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TESTING AND SETTING PERFORMANCE PARAMETERS IN A SEMICONDUCTOR DEVICE AND METHOD THEREFOR

  • US 20160054380A1
  • Filed: 09/12/2014
  • Published: 02/25/2016
  • Est. Priority Date: 08/20/2014
  • Status: Active Grant
First Claim
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1. A device, comprising:

  • a temperature circuit that sets a plurality of temperature ranges;

    a performance parameter table, the performance parameter table provides performance parameters based on the temperature range in which the device is operating; and

    performance parameter adjustable circuits coupled to receive the performance parameters and test performance parameters.

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