Sensor

• US 20160305763A1
• Filed: 04/17/2015
• Published: 10/20/2016
• Est. Priority Date: 04/17/2015
• Status: Active Grant

• Current Assignee: Rememdia, LC (Sarcos Technology & Robotics Corp.)
• Original Assignee: Rememdia, LC (Sarcos Technology & Robotics Corp.)
• Inventors: Smith, Fraser M.
• Granted Patent: US 9,851,196 B2
• Time in Patent Office: Days
• US Class Current: 1/1
• CPC Class Codes: G01B 11/002 for measuring two or more coordinates
• CPC Class Codes: G01D 5/262 with optical projection of a pointer or a scale
• CPC Class Codes: G01D 5/34 the beams of light being detected by photocells

Abstract

A sensor comprising a light component in support of a light source operable to direct a beam of light onto an imaging device having an image sensor, such as a CCD or CMOS or N-type metal-oxide-semiconductor (NMOS or Live MOS) sensor. The sensor can also comprise an imaging device positioned proximate to the light component and operable to receive the beam of light, and to convert this into an electric signal, wherein the light component and the imaging device are movable relative to one another, and wherein relative movement of the light component and the imaging device is determinable in multiple degrees of freedom. The sensor can also comprise a light deflecting module designed to deflect light from a light component onto the imaging device. The light sources and the resulting beams of light therefrom can comprise a number of different types, orientations, configurations to facilitate different measurable and determinable degrees of freedom by the sensor.

Claims

1. A sensor comprising:

a light component in support of a light source operable to generate a beam of light;

an imaging device positioned proximate to the light component and operable to receive the beam of light, and to convert this into an electric signal, wherein the light component and the imaging device are movable relative to one another,

wherein relative movement of the light component and the imaging device is determinable in multiple degrees of freedom.

2. The sensor of claim 1, wherein a first degree of freedom comprises relative translation along an x-axis, wherein a second degree of freedom comprises relative translation along a y-axis, wherein a third degree of freedom comprises relative rotation about the x-axis, and wherein a fourth degree of freedom comprises relative rotation about the y-axis.

3. The sensor of claim 1, wherein the beam of light comprises a conical shape, and wherein relative movement of the light component and the imaging device is determinable in a fifth degree of freedom comprising relative translation along a z-axis.

4. The sensor of claim 1, wherein relative movement of the light component and the imaging device is determinable in a sixth degree of freedom comprising relative rotation about a z-axis, and upon the axis of rotation being located offset from a longitudinal axis of the light source.

5. The sensor of claim 2, wherein the beam of light comprises a cross-sectional area having a dimension in a first direction greater than a dimension in a second transverse direction, and wherein relative movement of the light component and the imaging device is determinable in a sixth degree of freedom comprising relative rotation about a z-axis.

6. The sensor of claim 5, wherein the z-axis is substantially normal to the imaging device.

7. The sensor of claim 5, wherein the beam of light comprising a cross-sectional area having a dimension in a first direction greater than a dimension in a second transverse direction is generated by a light source having an oblong configuration.

8. The sensor of claim 5, wherein the beam of light comprising a cross-sectional area having a dimension in a first direction greater than a dimension in a second transverse direction is generated by a light source emitting light through an aperture having a suitable cross-sectional shape.

9. The sensor of claim 5, wherein the beam of light comprising a cross-sectional area having a dimension in a first direction greater than a dimension in a second transverse direction is generated by a light source oriented on an incline relative to the imaging device so as to provide the beam of light with an inclined angle of incidence on the imaging device.

10. The sensor of claim 9, wherein the light component and the imaging device are situated substantially parallel to one another, and the light source is mounted on the light component at an incline relative to the imaging device.

11. The sensor of claim 9, wherein the light component and the imaging device are situated substantially non-parallel to one another, and the light source is mounted in a substantially normal orientation on the light component.

12. The sensor of claim 5, wherein the beam of light comprising a cross-sectional area having a dimension in a first direction greater than a dimension in a second transverse direction is generated by a light source and at least one of a lens and collimator operable with the light source.

13. The sensor of claim 1, wherein the light source directs a non-oblong beam of light onto the imaging device.

14. The sensor of claim 1, further comprising a second light source, wherein the light component comprises at least one reflective surface, and wherein the second light source is positioned so as to direct a second beam of light onto the reflective surface of the light component, the reflective surface subsequently deflecting the second beam of light onto the imaging device, the imaging device converting the second beam of light to an electric signal receivable by the light location module.

15. The sensor of claim 14, wherein the position module is configured to determine a relative position of the imaging device and the light component based on the location of the beam of light and the second beam of light on the imaging device.

16. The sensor of claim 1, further comprising a plurality of light sources supported by the light component operative to generate a plurality of beams of light, at least some of the plurality of light sources emitting light at the same or different frequencies.

17. The sensor of claim 1, further comprising a plurality of light sources supported by the light component operative to generate a plurality of beams of light, at least some of the plurality of light sources emitting light at the same or different frequencies, wherein a cumulative, interference light emission having a plurality of edges is caused to be received on the imaging device.

