Devices Having an Integrated Computational Element and a Proximal Interferent Monitor and Methods for Determining a Characteristic of a Sample Therewith

• US 20130287061A1
• Filed: 04/26/2012
• Published: 10/31/2013
• Est. Priority Date: 04/26/2012
• Status: Active Grant

• Current Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Original Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Inventors: Freese, Robert, Jones, Christopher Michael, Perkins, David, Simcock, Michael, Soltmann, Bill
• Granted Patent: US 8,879,053 B2
• Time in Patent Office: Days
• US Class Current: 374/142
• CPC Class Codes: G01K 13/00 Thermometers specially adapted for specific purposes
• CPC Class Codes: G01N 21/17 Systems in which incident light is modified in accordance with the properties of the material investigated where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 2201/1211 for temperature
• CPC Class Codes: G01N 2201/1214 for humidity
• CPC Class Codes: G01N 2201/1215 for interfering gases
• CPC Class Codes: G06E 3/001 Analogue devices in which mathematical operations are carried out with the aid of optical or electro-optical elements optical elements per se G02B; devices consisting of a plurality of solid state components, including light sensitive semiconductor components, formed in or on a common substrate H01L27/14; electro-, magneto- or acousto-optics, non-linear optics G02F1/00; graph reading G06K11/00

Abstract

The output of optical computing devices containing an integrated computational element can be corrected when an interferent substance or condition is present. The devices may comprise an optional electromagnetic radiation source; a sample detection unit comprising an integrated computational element and a detector configured to receive electromagnetic radiation that has optically interacted with the integrated computational element and produce a sample signal associated therewith; an interferent monitor located proximal to the sample detection unit, the interferent monitor being configured to produce an interferent signal associated with an interferent substance; and a signal processing unit operable to convert the interferent signal into an interferent input form suitable for being computationally combined with the sample signal, the signal processing unit being further operable to computationally combine the sample signal and the interferent input form to determine a characteristic of a sample in real-time or near real-time.

Claims

1. A device comprising:

an optional electromagnetic radiation source;

a sample detection unit comprising an integrated computational element and a detector that is configured to receive electromagnetic radiation that has optically interacted with the integrated computational element and produce a sample signal associated therewith;

an interferent monitor located proximal to the sample detection unit, the interferent monitor being configured to produce an interferent signal associated with an interferent substance; and

a signal processing unit that is operable to convert the interferent signal into an interferent input form suitable for being computationally combined with the sample signal, the signal processing unit being further operable to computationally combine the sample signal and the interferent input form to determine a characteristic of a sample in real-time or near real-time.

2. The device of claim 1, wherein the sample detection unit and the interferent monitor are located within a sealed container.

3. The device of claim 1, wherein the interferent monitor comprises a sensor selected from the group consisting of a water sensor, a gas sensor, a particulate sensor, a magnetic sensor, an ionizing radiation sensor, and any combination thereof.

4. The device of claim 1, further comprising:

a temperature sensor located proximal to the sample detection unit;

wherein the signal processing unit is further operable to convert an output of the temperature sensor into a temperature input form suitable for being computationally combined with the sample signal, the signal processing unit being still further operable to computationally combine the sample signal, the interferent input form, and the temperature input form to determine a characteristic of a sample.

5. The device of claim 1, further comprising:

a data storage unit that is operable to record the sample signal and the interferent signal as a function of time.

6. The device of claim 1, wherein the sample detection unit comprises two or more integrated computational elements, the integrated computational elements each producing outputs that are computationally combinable to determine a characteristic of a sample.

7. A device comprising:

an optional electromagnetic radiation source;

a sample detection unit comprising a first integrated computational element and a detector that is configured to receive electromagnetic radiation that has optically interacted with the first integrated computational element and produce a sample signal associated therewith;

an interferent monitor located proximal to the sample detection unit, the interferent monitor comprising a second integrated computational element and being configured to produce an interferent signal associated with an interferent substance or an interferent condition;

an optional data storage unit that is operable to record the sample signal and the interferent signal as a function of time; and

a signal processing unit that is operable to convert the interferent signal into an interferent input form suitable for being computationally combined with the sample signal, the signal processing unit being further operable to computationally combine the sample signal and the interferent input form to determine a characteristic of a sample.

8. The device of claim 7, wherein the signal processing unit is operable to determine the characteristic of the sample in real-time or near real-time.

9. The device of claim 7, wherein the sample detection unit comprises a first detector and the interferent monitor comprises a second detector, the second detector being configured to receive electromagnetic radiation that has optically interacted with the second integrated computational element.

10. The device of claim 7, wherein the detector is configured to receive electromagnetic radiation that has optically interacted with the second integrated computational element and electromagnetic radiation has optically interacted with the first integrated computational element, but not at the same time.

11. The device of claim 7, wherein the sample detection unit and the interferent monitor are located within a sealed container.

12. The device of claim 7, further comprising:

a temperature sensor located proximal to the sample detection unit;

wherein the signal processing unit is further operable to convert an output of the temperature sensor into a temperature input form suitable for being computationally combined with the sample signal, the signal processing unit being still further operable to computationally combine the sample signal, the interferent input form, and the temperature input form to determine a characteristic of a sample.

13. The device of claim 7, wherein the signal processing unit is operable to determine the characteristic of the sample in real-time or near real-time.

14. The device of claim 12, wherein the temperature sensor comprises a third integrated computational element.

15. The device of claim 7, wherein the sample detection unit, the interferent monitor, or both comprises an additional integrated computational element, the additional integrated computational element producing an output that is computationally combinable with an output of the first integrated computational element or the second integrated computational element to determine a characteristic of a sample or an interferent substance or condition, respectively.

16. A method comprising:

providing electromagnetic radiation that has optically interacted with or that has been emitted by a sample;

providing a sample detection unit comprising a first integrated computational element and a detector configured to receive electromagnetic radiation that has optically interacted with the first integrated computational element;

optically interacting electromagnetic radiation with the first integrated computational element;

detecting the electromagnetic radiation that has optically interacted with the first integrated computational element, thereby producing a sample signal associated therewith;

monitoring an interferent substance using an interferent monitor and producing an interferent signal associated therewith;

converting the interferent signal into an interferent input form suitable for being computationally combined with the sample signal;

computationally combining the sample signal and the interferent input form so as to produce a combined signal; and

correlating the combined signal to a characteristic of the sample in real-time or near real-time.

17. The method of claim 16, wherein the interferent monitor comprises a sensor selected from the group consisting of a water sensor, a gas sensor, a particulate sensor, a magnetic sensor, an ionizing radiation sensor, and any combination thereof.

18. The method of claim 16, further comprising:

monitoring a temperature of the sample detection unit using a temperature sensor; and

converting an output of the temperature sensor into a temperature input form suitable for being computationally combined with the sample signal;

wherein the combined signal further comprises a computational combination of the temperature input form.

19. The method of claim 16, wherein the interferent monitor comprises a second integrated computational element.

20. The method of claim 16, wherein the electromagnetic radiation optically interacts with the sample before optically interacting with the first integrated computational element.

21. The method of claim 16, wherein the electromagnetic radiation optically interacts with the sample after optically interacting with the first integrated computational element.