COMPUTER CONTROLLED TEST SYSTEM FOR PERFORMING FUNCTIONAL TESTS ON MONOLITHIC DEVICES

• US 3,546,582 A
• Filed: 01/15/1968
• Issued: 12/08/1970
• Est. Priority Date: 01/15/1968
• Status: Expired due to Term

• Current Assignee: Carl C. Gaito, Charles M. Pross, Gary R. Giedd, James W. Lind, John D. Barnard, Merlyn H. Perkins, Thomas G. Greene
• Original Assignee: Carl C. Gaito, Charles M. Pross, Gary R. Giedd, James W. Lind, John D. Barnard, Merlyn H. Perkins, Thomas G. Greene
• Inventors: Barnard, John D., Gaito, Carl C., Giedd, Gary R., Greene, Thomas G., Lind, James W., Perkins, Merlyn H., Pross, Charles M.
• Application Number:
  US04/697,676
• Time in Patent Office: 1,058 Days
• US Class Current: 714/724
• CPC Class Codes: G01R 31/31713 Input or output interfaces for test, e.g. test pins, buffers for scan test G01R31/318572
• CPC Class Codes: G01R 31/31917 Stimuli generation or application of test patterns to the device under test [DUT]
• CPC Class Codes: G01R 31/3193 with comparison between actual response and known fault free response receiver details G01R31/31924

Abstract

A test system is provided for performing functional tests on combinatorial and sequential monolithic devices with the testing automatically programmed under control of a computer processing unit. The test results can be printed out on a printer, logged on tape and/or punched on cards.

Claims