POWER SUPPLY TEST DEVICE

• US 20130342237A1
• Filed: 06/10/2013
• Published: 12/26/2013
• Est. Priority Date: 06/21/2012
• Status: Active Grant

• Current Assignee: Fulian Precision Electronics Company Limited
• Original Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Inventors: LI, JI-CHAO, BAI, YUN, TONG, SONG-LIN, LIU, DAN-DAN
• Granted Patent: US 9,176,200 B2
• Time in Patent Office: Days
• US Class Current: 324/764.01
• CPC Class Codes: G01R 31/40 Testing power supplies testing photovoltaic devices H02S50/10

Abstract

A power supply test device includes a function generator, a loading circuit, a current detection circuit, and a controller. The function generator outputs a square-wave signal to the loading circuit. The loading circuit is electronically connected to a power supply, the loading circuit regulates an output current of the power supply according to the square-wave signal. The current detection circuit cooperates with the controller in detecting a slope of the output current. The controller compares the detected slope with a preset value, and regulates the square-wave signal according to the comparison to regulate the slope of the output current.

Claims

1. A power supply test device, comprising:

a function generator outputting a square-wave signal;

a loading circuit electronically connected to the function generator and a power supply, the loading circuit regulating an output current of the power supply according to the square-wave signal;

a current detection circuit; and

a controller electronically connected to the current detection circuit and the function generator, the controller cooperating with the current detection circuit in detecting a slope of the output current, comparing the detected slope with a preset value, and regulating the square-wave signal according to the comparison to regulate the slope of the output current.

2. The power supply test device of claim 1, wherein the controller regulates one of a amplitude and a rise time of the square-wave signal to regulate the slope of the output current.

3. The power supply test device of claim 1, wherein the loading circuit comprises a voltage follower, a first metal-oxide-semiconductor field-effect transistor (MOSFET), and a loading resistor, a non-inverting input terminal of the voltage follower is electronically connected to the output of the function generation to receive the square-wave signal;

an output terminal of the voltage follower is electronically connected to a gate of the first MOSFET;

a drain of the first MOSFET is electronically connected to the output of the power supply, a source of the first MOSFET is grounded via the loading resistor, and a node between the source of the MOSFET and the loading resistor is electronically connected to an inverting input terminal of the voltage follower.

4. The power supply test device of claim 3, wherein the loading circuit further comprises a filtering resistor and a filtering capacitor, the filtering resistor and the filtering capacitor are connected in series between the output terminal and the inverting terminal of the voltage follower.

5. The power supply test device of claim 3, wherein the loading circuit further comprises a current limiting resistor that is electronically connected between the inverting input terminal of the voltage follower and a node between the source of the first MOSFET and the loading resistor, the first current limiting resistor prevents a current output from the inverting input terminal of the voltage follower flowing to the node between the source of the first MOSFET and the loading resistor.

6. The power supply test device of claim 3, wherein the loading circuit further comprises a npn-type bipolar junction transistor (BJT), a pnp-type BJT, a first power and a second power;

the output terminal of the voltage follower is electronically connected to bases of the npn-type BJT and the pnp-type BJT;

a collector of the npn-type BJT is electronically connected to the first power;

an emitter of the npn-type BJT is electronically connected to an emitter of the pnp-type BJT, and a node between the emitters of the npn-type BJT and the pnp-type BJT is electronically connected to gate of the first MOSFET;

a collector of the pnp-type BJT is electronically connected to the second power.

7. The power supply test device of claim 3, wherein the current detection circuit comprises a operational amplifier, a non-inverting input terminal of the operational amplifier is electronically the node between the source of the first MOSFET and the loading resistor, an inverting input terminal of the operational amplifier is electronically connected to a node between the loading resistor and ground, and an output terminal of the operational amplifier is electronically connected to the controller.

8. The power supply test device of claim 7, wherein the operational amplifier amplifies the output current flowing through the loading resistor, converts the output current into a voltage signal, and outputs the voltage signal to the controller;

the controller calculates the value of the output current according to the voltage signal, and calculates the slope of the output current according to the change of the value of the output current.

9. The power supply test device of claim 3, further comprising an enabling circuit, wherein the voltage follower comprises a control terminal, the enabling circuit comprises a second MOSFET and a pull-up resistor;

a gate of the second MOSFET is electronically connected to the controller, a source of the second MOSFET is grounded, and a drain of the second MOSFET is electronically connected to a power via the pull-up resistor;

a node between the drain of the second MOSFET and the pull-up resistor is electronically connected to the control terminal of the voltage follower.

10. The power supply test device of claim 9, wherein the controller switches the second MOSFET on to deactivate the voltage follower, and switches the second MOSFET off to activate the voltage follower.

11. The power supply test device of claim 7, further comprising an enabling circuit, wherein the operational amplifier comprises a control terminal, the enabling circuit comprises a second MOSFET and a pull-up resistor;

a gate of the second MOSFET is electronically connected to the controller, a source of the second MOSFET is grounded, and a drain of the second MOSFET is electronically connected to a power via the pull-up resistor;

a node between the drain of the second MOSFET and the pull-up resistor is electronically connected to the control terminal of the operational amplifier.

12. The power supply test device of claim 1, further comprising a keyboard circuit electronically connected to the controller, wherein the keyboard circuit input the preset value to the controller.

13. The power supply test device of claim 1, further comprising a display electronically connected to the controller, wherein the controller displays the preset value on the display.