Measuring instrument

• US 4,084,324 A
• Filed: 04/23/1976
• Issued: 04/18/1978
• Est. Priority Date: 04/23/1975
• Status: Expired due to Term

• Current Assignee: Rank Taylor Hobson Limited
• Original Assignee: The Rank Organisation Ltd.
• Inventors: Whitehouse, David John
• Primary Examiner(s): Bell, Houston S.
• Assistant Examiner(s): Stearns, Richard R.
• Application Number:
  US05/679,819
• Time in Patent Office: 725 Days
• Field of Search: 33/174 L, 33/174 P, 33/174 PA, 33/178 D, 33/178 E, 73/105
• US Class Current: 33/504
• CPC Class Codes: G01B 7/28 for measuring contours or curvatures
• CPC Class Codes: G01B 7/34 for measuring roughness or irregularity of surfaces
• CPC Class Codes: G01B 7/345 for measuring evenness

Abstract

A surface measurement apparatus of the type in which a sensor is traversed along a path in contact with or adjacent the surface of a component under test. The sensor has three or more transducers which, in the described embodiment, physically contact the surface under test and produce individual signals as they are traversed along the same path over the surface of the component under test. The signals produced by the transducers are amplified and combined in such a way that the composite signal so produced is not dependent on any variation in the position of the body of the transducers as the device is traversed along the surface of the component under test thereby allowing the use of sensors which are not mounted on accurately preformed datum-determining mounts such as a flat bed or an accurate spindle.

Claims

1. In a surface measurement apparatus of the type wherein a sensor is traversed along a path in sensing relation with the surface of a component under test and operates to produce sensor output signals representing the surface under test,

the improvement wherein:

said sensor comprises first, second and third transducers,

each said transducer being individually and equally sensitive to surface variations and operating to produce an output signal P₁, P₂, P₃ respectively,

common support means mounting said first, second and third transducers spaced from one another by respective predetermined distances, and in relative positions such that each transducer traverses substantially the same path over the surface of the component upon relative movement of said common support and the component under test, the spacing of said common support from the surface of the component under test providing a reference datum for the transducers in generating the output signals thereof, amplifier means for amplifying the said output signals P₁, P₂, P₃ from said first, second and third transducers respectively such that said output signals are related by relative factors of a, l and b respectively, and

means for combining the output signals from the transducers to produce a composite signal S of the form S = aP₂ + bP₃ - 2P₁ which includes no component due to significant imperfections in the reference datum.

2. The surface measurement apparatus of claim 1, wherein there is further provided

an analysing computer for analysing said composite signal to derive therefrom a signal representing the Fourier transform of said composite signals, said computer also computing the amplitude and phase of the components of the relative Fourier transform of the composite signal with reference to the Fourier transform of the roughness signal derived from any one of the said first, second or third transducers, and

a synthesiser for weighting the amplitude and phase of each component of said Fourier transform of the composite signal inversely by an amount dependent on the computed value of the amplitude and phase respectively of the corresponding term of the relative Fourier transform, whereby to synthesise signals representing components of the Fourier transform of a signal representing the surface under test.

3. The surface measurement apparatus of claim 2, wherein there is further provided a high pass filter between said analysing computer and said synthesiser whereby to adapt said apparatus for the measurement of surface texture of the component under test.

4. The surface measurement apparatus of claim 1, wherein said common support for said plurality of transducers of said sensor is provided with at least one wheel which, in use of the apparatus, rolls over the surface of said component under test whereby to space said common support from the surface of the component under test to form said reference datum.

5. The surface measurement apparatus of claim 4, wherein said common support is also provided with a lateral guide engageable on said component under test for ensuring that the transducers all follow substantially the same path over the surface of the component under test.

6. The surface measurement apparatus of claim 4, wherein said at least one wheel of said common support is provided with means sensitive to the rotation thereof to provide an output signal containing information concerning the position of said common support with respect to said surface of said component.

7. The surface measurement apparatus of claim 1, wherein said common support for said plurality of transducers of said sensor is provided with at least one wheel,

a reference surface adjacent the surface of said component under test, said at least one wheel of said sensor, in use of the apparatus, rolling over said reference surface adjacent said component under test whereby to space said common support from the surface of the component under test to form said reference datum.

8. The surface measurement apparatus of claim 7, wherein said common support is also provided with a lateral guide engageable on said component under test for ensuring that the transducers all follow substantially the same path over the surface of the component under test.

9. The surface measurement apparatus of claim 1, wherein there is further provided an analysing computer for analysing instantaneous changes in slope of said composite signal and for converting these into an analysed signal representing the profile of the surface under test.

10. The surface measurement apparatus of claim 9, wherein there is further provided a low pass filter in advance on said computer.

11. The surface measurement apparatus of claim 9, wherein said computer includes means for deriving from said analysed signal, a signal representing a best fit line with respect to said analysed signal.

12. The surface measurement apparatus of claim 1, adapted for circular components, in which the lines of action of said first, second and third transducers, when projected, meet at a common point.

13. The surface measurement apparatus of claim 12, wherein the angular separation of said first and second transducers is α

and the angular separation of said second and third transducers is β

where;

space="preserve" listing-type="equation">a cos α

+ b Cos β

- 1 = 0

and

space="preserve" listing-type="equation">b Sin β

- a Sin α

= 0.

