Light guide reflectometer

• US 4,518,259 A
• Filed: 07/26/1982
• Issued: 05/21/1985
• Est. Priority Date: 07/26/1982
• Status: Expired due to Fees

• Current Assignee: Eastman Kodak Company
• Original Assignee: Eastman Kodak Company
• Inventors: Ward, John W.
• Primary Examiner(s): McGraw, Vincent P.
• Application Number:
  US06/401,754
• Time in Patent Office: 1,030 Days
• Field of Search: 356/445-448, 356/236, 250/227, 362/31, 362/32
• US Class Current: 356/446
• CPC Class Codes: G01N 21/474 Details of optical heads therefor, e.g. using optical fibres

Abstract

There is disclosed a reflectometer comprising a one-piece molded housing that includes a radiation guide, and a source means and detector means contained within the housing, for the analysis of a test element. The guide, source means and detector means are disposed so that the detector means detects reflectance from the test element that is substantially free of specular reflectance.

Claims

1. In a reflectometer adapted for measuring non-uniform distribution of density and comprising source means for generating radiation suitable to illuminate a test element, detector means for detecting radiation reflected from such test element, and one piece molded housing means in which said source means and said detector means are mounted, said housing means including as portions integral therewith, means for predeterminedly positioning such test element and optically transmissive radiation guide means constructed to guide said radiation from said source means to be positioned test element,

the improvement wherein (i) said source means includes means for at least partially collimating said illuminating radiation,

(ii) said radiation guide means includes an internally reflective surface constructed and located to direct said beam to illuminate a selected portion of a positioned test element, and

(iii) said detector means is located with respect to said positioning means, said source means and said reflecting surface so that the test element is illuminated by a whole spot of light that is disposed approximately centered above said detector means, and said detector means receives from an illuminated test element only radiation diffusely reflected from the illuminated test element.

3. A reflectometer as defined in claim 1 or 2, and further including means for trapping specular reflectance emanating from an illuminated test element.

4. A reflectometer as defined in claim 3, wherein said trapping means includes an inactivated source means for generating illuminating radiation, a portion of said guide means being disposed to direct said specular reflectance to said inactivated source means.

5. A reflectometer as defined in claim 1 or 2, wherein said reflective surface comprises a generally planar, smooth exterior surface of said guide means, disposed to reflect said illuminating radiation received from said source means.

6. A reflectometer as defined in claim 1 or 2, wherein said source means includes a lens that directs said illuminating radiation as said partially collimated beam.

7. A reflectometer as defined in claim 1 or 2, wherein said source means is mounted wholly within said housing means so as to minimize the thickness of said reflectometer.

8. A reflectometer as defined in claim 1 or 2, wherein said guide means is constructed to direct specular reflectance out of said reflectometer.

9. A reflectometer as defined in claim 1, wherein said guide means is said housing.

10. A reflectometer as defined in claim 1, wherein said guide means has surfaces extending from said detector means to said positioning means, angled so that said beam exits one of said surfaces at an angle of about 90°

before illuminating a positioned element.

12. A reflectometer as defined in claim 1 or 2, and further including shield means disposed around at least a portion of said detector means for blocking all line-of-sight radiation from said source means to said detector means.

13. A reflectometer as defined in claim 12, wherein the distance Z between said shield means and said illuminated test element, measured from the outside diameter of the light-blocking portion of said shield means, is the value determined by the equation

Z=w tan α

wherein w is said outside diameter and α

is the angle at which said beam is reflected from said reflective surface.

2. In a reflectometer adapted for measuring non-uniform distribution of density and comprising source means for generating illuminating radiation;

detector means for detecting radiation reflected from a test element;

one piece molded housing means in which said source means and said detector means are mounted, said housing means including as portions integral therewith, a support for such test element and optically transmissive radiation guide means disposed between said source means and said test element support constructed to direct said illuminating radiation onto said supported test element;

the improvement wherein (i) said source means is constructed to deliver at least a partially collimated beam of radiation,

(ii) said guide means includes an internally reflective surface optically disposed to direct said beam to illuminate a selected portion of said test element, and

(iii) said detector means is disposed with respect to said support, said source means and said reflective surface so that the test element is illuminated by a whole spot of light that is disposed approximately centered above said detector means, and said detector means receives from said illuminated element only reflected radiation substantially free of specular reflectance of said beam.

11. A reflectometer as defined in claim 2, wherein said guide means has surfaces extending from said detector means to said test element support, angled so that said beam exits one of said surfaces at an angle of about 90°

before illuminating said supported test element.