USE OF CHAMBER HEIGHT TO AFFECT CALIBRATION CODE IN TEST STRIP MANUFACTURING
First Claim
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1. A method of manufacturing test strips, comprising (a) selecting a desired first intercept for a batch of test strips and (b) computing a chamber height to be used based on the desired first intercept and a second batch intercept obtained from a previously made test strip batch so that a resulting intercept is substantially equal to the first intercept.
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Abstract
The invention provides a method for varying the intercept of a batch of test strips by varying the height of the strip'"'"'s sample-receiving chamber.
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1 Claim
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1. A method of manufacturing test strips, comprising (a) selecting a desired first intercept for a batch of test strips and (b) computing a chamber height to be used based on the desired first intercept and a second batch intercept obtained from a previously made test strip batch so that a resulting intercept is substantially equal to the first intercept.
Specification