SEMICONDUCTOR DEVICE, BATTERY MONITORING SYSTEM, AND SEMICONDUCTOR DEVICE DIAGNOSING METHOD
First Claim
1. A semiconductor device comprising:
- a power supply input section to which a first voltage from a battery cell is input;
a boosting section including one end to which the first voltage from the power supply input section is input, and another end that, based on a control signal from a controller, outputs the first voltage or a second voltage boosted from the first voltage from as a power supply voltage; and
a comparison section including an output section, a first input section connected to the power supply input section and the one end of the boosting section, and a second input section connected to the another end of the boosting section, the comparison section outputting a voltage from the output section that corresponds to a difference between voltages input to the first input section and the second input section.
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Accused Products
Abstract
The present disclosure provides a semiconductor device including: a power supply input section to which a first voltage from a battery cell is input; a boosting section including one end to which the first voltage from the power supply input section is input, and another end that, based on a control signal from a controller, outputs the first voltage or a second voltage boosted from the first voltage from as a power supply voltage; and a comparison section including an output section, a first input section connected to the power supply input section and the one end of the boosting section, and a second input section connected to the another end of the boosting section, the comparison section outputting a voltage from the output section that corresponds to a difference between voltages input to the first input section and the second input section.
7 Citations
7 Claims
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1. A semiconductor device comprising:
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a power supply input section to which a first voltage from a battery cell is input; a boosting section including one end to which the first voltage from the power supply input section is input, and another end that, based on a control signal from a controller, outputs the first voltage or a second voltage boosted from the first voltage from as a power supply voltage; and a comparison section including an output section, a first input section connected to the power supply input section and the one end of the boosting section, and a second input section connected to the another end of the boosting section, the comparison section outputting a voltage from the output section that corresponds to a difference between voltages input to the first input section and the second input section. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method for diagnosing a semiconductor device, the method comprising:
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inputting, to a power supply input section, an input voltage from a battery cell; boosting, by a boosting circuit, the input voltage input to one end of the boosting circuit through the power supply input section, and outputting a power supply voltage from another end of the boosting circuit; and outputting, by a comparison section, a voltage difference between a voltage output from an output terminal of a first buffer section and a voltage output from an output terminal of a second buffer section, the first buffer section being driven by the power supply voltage and including the output terminal and an input terminal to which the power supply voltage from the another end of the boosting circuit is input, and the second buffer section being driven by the power supply voltage and including the output terminal and an input terminal input to which the input voltage from the one end of the boosting circuit is input.
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Specification