurement phase connection element impedance profile; and
calculating one or more device under test network parameters by removing the effects of the one or more connection elements from the measurement phase system network parameters.
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Abstract
A method is provided for de-embedding fixtures and/or probes from measurements of devices where probes and fixtures are connected between the ports of a network analysis instrument and a device-under-test.
5 Citations
21 Claims
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1. A method for calculating one or more device under test network parameters, comprising the steps of:
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measuring one or more measurement phase system network parameters for a system comprising a device under test and one or more connection elements; calculating a measurement phase connection element impedance profile for each of the one or more connection elements in accordance with at least the measured measurement phase system network parameters, each measurement phase connection element impedance profile spanning an electrical length; generating a measurement phase connection element representative model of each of the one or more connection elements in accordance with at least the corresponding calculated measurement phase connection element impedance profile; and calculating one or more device under test network parameters by removing the effects of the one or more connection elements from the measurement phase system network parameters. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method for calculating one or more calibration phase connection element network parameters for one or more connection elements, comprising the steps of:
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measuring one or more calibration phase system network parameters for a system comprising one or more measurement standards and one or more connection elements; calculating a calibration phase system port impedance profile for each of the one or more system ports in accordance with at least the measured calibration phase system network parameters; generating a calibration phase connection element representative model of each of the one or more connection elements in accordance with at least the corresponding calculated calibration phase system port impedance profile; and calculating one or more calibration phase connection element network parameters of each of the one or more connection elements in accordance with each corresponding calibration phase connection element representative model. - View Dependent Claims (10, 11, 12, 13, 14, 15)
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16. A method for calculating one or more device under test network parameters, comprising the steps of:
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in a calibration phase; measuring one or more calibration phase system network parameters for a system comprising one or more measurement standards and one or more connection elements; calculating a calibration phase system port impedance profile for each of the one or more system ports in accordance with at least the measured calibration phase system network parameters; generating a calibration phase connection element representative model for each of the one or more connection elements in accordance with at least the corresponding calculated calibration phase system port impedance profile; and calculating one or more calibration phase connection element network parameters of each of the one or more connection elements in accordance with each corresponding calibration phase connection element representative model;
whereinthe calculation of the one or more calibration phase connection element network parameters of each of the one or more connection elements is performed by tuning the corresponding calibration phase connection element representative model such that one or more calculated calibration phase system network parameters with the effects of the connection elements removed substantially match one or more predetermined standard network parameters; and in a measurement phase; measuring one or more measurement phase system network parameters for a system comprising a device under test and one or more connection elements; and calculating one or more device under test network parameters by removing the effects of the one or more connection elements from the measurement phase system network parameters. - View Dependent Claims (17, 18, 19, 20, 21)
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Specification