18. The sensor of claim 1, further comprising a light location module configured to receive the electric signal and determine a location of the beam of light on the imaging device;

and a position module configured to determine a relative position of the imaging device and the light component based on the location of the beam of light on the imaging device.

19. The sensor of claim 1, wherein the imaging device comprises an image sensor selected from the group consisting of a charge-coupled device (CCD) sensor, a complementary metal oxide semiconductor (CMOS) sensor, and a N-type metal-oxide-semiconductor (NMOS or Live MOS) sensor.

20. A sensor comprising:

at least one light source operable to direct a beam of light;

an imaging device operable to receive the beam of light, and to convert the beam of light into an electric signal;

a light deflection module proximate the imaging device operable to receive the beam of light and to deflect the beam of light onto the imaging device, wherein the light deflection module and the imaging device are movable relative to one another,

wherein relative movement of the light deflection module and the imaging device is determinable in multiple degrees of freedom.

21. The sensor of claim 20, wherein the light source and the imaging device are fixed relative to one another.

22. The sensor of claim 20, wherein the light source is located substantially in the same plane as the imaging device, and directs the beam of light away from the imaging device towards the light deflection module.

23. The sensor of claim 20, wherein the light deflection module is planar and positioned substantially parallel to the imaging device.

24. The sensor of claim 20, wherein the light deflection module is planar and initially oriented such that at least two of the x-y-z axes of the light deflection module are non-parallel to the imaging device, and wherein relative movement of the imaging device and the light deflection module is determinable in at least five degrees of freedom.

25. The sensor of claim 20, wherein the light deflection module is planar and initially oriented such that all three of the x-y-z axes of the light deflection module are non-parallel to the imaging device, and wherein relative movement of the imaging device and the light deflection module is determinable in six degrees of freedom.

26. The sensor of claim 20, wherein the light deflection module is non-planar, such that relative movement of the imaging device and the light deflection module is determinable in six degrees of freedom.

27. The sensor of claim 20, wherein the light source and the imaging device are powerable from a common side of the sensor.

28. The sensor of claim 20, further comprising two or more light sources operable to direct respective beams of light onto the light deflection module, the imaging device converting the respective beams of light to electric signals receivable by the light location module.

29. The sensor of claim 20, further comprising a plurality of light sources operative to generate a plurality of beams of light, at least some of the plurality of light sources emitting light at the same or different frequencies, wherein a cumulative, interference light emission having a plurality of edges is caused to be received on the imaging device.

30. The sensor of claim 20, further comprising a light location module configured to receive the electric signal and determine a location of the beam of light on the imaging device, and a position module configured to determine a relative position of the imaging device and the light deflection module based on the location of the beam of light as reflected onto the imaging device.

31. A sensor comprising:

a light component in support of at least one light source operable to emit a beam of light;

an imaging device operable to receive the beam of light, and to convert the beam of light into at least one electric signal,

wherein the beam of light comprises an annular configuration having at least two edges at the imaging device, such that more than one light distribution exists about the imaging device, the imaging device converting the light into multiple electric signals.

32. The sensor of claim 31, wherein the at least two edges of the light at the imaging device define outer and inner perimeters of an annular ring, and wherein an area of reduced illumination is adjacent the annular ring.

33. The sensor of claim 31, wherein the light source is configured to direct a series of beams of light onto the imaging device, each beam of light having at least two edges.

34. The sensor of claim 31, further comprising a plurality of light sources supported by the light component operative to generate a plurality of beams of light, at least some of the plurality of light sources emitting light at the same or different frequencies, wherein the light beams from the plurality of light sources are caused to impinge one another to generate a cumulative, interference light emission about the imaging device having a plurality of edges.

35. The sensor of claim 34, wherein the interference light emission comprises a plurality of light distributions greater in number than the number of light sources used to generate the beams of light.

36. The sensor of claim 31, wherein the beam of light comprises an oblong shape.

37. A method for facilitating a displacement measurement, comprising:

providing a light component in support of a light source operable to direct a beam of light;

providing an imaging device positioned proximate to the light component and operable to receive the beam of light, and to convert this into an electric signal, wherein the light component and the imaging device are movable relative to one another; and

facilitating relative movement of the imaging device and the light component.

38. The method of claim 37, further comprising providing a light location module configured to receive the electric signal and determine a location of the beam of light on the imaging device.

39. The method of claim 37, further comprising providing a position module configured to determine a relative position of the imaging device and the light component based on the location of the beam of light on the imaging device.

40. A method for facilitating a displacement measurement, comprising:

providing at least one light source operable to direct a beam of light;

providing an imaging device operable to receive the beam of light, and to convert the beam of light into an electric signal;

providing a light deflecting module proximate the imaging device operable to receive the beam of light and to deflect the beam of light onto the imaging device, wherein the light deflecting module and the imaging device are movable relative to one another,

wherein relative movement of the light deflecting module and the imaging device is determinable in multiple degrees of freedom.

41. The method of claim 40, further comprising providing a light location module configured to receive the electric signal and determine a location of the beam of light on the imaging device.

42. The method of claim 40, further comprising providing a position module configured to determine a relative position of the imaging device and the light deflection module based on the location of the beam of light as reflected onto the imaging device.