Double focussing mass spectrometer

• US 4,427,885 A
• Filed: 11/27/1981
• Issued: 01/24/1984
• Est. Priority Date: 11/27/1981
• Status: Expired due to Fees

• Current Assignee: Shimadzu Seisakusho Limited
• Original Assignee: Shimadzu Seisakusho Limited
• Inventors: Takeda, Takehiro
• Primary Examiner(s): Smith, Alfred E.
• Assistant Examiner(s): Berman, Jack I.
• Application Number:
  US06/325,189
• Time in Patent Office: 788 Days
• Field of Search: 250/296, 250/396
• US Class Current: 250/296
• CPC Class Codes: H01J 49/326 with magnetic and electrostatic sectors of 90 degrees

Abstract

A mass spectrometer comprising an ion source for producing an ion beam, an ion optical system having an entrance and an exit slit, and an ion detector. The ion optical system comprises a series combination of an energy dispersing unit and a mass dispersing unit. The energy dispersing unit comprises a toroidal electrical field having a deflection angle of 85° to 95° while the mass dispersing unit comprises a homogeneous magnetic field having a deflection angle of 85° to 95° and an entrance end face made concave as viewed from the entrance side of the ion beam when the apparatus is operated as a double focussing mass spectrometer of the reverse geometry type and an exit end face inclined 6° to 14° to the negative side from a position perpendicular to the axis of the ion optical system.

Claims

1. A double focussing mass spectrometer comprising an ion optical system having an entrance slit and an exit slit and an ion detector, said ion optical system comprising a series combination of an energy dispersing unit and a mass dispersing unit, said energy dispersing unit comprising a toroidal electric field having a deflection angle of 85°

to 95° and

a toroidal constant of 0.45 to 0.55, and said mass dispersing unit comprising a homogeneous magnetic field having a deflection angle of 85°

to 95°

, a concave entrance end face having a radius of curvture of -a_m to -1/2a_m where a_m is the ion orbital radius in said magnetic field, and a flat exit end face inclined at an angle of 6°

to 14°

to the negative side from a position perpendicular to the optical axis of said ion optical system, the ratio a_e /a_m where a_e is the ion orbital radius in said electric field, being between 0.75 and 0.9 and the distance between the entrance end face of said magnetic field and said entrance slit being between 0.85a_m and 1.25a_m.

2. The double focussing mass spectrometer of claim 1, wherein said toroidal electric field has curved entrance and exit end faces, the radius of curvature RE₁ of said entrance end face being between -a_e and a_e while the radius of curvature RE₂ of said exit end face is between -2a_e and 0.6a_e.

3. The double focussing mass spectrometer of claim 1, further including a second ion detector capable of being selectively disposed between said mass dispersing unit and energy dispersing unit to detect the ion beam emerging from said mass dispersing unit.