CALIBRATION SYSTEM OF ELECTRONIC DEVICES

• US 20130030766A1
• Filed: 09/23/2011
• Published: 01/31/2013
• Est. Priority Date: 07/25/2011
• Status: Abandoned Application

• Current Assignee: Corn Products International Incorporated (Ingredion Incorporated)
• Original Assignee: STAr Technologies, Inc. (Innotech Corp.)
• Inventors: LOU, CHOON LEONG, VEITAS, VYTENIS, DEHOLLAN, PETER
• Application Number:
  US13/241,787
• Publication Number:
  US 20130030766A1
• Time in Patent Office: Days
• US Class Current: 702/184
• CPC Class Codes: G01R 15/125 for digital multimeters
• CPC Class Codes: G01R 35/005 Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence

Abstract

The present invention discloses a calibration system for electronic devices comprising an electronic calibration device and an electronic device and having a space configured to connect to the electronic calibration device. The electronic calibration device has a calibration parameter storage module configured to pre-store a first standard parameter of a plurality of calibration items of the electronic device.

Claims

1. A calibration system of electronic devices, comprising:

an electronic calibration device; and

an electronic device having a space configured to connect to the electronic calibration device;

wherein the electronic calibration device has a calibration parameter storage module configured to pre-store a first standard parameter of a plurality of calibration items of an electronic device.

2. The calibration system of claim 1, wherein the first standard parameter includes a first date.

3. The calibration system of claim 2, wherein the first date is an expiration date of the first standard parameter.

4. The calibration system of claim 1, wherein the electronic device comprises a second standard parameter having a second date.

5. The calibration system of claim 4, wherein the second date is a written date of the second standard parameter.

6. The calibration system of claim 1, wherein the space includes a parameter data transmitting interface configured to connect the electronic device.

7. The calibration system of claim 1, wherein the plurality of calibration items are selected based on the model of the electronic device.

8. The calibration system of claim 1, wherein the electronic device includes semiconductor equipment.

9. The calibration system of claim 1, wherein the electronic device further comprises a parameter data receiving module, a parameter data comparison module and a parameter data writing module.

10. The calibration system of claim 9, wherein the parameter data receiving module is configured to receive the first standard parameter data of the electronic device.

11. The calibration system of claim 9, wherein the parameter data comparison module is configured to compare the first date and the second date.

12. The calibration system of claim 9, wherein the parameter data writing module is configured to write the first standard parameter data and a written date into the electronic device.