SYSTEMS AND METHODS FOR IMPLEMENTING S/SSTDR MEASUREMENTS
First Claim
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1. A method comprising:
- transmitting plural spread spectrum time domain reflectometry (S/SSTDR) signals onto a signal path of an electronic circuit;
receiving plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit;
receiving plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit; and
processing the reflected signals from the known impedance and the reflections from the unknown component to determine an electrical property of an element of the electronic circuit.
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Abstract
Systems and methods which utilize spread spectrum sensing on live circuits to obtain information regarding a circuit under test are provided. In some embodiments S/SSTDR testing may be utilized to obtain R, L, C and Z measurements from circuit components. In yet further embodiments, these measurements may be utilized to monitor the output of sensors on a circuit.
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20 Claims
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1. A method comprising:
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transmitting plural spread spectrum time domain reflectometry (S/SSTDR) signals onto a signal path of an electronic circuit; receiving plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit; receiving plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit; and processing the reflected signals from the known impedance and the reflections from the unknown component to determine an electrical property of an element of the electronic circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An apparatus comprising:
at least one processing device configured to; transmit plural spread spectrum time domain reflectometry (S/SSTDR) signals onto a signal path of an electronic circuit; receive plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit; receive plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit; and process the reflected signals from the known impedance and the reflected signals from the unknown component to determine an electrical property of an element of the electronic circuit. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. An apparatus comprising:
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at least one processing device configured to form S/SSTDR test signals; and plural input/output ports configured to communicatively connect to a target to be tested; wherein the at least one processing device is configured to simultaneously; transmit plural spread spectrum time domain reflectometry (S/SSTDR) signals onto plural signal paths of an electronic circuit; receive plural reflections of the S/SSTDR signals from a known impedance within the electronic circuit; receive plural reflections of the S/SSTDR signals from an unknown component of the electronic circuit; and process the reflected signals from the known impedance and the reflected signals from the unknown component to determine an electrical property of an element of the electronic circuit. - View Dependent Claims (18, 19, 20)
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Specification