METHODS FOR OPTIMIZED PRODUCTION OF MULTILAYER METAL/TRANSPARENT CONDUCTING OXIDE (TCO) CONSTRUCTS
First Claim
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1. An electrochemical test strip comprising a multilayer construct including:
- a substrate layer having a top surface and a bottom surface,a metal conductor layer deposited onto the top surface of the substrate layer, anda protective layer deposited onto a top surface of the conductor layer, wherein the protective layer is a transparent conducting oxide.
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Abstract
The present disclosure relates to processes and apparatuses for optimizing the single pass production of multilayer constructs including metal/transparent conducting oxide (TCO) multilayers. Articles created from such methods are also disclosed. In particular, multilayer constructs are used as an electrochemical test strip, such as a biosensor, and will be described with particular reference thereto.
1 Citation
20 Claims
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1. An electrochemical test strip comprising a multilayer construct including:
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a substrate layer having a top surface and a bottom surface, a metal conductor layer deposited onto the top surface of the substrate layer, and a protective layer deposited onto a top surface of the conductor layer, wherein the protective layer is a transparent conducting oxide. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of forming an electrochemical test strip having a multilayer construct, comprising:
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processing a surface of a substrate layer to obtain a processed substrate; depositing a metal conductor layer onto the processed substrate, and depositing a protective transparent conductive oxide layer onto the metal conductor layer. - View Dependent Claims (13, 14, 15, 16)
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17. An apparatus for producing a multilayer construct for forming an electrochemical test strip at a high speed in a single pass comprising:
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a rotary drum for unwinding a wound substrate layer, a chamber having a metal sputtering zone, a TCO sputtering zone, and a seal between the metal sputtering zone and the TCO sputtering zone, a dual cathode in the metal sputtering zone for depositing a thin film metal conductor layer on the substrate layer, and a AC sputterer in the TCO sputtering zone for the high speed deposition of a TCO protective layer on the thin film metal conductor layer. - View Dependent Claims (18, 19)
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20. A system comprising:
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an electrochemical test strip with (1) a substrate layer having a top surface and a bottom surface; (2) a metal conductor layer formed on the top surface of the substrate layer; and (3) a protective layer deposited on top of the conductor layer comprising a transparent conductive oxide; and a measuring device.
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Specification