CMP PAD DRESSERS HAVING LEVELED TIPS AND ASSOCIATED METHODS
First Claim
Patent Images
1. A CMP pad dresser, comprising:
- a support substrate; and
a plurality of superabrasive particles secured to the support substrate with each superabrasive particle extending away from the support substrate to a protrusion distance, wherein a highest protruding tip of each of the plurality of superabrasive particles align along a designated profile with a tip variation of from about 5 microns to about 100 microns.
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Abstract
CMP pad dressers having leveled tips and associated methods are provided. In one aspect, for example, a CMP pad dresser can include a support substrate and a plurality of superabrasive particles secured to the support substrate with each superabrasive particle extending away from the support substrate to a protrusion distance, where a highest protruding tip of each of the plurality of superabrasive particles align along a designated profile with a tip variation of from about 5 microns to about 100 microns.
11 Citations
24 Claims
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1. A CMP pad dresser, comprising:
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a support substrate; and a plurality of superabrasive particles secured to the support substrate with each superabrasive particle extending away from the support substrate to a protrusion distance, wherein a highest protruding tip of each of the plurality of superabrasive particles align along a designated profile with a tip variation of from about 5 microns to about 100 microns. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A CMP pad dresser, comprising:
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a rigid support substrate; and a monolayer of a plurality of superabrasive particles coupled to the support substrate, wherein each superabrasive particle in the monolayer extends away from the support substrate to a protrusion distance, and wherein the difference in protrusion distance between the highest protruding tip and the second highest protruding tip of the monolayer of superabrasive particles is less than or equal to about 50 microns, and the difference in protrusion distance between the highest 1% of the protruding tips of the monolayer of superabrasive particles are within about 80 microns or less. - View Dependent Claims (12, 13, 14, 15)
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16. A CMP pad dresser, comprising:
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a rigid support substrate; and a monolayer of a plurality of superabrasive particles coupled to the support substrate, wherein the plurality of superabrasive particles includes a plurality of working superabrasive particles, such that rotating the dresser against a CMP pad cuts asperities into the CMP pad having a cutting depth of less than or equal to about 50 microns. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23)
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24. A CMP pad dresser, comprising:
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a support substrate; and a plurality of superabrasive particles secured to the support substrate and positioned to engage and dress a CMP pad, wherein the plurality of superabrasive particles cut to depths of less than 50 microns into a CMP pad during a dressing procedure.
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Specification