Noncontact Measuring Device
First Claim
1. A system comprising:
- a handheld measurement device including;
a first imaging device configured to acquire image data of a surface of an object located in a measurement region relative to the handheld measurement device;
a projected pattern generator configured to generate a divergent pattern of structured light, wherein the divergent pattern of structured light impacts the surface of the object within a field of view of the first imaging device when the object is located in the measurement region; and
a computer system configured to measure a set of attributes of the surface of the object by performing a measurement method including;
activating the first imaging device;
processing the image data acquired by the first imaging device in response to the activating; and
determining a measurement of at least one attribute of the surface of the object based on the processing.
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Abstract
A solution including a noncontact electronic measurement device is provided. The measurement device includes one or more imaging devices configured to acquire image data of a surface of an object located in a measurement region relative to the measurement device and one or more projected pattern generators configured to generate divergent pattern(s) of structured light, which impact the surface of the object within a field of view of the imaging device when the object is located in the measurement region. Using image data acquired by the imaging device(s), a computer system can measure a set of attributes of the surface of the object and/or automatically determine whether the measurement device is within the measurement region. An embodiment is configured to be held by a human user during operation.
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Citations
20 Claims
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1. A system comprising:
a handheld measurement device including; a first imaging device configured to acquire image data of a surface of an object located in a measurement region relative to the handheld measurement device; a projected pattern generator configured to generate a divergent pattern of structured light, wherein the divergent pattern of structured light impacts the surface of the object within a field of view of the first imaging device when the object is located in the measurement region; and a computer system configured to measure a set of attributes of the surface of the object by performing a measurement method including; activating the first imaging device; processing the image data acquired by the first imaging device in response to the activating; and determining a measurement of at least one attribute of the surface of the object based on the processing. - View Dependent Claims (2, 3, 4, 5, 6)
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7. The system of 1, wherein the divergent pattern of structured light includes:
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a first plurality of lines; and a second plurality of lines substantially perpendicular to the first plurality of lines.
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8. A system comprising:
a handheld railroad wheel measurement device including; first and second imaging devices configured to acquire image data of a portion of a railroad wheel located in a measurement region relative to the handheld railroad wheel measurement device, wherein the image data acquired by the first imaging device has a field of view at least partially overlapping the image data acquired by the second imaging device when the railroad wheel is located in the measurement region; a projected pattern generator configured to generate a divergent pattern of structured light, wherein the divergent pattern of structured light impacts a surface of the railroad wheel within the fields of view of the first and second imaging devices when the railroad wheel is located in the measurement region; and a computer system configured to concurrently activate the first and second imaging devices and process the image data acquired by the first and second imaging devices. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A system comprising:
a measurement device including; a first imaging device configured to acquire image data of a surface of an object located in a measurement region relative to the handheld measurement device; a projected pattern generator configured to generate a divergent pattern of structured light, wherein the divergent pattern of structured light impacts the surface of the object within a field of view of the imaging device when the object is located in the measurement region; an accelerometer; and a computer system configured to acquire data for measuring a set of attributes of the surface of the object by performing an acquisition method including; activating the first imaging device and the projected pattern generator; determining a pose of the measurement device using image data acquired by the first imaging device and data received from the accelerometer; and evaluating at least one of;
the image data and the pose to determine whether the measurement device is within a measurement region.- View Dependent Claims (16, 17, 18, 19, 20)
Specification