THIN LAYER CHROMATOGRAPHIC APPARATUS FOR COMPARING A SAMPLE AND A REFERENCE

• US 3,600,099 A
• Filed: 04/07/1970
• Issued: 08/17/1971
• Est. Priority Date: 04/07/1970
• Status: Expired due to Term

• Current Assignee: ABI Analytical Incorporated
• Original Assignee: Dietmar M. Schoeffel
• Inventors: Schoeffel, Dietmar M.
• Primary Examiner(s): Wibert, Ronald L.
• Assistant Examiner(s): Chew, II, Orville B.
• Application Number:
  US05/026,309
• Time in Patent Office: 497 Days
• Field of Search: 356/36,195,206,212,203,244 250/219FR
• US Class Current: 356/435
• CPC Class Codes: G01N 21/86 Investigating moving sheets G01N21/89 takes precedence
• CPC Class Codes: G01N 30/95 Detectors specially adapted therefor; Signal analysis

Abstract

Apparatus for the optical comparison of a moving reference and sample applied to a moving, thin layer, chromatographic plate having a light source, a monochromator, means for splitting the beam from the light source which is transmitted through the monochromator, means for applying the split beam to the closely adjacent reference and sample, means for detecting the ratio between the optical characteristics of the reference and the sample, and means for displaying the ratio.

Claims

2. The invention of claim 1 wherein:

the means for detecting the optical characteristics of the reference is a photomultiplier which measures the reflected optical characteristics of the reference; and

the means for measuring the optical characteristics of the sample is a photomultiplier which measures the reflected optical characteristics of the sample.

3. The invention of claim 2 including:

means connected between the means for determining the ratio of the optical characteristics and the means for displaying the said ratio linearly or logarithmically; and

means for converting the said ratio into a linear function for linear integration thereof.

4. The invention of claim 3 including:

correction means inserted in the light beam between the reference and the photomultiplier associated therewith for controlling the frequency of the light applied to the photomultiplier; and

correction means inserted in the light beam between the sample and the photomultiplier associated therewith for controlling the frequency of the light applied to the photomultiplier.

5. The invention of claim 4 wherein:

at least one of the correction means is a filter.

6. The invention of claim 4 wherein:

at least one of the correction means is an interference wedge.

7. The iNvention of claim 2 including;

means for adjusting the width of the light beams impinging on the reference and the sample.

8. The invention of claim 1 wherein:

the means for detecting the optical characteristics of the reference is a photomultiplier which measures the transmitted optical characteristics of the reference; and

the means for detecting the optical characteristics of the sample is a photomultiplier which measures the transmitted optical characteristics of the sample.

9. The invention of claim 8 including:

means connected between the means for determining the ratio of the optical characteristics and the means for displaying the said ratio linearly or logarithmically; and

means for converting the said ratio into a linear function.

10. The invention of claim 9 including:

correction means inserted in the light beam between the reference and the photomultiplier associated therewith for controlling the frequency of the light applied to the photomultiplier; and

correction means inserted in the light beam between the sample and the photomultiplier associated therewith for controlling the frequency of the light applied to the photomultiplier.

11. The invention of claim 10 wherein:

at least one of the correction means is a filter.

12. The invention of claim 10 wherein:

at least one of the correction means is an interference wedge.

13. The invention of claim 8 including;

means for adjusting the width of the light beam impinging on the reference and the sample.