ELECTRONIC DEVICE TEST SYSTEM AND METHOD THEREOF

• US 20180210021A1
• Filed: 06/19/2017
• Published: 07/26/2018
• Est. Priority Date: 01/25/2017
• Status: Active Grant

• Current Assignee: Primax Electronics Limited
• Original Assignee: Primax Electronics Limited
• Inventors: CHANG, PEI-MING, HSU, SHIH-CHIEH, ZHANG, SHI-JIE, HUANG, WEI-LUNG
• Granted Patent: US 10,175,280 B2
• Time in Patent Office: Days
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736

Abstract

The present invention provides an electronic device test system, configured to test functions of an electronic device. The electronic device test system includes: a test computer, configured to execute an electronic device test program; a scanning device, configured to scan a barcode number of the electronic device; and an optical sensor module, configured to detect a connection status of the electronic device and the test computer. When the optical sensor module confirms the connection status, the electronic device test program starts a test function to test the electronic device, records a test result of the electronic device according to the barcode number, and subsequently generates a retest rate according to the test result.

Claims

1. An electronic device test system, configured to test functions of an electronic device, wherein the electronic device test system comprises:

a test computer, configured to execute an electronic device test program;

a scanning device, configured to scan a barcode number of the electronic device; and

an optical sensor module, configured to detect a connection status of the electronic device and the test computer, wherein

when the optical sensor module confirms the connection status, the electronic device test program starts a test function to test the electronic device, records a test result of the electronic device according to the barcode number, and subsequently generates a retest rate according to the test result.

2. The electronic device test system according to claim 1, wherein the electronic device test system further comprises a display device, configured to display a human-machine interface of the electronic device test program.

3. The electronic device test system according to claim 1, wherein the optical sensor module comprises a light emitting element and a light receiving element.

4. The electronic device test system according to claim 3, wherein the light emitting element further comprises a mask, configured to maintain a traveling direction of a light ray emitted by the light emitting element.

5. The electronic device test system according to claim 3, wherein the light receiving element is a photo transistor or an optical resistor.

6. The electronic device test system according to claim 1, wherein the electronic device has a universal serial bus interface connection port.

7. The electronic device test system according to claim 1, wherein the electronic device is:

a notebook computer, a tablet computer, a personal digital assistant, a mobile phone, a watch, a game console, a mouse, a keyboard, a screen, a printer, an office machine, a scanner, or a camera.

8. An electronic device test method, used to test functions of an electronic device, wherein the electronic device test method comprises the following steps:

(a) scanning a barcode number of the electronic device;

(b) confirming, by using an optical sensor module, whether the electronic device is connected to a test computer;

if no, generating a warning message;

or if yes, performing the next step;

(c) testing the electronic device;

(d) recording a test result of the electronic device according to the barcode number; and

(e) generating a retest rate according to the test result.

9. The electronic device test method according to claim 8, wherein in step (e), a first pass yield is generated according to the retest rate.