INTEGRATED OPTICAL NANOSCALE PROBE
First Claim
1. A method comprising:
- providing a bias signal to a recording head that includes a write pole to produce a magnetic field from the recording head;
scanning a probe having a probe tip comprising at least one nitrogen vacancy center through the magnetic field produced by the recording head;
providing an excitation radio frequency (RF) field to the at least one nitrogen vacancy center;
producing excitation illumination that is incident on the at least one nitrogen vacancy center;
measuring Optically Detected Spin Resonance (ODMR) by detecting a decrease in a spin dependent photoluminescence in response to the excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center; and
determining a characteristic of the recording head using the ODMR.
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Accused Products
Abstract
A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).
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Citations
75 Claims
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1. A method comprising:
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providing a bias signal to a recording head that includes a write pole to produce a magnetic field from the recording head; scanning a probe having a probe tip comprising at least one nitrogen vacancy center through the magnetic field produced by the recording head; providing an excitation radio frequency (RF) field to the at least one nitrogen vacancy center; producing excitation illumination that is incident on the at least one nitrogen vacancy center; measuring Optically Detected Spin Resonance (ODMR) by detecting a decrease in a spin dependent photoluminescence in response to the excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center; and determining a characteristic of the recording head using the ODMR. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. An apparatus comprising:
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a biasing source configured to provide a bias signal; a probe card coupled to the biasing source and configured to be connected to a recording head that includes a write pole to provide the bias signal to the recording head that causes the recording head to produce a magnetic field; a probe having a probe tip comprising at least one nitrogen vacancy center, the probe configured to be scanned through the magnetic field produced by the recording head; a light source that produces excitation illumination that is incident on the at least one nitrogen vacancy center; a radio frequency antenna that provides an excitation field to the at least one nitrogen vacancy center; a detector configured to detect photoluminescence produced by the at least one nitrogen vacancy center in the probe tip; a processor coupled to the detector and configured to measure Optically Detected Spin Resonance (ODMR) by detecting a decrease in a spin dependent photoluminescence in response to the excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center; and
determine a characteristic of the recording head using the ODMR. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39)
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40. A method of determining one or more characteristics of a photon emitter, the method comprising:
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producing excitation illumination that is incident on at least one nitrogen vacancy center in a probe tip of a probe, wherein the at least one nitrogen vacancy center produces photoluminescence with an intensity in response to the excitation illumination; producing illumination from the photon emitter, the illumination being incident on the at least one nitrogen vacancy center, wherein the illumination produced by the photon emitter quenches the intensity of the photoluminescence from the at least one nitrogen vacancy center; detecting an amount of quenching of the intensity of the photoluminescence from the at least one nitrogen vacancy center caused by the illumination of the photon emitter; and analyzing the amount of quenching of the intensity of the photoluminescence to determine the one or more characteristics of the photon emitter. - View Dependent Claims (41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58)
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59. An apparatus for determining one or more characteristics of a photon emitter, the apparatus comprising:
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a light source that produces excitation illumination that is incident on at least one nitrogen vacancy center in a probe tip of a probe, wherein the at least one nitrogen vacancy center produces photoluminescence with an intensity in response to the excitation illumination; a detector configured to detect the photoluminescence produced by the at least one nitrogen vacancy center in response to the excitation illumination; a bias source configured to provide bias signals; a probe card coupled to the bias source and configured to be connected to a device that includes the photon emitter, the probe card provides a bias signal to the device that causes the photon emitter to emit illumination that is incident on the at least one nitrogen vacancy center, wherein the illumination produced by the photon emitter quenches the intensity of the photoluminescence from the at least one nitrogen vacancy center; and a processor coupled to control the light source and the bias source and to receive signals from the detector, the processor being configured to determine an amount of quenching of the intensity of the photoluminescence from the at least one nitrogen vacancy center caused by the illumination produced by the photon emitter, and to analyze the amount of quenching of the intensity of the photoluminescence to determine the one or more characteristics of the photon emitter. - View Dependent Claims (60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75)
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Specification