Waveform Calibration Using Built In Self Test Mechanism

  • US 20150177326A1
  • Filed: 12/20/2013
  • Published: 06/25/2015
  • Est. Priority Date: 12/20/2013
  • Status: Active Grant
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First Claim
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1. A method for operating a transceiver on a chip, the method comprising:

  • performing a calibration procedure comprising;

    generating first constant frequency signal using an adjustable power amplifier in a transmitter portion of the transceiver at a selected operating amplitude level;

    generating a second constant frequency signal having a different but similar fundamental frequency as the first constant frequency signal in a receiver portion of the transceiver;

    receiving a portion of the second constant frequency signal in the receiver portion of the transceiver;

    down-converting the received portion of the first constant frequency signal using the second constant frequency signal to produce low frequency harmonic components indicative of a wave-shape of the first constant frequency signal;

    adjusting the power amplifier across a range of power levels while monitoring an amplitude of one or more of the low frequency harmonic components; and

    selecting an operating power for the adjustable power amplifier for which the amplitude of the one or more low frequency harmonic components is below a threshold value, whereby the wave-shape of the first constant frequency signal is optimized.

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