Field Strength Monitoring for Optimal Performance
First Claim
Patent Images
1. A system, comprising:
- a probe control system coupled to a guided surface waveguide probe, the probe control system being configured to adjust an operational parameter of the guided surface waveguide probe, and the guided surface waveguide probe being configured to launch a guided surface wave over a lossy conducting medium; and
a measurement device in data communication with the probe control system, the measurement device being configured to communicate measured data associated with an electromagnetic field generated by the guided surface waveguide probe to the probe control system.
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Abstract
Disclosed are various embodiments for adjusting an operational parameter of a guided surface waveguide probe according to measurements received from one or more measuring devices. A measuring device measures the conditions associated with an environment of the measuring device. The measuring devices communicates the measured data to the guided surface waveguide probe. Adjustments can be made to one or more operational parameters of the guided surface waveguide probe according to the measured data.
3 Citations
20 Claims
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1. A system, comprising:
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a probe control system coupled to a guided surface waveguide probe, the probe control system being configured to adjust an operational parameter of the guided surface waveguide probe, and the guided surface waveguide probe being configured to launch a guided surface wave over a lossy conducting medium; and a measurement device in data communication with the probe control system, the measurement device being configured to communicate measured data associated with an electromagnetic field generated by the guided surface waveguide probe to the probe control system. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method, comprising:
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determining, via a measurement device, condition data associated with an environment of the measurement device; and transmitting, via the measurement device, the condition data to a control system of a guided surface waveguide probe, the guided surface wave guide probe being configured to launch a guided surface wave over a lossy conducting medium, and the condition data being used to adjust an operation of the guided surface waveguide probe. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A system, comprising:
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a guided surface waveguide probe configured to launch a guided surface wave over a lossy conducting medium; and a probe control system coupled to the guided surface waveguide probe, the probe control system configured to at least; receive condition data from a measurement device, the condition data being measured by the measurement device and corresponding to a condition associated with an environment of the measurement device; and adjust an operational parameter of the guided surface waveguide probe based at least in part on the condition data. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification