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USE OF CHAMBER HEIGHT TO AFFECT CALIBRATION CODE IN TEST STRIP MANUFACTURING

  • US 20130047415A1
  • Filed: 08/26/2011
  • Published: 02/28/2013
  • Est. Priority Date: 08/26/2011
  • Status: Abandoned Application
First Claim
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1. A method of manufacturing test strips, comprising (a) selecting a desired first intercept for a batch of test strips and (b) computing a chamber height to be used based on the desired first intercept and a second batch intercept obtained from a previously made test strip batch so that a resulting intercept is substantially equal to the first intercept.

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