Personnel Screening System

• US 20150110250A1
• Filed: 11/03/2014
• Published: 04/23/2015
• Est. Priority Date: 02/01/2007
• Status: Active Grant

• Current Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Original Assignee: Rapiscan Systems Incorporated (OSI Systems Incorporated)
• Inventors: Gray, Stephen, Hughes, Ronald, Ryge, Peter, Kotowski, Andreas F.
• Granted Patent: US 9,291,741 B2
• Time in Patent Office: Days
• US Class Current: 378/87
• CPC Class Codes: G01V 5/20 Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
• CPC Class Codes: G01V 5/222 measuring scattered radiation

Abstract

The present specification discloses an inspection system for detecting objects being carried by a person who is moving along a pathway. The inspection system has two detection systems configured to detect radiation scattered from the person as the person moves along the pathway and an X-ray source positioned between the detection systems. The X-ray source is configured to generate a vertical beam spot pattern and does not generate beams that move horizontally.

Claims

1. An inspection system for detecting objects being carried by a person, wherein said person is moving along a plane defined by a Z axis and a Y axis, the inspection system comprising:

a first detection system configured to detect radiation scattered from said person as the person moves along the Y axis of the plane, wherein said first detection system comprises a first planar surface positioned opposite to the plane, and configured to generate electronic signals responsive to the detected radiation;

a second detection system configured to detect radiation scattered from said person as the person moves along the Y axis of the plane, wherein said second detection system comprises a second planar surface positioned opposite to the plane, and configured to generate electronic signals responsive to the detected radiation;

an X-ray source positioned between said first detection system and said second detection system, wherein said X-ray source is configured to generate a beam spot pattern along the Z axis of the plane and wherein said X-ray source does not generate beams that move along the Y axis of the plane; and

a processing system for analyzing the electronic signals generated by the first detection system and the second detection system and for generating an image on a display.

2. The inspection system of claim 1 wherein the X-ray source is coupled with a beam chopper and wherein said beam chopper operates to produce a scanning pencil beam of X-rays along the Z axis.

3. The inspection system of claim 2 wherein the beam chopper does not produce a scanning pencil beam of X-rays along the Y axis.

4. The inspection system of claim 2 wherein said beam chopper comprises a chopper wheel having three slits and wherein each slit positioned 120 degrees apart from an adjacent slit.

5. The inspection system of claim 4 wherein said slits are aligned with at least two parallel collimator slits and wherein X-rays emitted from the X-ray source conically illuminate the collimator slits to generate at least two parallel scanning beams interleaved in time.

6. The inspection system of claim 2 wherein the beam chopper comprises a hollow cylinder having at least one helical aperture.

7. The inspection system of claim 6 wherein the scanning pencil beam has a linear scan velocity and wherein said linear scan velocity is varied or kept constant by modifying a pitch and roll of at least one of said helical apertures.

8. The inspection system of claim 6 wherein the scanning pencil beam has a spot size and wherein said spot size is varied or kept constant by modifying an aperture width of at least one of said helical apertures.

9. The inspection system of claim 1 wherein the first detection system is contained within a first enclosure, wherein said first enclosure has a first width extending from one end of said first enclosure to an opposing end of said first enclosure and wherein the planar surface extends along the entire first width.

10. The inspection system of claim 9 wherein the second detection system is contained within a second enclosure, wherein said second enclosure has a first width extending from one end of said second enclosure to an opposing end of said second enclosure and wherein the planar surface extends along the entire first width.

11. The inspection system of claim 10 wherein the first enclosure is physically separate from, and independent of, said second enclosure.

12. The inspection system of claim 10 wherein the X-ray source is contained within a third enclosure and wherein the third enclosure is physically separate from, and independent of, the first and second enclosures.

13. The inspection system of claim 12 wherein each of the first, second, and third enclosures weigh less than 88 pounds.

14. The inspection system of claim 12 wherein the third enclosure may be detachably connected to the first enclosure and the second enclosure.

15. The inspection system of claim 12 wherein each of the first, second, and third enclosures may be detachably connected to a frame.

16. The inspection system as claimed in claim 1 wherein the beam chopper comprises a disk chopper that is configured to be rotated by a motor.

17. The inspection system as claimed in claim 16 wherein a speed of the chopper wheel is dynamically controlled by a controller to optimize a scan velocity of an X-ray beam.

18. The inspection system of claim 10 wherein the first enclosure comprises:

a first side defined by a planar surface having an exterior surface facing the person and an interior surface, wherein the first side is configured to receive the radiation scattered from the person;

a second side in an acute angular relationship with said first side, wherein said second side is defined by a planar surface having an interior surface adapted to receive radiation passing through the first side and wherein said second side is configured to only receive radiation after it passes through said first side;

a first substrate positioned on the interior surface of the first side, wherein the first substrate further comprises an active area for receiving and converting said radiation into light;

a second substrate positioned on the interior surface of the second side, wherein the second substrate further comprises an active area for receiving and converting said radiation into light; and

at least one photodetector having a light responsive area and a non-light responsive area, wherein the light responsive area is positioned to receive the light emitted from the first substrate and the second substrate.

19. The inspection system of claim 18 wherein said radiation comprises X-ray photons and wherein said first substrate detects 30-60% of the X-ray photons impinging on said first side.

20. The inspection system of claim 19 wherein said second substrate detects 10-30% of the X-ray photons impinging on said first side.