RC Corner Solutions for Double Patterning Technology
First Claim
1. A method comprising:
- determining model parameters for forming an integrated circuit; and
generating a techfile using the model parameters, wherein the techfile comprises at least two of a C_worst table, a C_best table, and a C_nominal table, and wherein;
the C_worst table stores greatest parasitic capacitances between layout patterns of the integrated circuit when lithography masks comprising the layout patterns shift relative to each other;
the C_best table stores smallest parasitic capacitances between the layout patterns when the lithography masks shift relative to each other; and
the C_nominal table stores nominal parasitic capacitances between the layout patterns when the lithography masks do not shift relative to each other, wherein the techfile is embodied on a tangible non-transitory storage medium.
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Accused Products
Abstract
A method includes determining model parameters for forming an integrated circuit, and generating a techfile using the model parameters. The techfile includes at least two of a C_worst table, a C_best table, and a C_nominal table. The C_worst table stores greatest parasitic capacitances between layout patterns of the integrated circuit when lithography masks comprising the layout patterns shift relative to each other. The C_best table stores smallest parasitic capacitances between the layout patterns when the lithography masks shift relative to each other. The C_nominal table stores nominal parasitic capacitances between the layout patterns when the lithography masks do not shift relative to each other. The techfile is embodied on a tangible non-transitory storage medium.
5 Citations
20 Claims
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1. A method comprising:
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determining model parameters for forming an integrated circuit; and generating a techfile using the model parameters, wherein the techfile comprises at least two of a C_worst table, a C_best table, and a C_nominal table, and wherein; the C_worst table stores greatest parasitic capacitances between layout patterns of the integrated circuit when lithography masks comprising the layout patterns shift relative to each other; the C_best table stores smallest parasitic capacitances between the layout patterns when the lithography masks shift relative to each other; and the C_nominal table stores nominal parasitic capacitances between the layout patterns when the lithography masks do not shift relative to each other, wherein the techfile is embodied on a tangible non-transitory storage medium. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method comprising:
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analyzing polygons in a layout of an integrated circuit, wherein the layout is embodied on a tangible non-transitory computer-readable medium; partitioning the polygons into nets; and finding at least one parasitic capacitance of each of the nets from a techfile, wherein the techfile comprises at least two of a C_worst table, a C_best table, and a C_nominal table, and wherein; the C_worst table stores greatest parasitic capacitances between layout patterns of the integrated circuit when lithography masks comprising the layout patterns shift relative to each other; the C_best table stores smallest parasitic capacitances between the layout patterns when the lithography masks shift relative to each other; and the C_nominal table stores nominal parasitic capacitances between the layout patterns when the lithography masks do not shift relative to each other, wherein during the step of finding, a width and a spacing of the each of the nets are used to index into at least one of the C_worst table, the C_best table, and the C_nominal table. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. A method comprising:
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analyzing polygons in a layout of an integrated circuit, wherein the layout is embodied on a tangible non-transitory computer-readable medium; partitioning the polygons into nets; and finding at least two of a worst capacitance, a best capacitance, and a nominal capacitance for each of the nets from a C_worst table, a C_best table, and a C_nominal table, respectively, wherein the step of finding comprises indexing into the C_worst table, the C_best table, and the C_nominal table using widths and spacings of the nets as indexes. - View Dependent Claims (17, 18, 19, 20)
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Specification