SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
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Abstract
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.
11 Citations
41 Claims
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1-21. -21. (canceled)
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22. A system for manipulating a sample, the system comprising:
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an ion generator configured to generate ions from a sample; an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas; and an ion focusing element that focuses the separated ions from the ion separator at or above atmospheric pressure. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29)
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32. A method for manipulating sample ions, the method comprising:
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generating ions from a sample at or above atmospheric pressure; separating the ions at or above atmospheric pressure without use of laminar flowing gas; and focusing the separated ions at or above atmospheric pressure, thereby manipulating the sample ions. - View Dependent Claims (33, 34, 35, 36, 37, 38)
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39. A method for producing a reaction product, the method comprising:
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generating ions at or above atmospheric pressure; separating the ions at or above atmospheric pressure without use of laminar flowing gas; introducing neutral molecules to the separated ions; reacting a portion of the separated ions with the neutral molecules to produce a reaction product; focusing the reaction product at or above atmospheric pressure; and depositing the focused reaction product at one or more discrete locations on a substrate. - View Dependent Claims (40, 41)
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Specification