METHOD FOR PREPARING THIN UNSUPPORTED FILMS OF SILICON NITRIDE
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Abstract
A METHOD IS PROVIDED FOR PRODUCTING EXTREMELY THIN, FREE-STANDING OR UNSUPPORTED FILMS OF SILICON NITRIDE, HAVING THE FORMULA SI3N4. THE METHOD INCLUDES THE INITIAL STEP OF SPUTTERED DEPOSITING ON A MOLYBDENUM SUBSTRATE, A THIN LAYER OF SILICON NITRIDE. THE ASSEMBLY IS THEN LOCATED IN AN OVEN, HEATED TO A TEMPERATURE RANGING FROM 500*C. TO 900*C., AND CHLORINE GAS INTRODUCED INTO THE OVEN. IN THIS MANNER, GASEOUS DISSOLUTION OF THE SUBSTRATE IS EFFECTED, RESULTING IN THE PRODUCTION OF THE FREE-STANDING FILM OF SILICON NITRIDE.
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