14. The surface measurement apparatus of claim 1 wherein said first, second and third transducers have substantially equal sensitivity and amplifier means introduces said factors l, a and b by amplifying said output signals P₁, P₂, P₃ by respective gains related by said factors a, l and b.

15. The surface measurement apparatus of claim 1, wherein said first, second and third transducers have relative sensitivities of a, l and b respectively, and said amplifier means operate to amplify said output signals P₁, P₂ and P₃ substantially equally.

16. The surface measurement apparatus of claim 1, wherein said first, second and third transducers mounted on said common support are arranged in a row, and spaced from one another such that the distance between said first and second transducers is l₁ and the distance between said second and third transducers is l₂, and

said relative factors a, l and b relating said output signals from said three transducers are such that:

space="preserve" listing-type="equation">a + b - 2 = 0

and

space="preserve" listing-type="equation">al.sub.1 - bl.sub.2 = 0.

17. The surface measurement apparatus of claim 16, wherein said transducers are spaced along an arcuate row and directed so as to sense the surface of a body having a nominally circular cross section, and there are provided means for deriving the Fourier transform of said composite signal,

means for determining the average value of the zeroth order component of the Fourier transform of a composite signal derived from a complete circumferential traverse of a reference body of known radius, and

means for dividing the zeroth order component of the Fourier transform of said composite signal by a signal related, to a factor, to (l-a-b), whereby to produce an output signal representing the difference in radius between the component under test and said reference body of known radius.

18. In a surface measurement apparatus of the type wherein a sensor is traversed along a path in sensing relation with the surface of a component under test and operates to produce sensor output signals representing the surface under test,

the improvement wherein:

said sensor comprises first, second, third and fourth transducers,

each said transducer being individually sensitive to surface variations and operating to produce an output signal P₁, P₂, P₃, P₄ respectively,

common support means mounting said first, second, third and fourth transducers spaced from one another by respective predetermined distances, and in relative positions such that each transducer traverses substantially the same path over the surface of the component upon relative movement of said common support and the component under test, the spacing of said common support from a fixed surface providing a reference datum for the transducers in generating the output signals thereof, amplifier means for amplifying said output signals P₁, P₂, P₃ and P₄ from said first, second, third and fourth transducers in such a way that, after amplification, said output signals are related by factors l, a, b, and c respectively where l+a+b+c=0, and

means for combining the output signals from the transducers to produce a composite signal S of the form S = P₁ +aP₂ +bP₃ +cP₄ which includes no component due to significant imperfections in the reference datum.

19. The surface measurement apparatus of claim 18, wherein said first, second, third and fourth transducers are spaced along a line and separated from a nominal mid-point of said common support by distanaces l₁, l₂, l₃ and l₄ respectively, said first and second transducers lying to one side of said mid-point and said third and fourth transducers lying to the other side of said mid-point, the lines of action of said four transducers being substantially parallel to one another, said distances l₁, l₂, l₃, l₄ being related to one another such that

20. The surface measurement apparatus of claim 18, wherein said first, second, third and fourth transducers have substantially equal sensitivities and said amplifier means introduces said factors l, a, b and c by amplifying said output signals P₁, P₂, P₃ and P₄ by respective gains related to said factors l, a, b and c.

21. The surface measurement apparatus of claim 18, wherein said first, second, third and fourth transducers have relative sensitivities of l, a, b, and c respectively, and said amplifier means operate to amplify said output signals P₁, P₂, P₃ and P₄ substantially equally.

22. The surface measurement apparatus of claim 18, wherein said common support for said plurality of transducers of said sensor is provided with at least one wheel which, in use of the apparatus, rolls over the surface of said component under test whereby to space said common support from the surface of the component under test to form said reference datum.

23. The surface measurement apparatus of claim 22, wherein said common support is also provided with a lateral guide engageable on said component under test for ensuring that the transducers all follow substantially the same path over the surface of the component under test.

24. The surface measurement apparatus of claim 22, wherein said at least one wheel of said common support is provided with means sensitive to the rotation thereof to provide an output signal containing information concerning the position of said common support with respect to said surface of said component.

25. The surface measurement apparatus of claim 22, wherein there is further provided a towing wire system for providing an output signal representing the position of said transducers along the surface under test.

26. The surface measurement apparatus of claim 18, wherein said common support for said plurality of transducers of said sensor is provided with at least one wheel,

a reference surface adjacent the surface of said component under test, said at least one wheel of said sensor, in use of the apparatus, rolling over said reference surface adjacent said component under test whereby to space said common support from the surface of the component under test to form said reference datum.

27. The surface measurement apparatus of claim 26, wherein said common support is also provided with a lateral guide engageable on said component under test for ensuring that the transducers all follow substantially the same path over the surface of the component under test.

28. The surface measurement apparatus of claim 18, wherein there is further provided an analysing computer for analysing instantaneous changes in slope of said composite signal and for converting these into an analysed signal representing the profile of the surface under test.

29. The surface measurement apparatus of claim 28, wherein there is further provided a low pass filter in advance on said computer.

30. The surface measurement apparatus of claim 28, wherein said computer includes low pass filtering means.

31. The surface measurement apparatus of claim 28, wherein said computer includes means for deriving from said analysed signal, a signal representing a best fit line with respect to said analysed signal.