Loading apparatus for testing a power supply

• US 4,357,574 A
• Filed: 04/25/1980
• Issued: 11/02/1982
• Est. Priority Date: 05/21/1979
• Status: Expired due to Term

• Current Assignee: TAKAMISAWA CYBERNETICS CO., LTD.
• Original Assignee: TAKAMISAWA CYBERNETICS CO., LTD.
• Inventors: Takamisawa, Kaihei, Yui, Masatoshi
• Primary Examiner(s): Strecker, Gerard R.
• Application Number:
  US06/143,706
• Time in Patent Office: 921 Days
• Field of Search: 324/426-430, 324/73 R, 324/73 AT, 324/158 R, 320/48
• US Class Current: 324/72.5
• CPC Class Codes: G01R 31/36 Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
• CPC Class Codes: G01R 31/3842 combining voltage and current measurements
• CPC Class Codes: G01R 31/40 Testing power supplies testing photovoltaic devices H02S50/10

Abstract

Loading apparatus for testing a power supply comprises an electronic load circuit, the electronic load circuit comprising an organically and systematically connected mode switching circuit capable switching from and to one another a constant resistance mode, a constant current mode and a slave mode. A load switching circuit is connected to the mode switching circuit and an error amplifier is adapted to input a voltage signal in each of the modes. A field effect transistor circuit is adapted to receive the output of the error amplifier as a gate control signal and has a drain terminal to which is fed the output from a power unit under test and further has a source terminal, the output of which is fed back as a comparison voltage signal to the error amplifier. A current measurement display circuit is branched to the source terminal of the field effect transistor circuit, and an overpower protection warning circuit is also branched to the source terminal. A voltage measurement display circuit is connected to the drain terminal, and a switching time setting circuit is provided for setting an automatic switching time in the load switching circuit.

Claims

1. A loading apparatus for testing a power supply under both dynamic and static conditions and wherein an artificially created dummy load simulates said power supply, comprising mode selection switching circuit means connected to select a constant resistance mode, a constant current mode and a slave mode;

and load value selection switching circuit means interconnected with said mode selection switching circuit means;

an error amplifier means connected to receive an input voltage signal in each said mode and a comparison voltage signal;

a field effect transistor circuit means connected to receive the output of said error amplifier means as a gate control signal, said field effect transistor circuit means having a drain terminal means connected to receive the output from said power supply under test, said field effect transistor circuit means further having a source terminal means, means feeding the output of said source terminal means as said comparison voltage signal to said error amplifier means, a current display circuit means coupled to said source terminal means of said field effect transistor circuit means;

an overpower protection warning circuit means also coupled to said source terminal means;

a voltage display circuit means interconnected with said drain terminal means; and

a loading switching time setting circuit means for setting a time period in automatic load exchange switching.

2. The loading apparatus for testing a power supply as defined in claim 1, in which said selection switching circuit means includes a constant resistance mode selecting contact means connected to said drain terminal means via a potential divider means, a constant current mode selecting contact means connected to a reference voltage generator circuit means, a slave mode selecting contact means adapted to introduce an external reference voltage and connected to a slave input signal terminal means via a differential amplifier means, and a mode changing switch means for bringing said load value selection switching circuit means selectively into contact means with any of said contacts means.

3. The loading apparatus for testing a power supply as defined in claim 1, in which said load value selection switching circuit means includes a potential divider means adapted to receive a voltage value signal from said mode selection switching circuit means and to output a voltage value signal in any desired ratio, a first and a second loader means both connected in parallel with said potential divider means and being capable of individually setting a load resistance value or load current value, a load selection switching circuit means for selecting any of said loaders, means a signal input contact from said switching time setting circuit means, an external switching signal input contact connected to an external switching input terminal means via a differential amplifier means, and an internal/external switching signal selection switch means for alternative connection of any of said contacts means to said load selection switching circuit means.

4. The loading apparatus for testing a power supply as defined in claim 1, in which said load switching circuit means and said error amplifier means are connected to a master output signal terminal means branched from therebetween and adapted to output each mode voltage signal.

5. The loading apparatus for testing a power supply as defined in claim 1, in which a current detection resistor means is interposed between the source terminal means of said field effect transistor circuit means and a minus power input terminal means.

6. The loading apparatus for testing a power supply as defined in claim 1, in which between the source terminal means of said field effect transistor circuit means and said error amplifier means and also between said source terminal means and said overpower protection warning circuit means is connected in common a current amplifier means.

7. The loading apparatus for testing a power supply as defined in claim 1, in which the source terminal means of said field effect transistor circuit means is connected to a current monitor means for oscilloscope means.

9. The loading apparatus for testing a power supply as defined in claim 1, in which said current measurement display circuit means consists of a current A-D converter means and an ammeter means.

10. The loading apparatus for testing a power supply as defined in claim 1, in which said overpower protection warning circuit means includes a power multiplier means adapted to input simultaneously in parallel a current value signal from the current amplifier means and a voltage value signal from the drain terminal means, a comparator means adapted to compare, for the protection against overpower, a power value signal from said power amplifier means with a reference voltage value signal from the reference voltage generator circuit means, a protective circuit means which, when an excess value signal is output from said comparator means, cuts off current for a definite interval of time and thereafter resets automatically, and a warning lamp means adapted to light while said protective circuit means is in operation.

11. The loading apparatus for testing a power supply as defined in claim 1, in which said voltage measurement display circuit means includes an internal/external voltage value signl selecting switch means for alternatively switching either a contact means connected to the drain terminal means or a contact means connected to the external input terminal means, an automatic switching means adapted to switch automatically into two ranges in response to an analog voltage value signal which has been input via said selection switch means, an A-D voltage converter means for converting said analog voltage value signal into a digital voltage value signal, a voltmeter means for successively indicating digitized voltage value signals, and a decimal point shifting circuit means for having said voltmeter means shifted the decimal point upon receipt of a switching command signal from said automatic switching means.

12. The loading apparatus for testing a power supply as defined in claim 1, in which said switching time setting circuit means includes an on-off switch means for making or breaking the connection with an oscillator means, a load selection switch for selecting a switching signal from said oscillator means in correspondence to said first and second loaders means of said load switching circuit means, and a switching time adjusting circuit means in which are disposed regulators means in parallel to preset switching times for said first and second loaders means, said switching time adjusting circuit means being adapted to receive a switching signal introduced via said load selection switch means and to output it to said load switching circuit means.

8. The loading apparatus for testing a power supply as defined in caim 1, in which as overheat protection warning circuit means is connected between said error amplifier means and said field effect transistor circuit means.

13. A loading apparatus for testing a power supply under dynamic and static conditions, comprising field effect transistor circuit means having gate, drain and source terminals, means coupling the power supply under test between the drain and source terminals, means deriving a comparison signal from said source terminal, an error amplifier, input signal producing means, means applying the output of said input signal producing means and said comparison signal to said error amplifier means, means coupling the output of said error amplifier means to said gate terminal, current display means coupled to said source terminal of said field effect transistor circuit means, over power protection warning circuit means coupled to said source terminal means, voltage display circuit means coupled to said drain terminal means, and a loading time setting circuit means connected to control the application of the output of said input signal producing means to said error amplifier, said input signal producing means comprising means producing a first voltage proportional to the voltage at said drain terminal, means producing a second reference voltage, means producing a third voltage proportional to an external reference signal, and selection switch means coupled to selectively apply said first, second and third voltages to said error amplifier.