METHOD AND APPARATUS FOR IMAGING THREE-DIMENSIONAL STRUCTURE

• US 20150282903A1
• Filed: 06/18/2015
• Published: 10/08/2015
• Est. Priority Date: 08/05/1998
• Status: Active Grant

• Current Assignee: Align Technology Incorporated
• Original Assignee: Align Technology Incorporated
• Inventors: Babayoff, Noam, Glaser-Inbari, Isaia
• Granted Patent: US 9,615,901 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: A61B 1/00096 Optical elements
• CPC Class Codes: A61B 1/0625 for multiple fixed illumination angles
• CPC Class Codes: A61B 1/24 for the mouth, i.e. stomatoscopes, e.g. with tongue depressors tongue depressors per se A61B13/00; Instruments for opening or keeping open the mouth combined with saliva removers A61C17/00; mouth openers for animals A61D15/00
• CPC Class Codes: A61B 5/0064 Body surface scanning
• CPC Class Codes: A61B 5/0088 for oral or dental tissue
• CPC Class Codes: A61B 5/1077 Measuring of profiles
• CPC Class Codes: A61B 5/4547 Evaluating teeth
• CPC Class Codes: A61C 13/0004 Computer-assisted sizing or machining of dental prostheses
• CPC Class Codes: A61C 5/77 Methods or devices for making crowns
• CPC Class Codes: A61C 9/0053 Optical means or methods, e.g. scanning the teeth by a laser or light beam
• CPC Class Codes: A61C 9/0066 Depth determination through adaptive focusing
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50
• CPC Class Codes: G16H 20/40 relating to mechanical, radiation or invasive therapies, e.g. surgery, laser therapy, dialysis or acupuncture

Abstract

An apparatus for determining surface topology of a portion of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor.

Claims

1. An apparatus for determining surface topology of a portion of a three-dimensional structure, the apparatus comprising:

a probing member;

an illumination unit configured to generate a plurality of incident light beams;

an optical system configured to focus the plurality of incident light beams to a focal plane external to the probing member so as to illuminate the portion of the three-dimensional structure;

a detector unit configured to measure a characteristic of a plurality of returned light beams generated from illuminating the portion of the three-dimensional structure with the plurality of incident light beams; and

a processor coupled to the detector unit and configured to determine a surface topology of the portion of the three-dimensional structure based at least in part on the measured characteristic of the plurality of returned light beams.

2. The apparatus of claim 1, wherein the detector unit comprises a plurality of sensor elements each configured to measure the characteristic of a corresponding returned light beam in the plurality of returned light beams.

3. The apparatus of claim 1, wherein the optical system comprises a translation mechanism configured to change a position of the focal plane over a range of focal plane positions relative to the probing member.

4. The apparatus of claim 3, wherein the detector unit is configured to measure the characteristic of the plurality of returned light beams over the range of focal plane positions.

5. The apparatus of claim 4, wherein the processor is configured to determine the surface topology based on the characteristic of the plurality of returned light beams measured by the detector unit over the range of focal plane positions.

6. The apparatus of claim 3, wherein the translation mechanism is configured to change the position of the focal plane along a direction of propagation of the plurality of incident light beams.

7. The apparatus of claim 1, wherein the probing member comprises a probing face, and wherein the focal plane is positioned forward of the probing face.

8. A method for imaging a portion of a three-dimensional structure, the method comprising:

providing an apparatus comprising;

a probing member;

an illumination unit configured to generate a plurality of incident light beams;

an optical system configured to focus the plurality of incident light beams to a focal plane external to the probing member so as to illuminate the portion of the three-dimensional structure;

a detector unit configured to measure a characteristic of a plurality of returned light beams that are generated from illuminating the portion of the three-dimensional structure with the plurality of incident light beams; and

a processor coupled to the detector unit and configured to determine a surface topology of the portion of the three-dimensional structure based at least in part on the measured characteristic of the plurality of returned light beams.

9. The method of claim 8, wherein the detector unit comprises a plurality of sensor elements each configured to measure a characteristic of a corresponding returned light beam in the plurality of returned light beams.

10. The method of claim 8, wherein the optical system comprises a translation mechanism configured to change a position of the focal plane over a range of focal plane positions relative to the probing member.

11. The method of claim 10, wherein the detector unit is configured to measure the characteristic of the plurality of returned light beams over the range of focal plane positions.

12. The method of claim 11, wherein the processor is configured to determine the surface topology based on the characteristic of the plurality of returned light beams measured by the detector unit over the range of focal plane positions.

13. The method of claim 10, wherein the translation mechanism is configured to change the position of the focal plane along a direction of propagation of the plurality of incident light beams.

14. The method of claim 8, wherein the probing member comprises a probing face, and wherein the focal plane is positioned forward of the probing face.

15. A method for imaging a portion of a three-dimensional structure, the method comprising:

providing a probing member;

generating a plurality of incident light beams;

focusing the plurality of incident light beams to a focal plane external to the probing member so as to illuminate the portion of the three-dimensional structure;

measuring a characteristic of a plurality of returned light beams generated from illuminating the portion of the three-dimensional structure with the plurality of incident light beams; and

determining a surface topology of the portion of three-dimensional structure based at least in part on the measured characteristic of the plurality of returned light beams.

16. The method of claim 15, further comprising changing a position of the focal plane over a range of focal plane positions relative to the probing member.

17. The method of claim 16, wherein the position of the focal plane of the plurality of incident light beams is changed along a direction of propagation of the plurality of incident light beams.

18. The method of claim 16, wherein the characteristic of the plurality of returned light beams is measured over the range of focal plane positions.

19. The method of claim 17, wherein the surface topology is determined based on the characteristic of the plurality of returned light beams measured over the range of focal plane positions.

20. The method of claim 15, wherein the probing member comprises a probing face, and wherein the focal plane is positioned forward of the probing face.