Apparatus for sensing two components of a magnetic field

• US 4,525,671 A
• Filed: 09/08/1982
• Issued: 06/25/1985
• Est. Priority Date: 09/09/1981
• Status: Expired due to Fees

• Current Assignee: Thorn EMI Patents Limited
• Original Assignee: EMI (Entegris Incorporated)
• Inventors: Sansom, David J.
• Primary Examiner(s): Strecker, Gerard R.
• Assistant Examiner(s): Snow, Walter E.
• Application Number:
  US06/415,793
• Time in Patent Office: 1,021 Days
• Field of Search: 324/249, 324/252, 324/232, 324/262, 324/235, 338/32 R, 307/309, 365/8
• US Class Current: 324/252
• CPC Class Codes: G01R 33/09 Magnetoresistive devices

Abstract

A sensing element suitable for sensing two components h_x and h_y of an external magnetic field in an orthogonal co-ordinate system comprises a reverse C-shape first electrical conductor vacuum deposited onto an electrical insulating substrate. A layer of photoresist applied to a region insulates the conductor from a magnetoresistive element which has two connectors linked thereto. Further application of photoresist insulates the element from a second vacuum deposited electrical conductor. Wires locate with respective conductors where gold deposition in the vicinity of the wire ends achieves electrical continuity. A control circuit applies current, within a periodic cycle, in alternate directions through the first conductor while a current is applied in a single direction through the second conductor. In the following cycle the current direction through the second conductor is reversed. Values of the element electrical resistivity for the four combination of current (and hence magnetic field) directions allow solution of a simultaneous equation to yield h_x and h_y.

Claims

1. Apparatus for sensing first and second orthogonal components h_x and h_y of an external magnetic field h, said apparatus including a planar magnetoresistive element, said element comprising a magnetically anisotropic thin film having an easy axis of magnetization in the plane of the film, said film being provided with electrical contacts connectable to means for passing an electrical current through the film in a direction substantially parallel to said easy axis, said contacts also being connectable to detecting means for sensing a signal indicative of the resistivity of said film when said current is passed therethrough, said apparatus further including application means for selectively applying to the film a first magnetic bias field and a second magnetic bias field, said first bias field acting substantially at right angles to said easy axis in the plane of the film and said second bias field acting substantially parallel to said easy axis, and control means permitting said first and second bias fields to be applied to said element in a plurality of pre-determined relationships, said element, in use, being placed in said external magnetic field h with said component h_x lying in a direction at right angles to said easy axis in the plane of the film and said component h_y lying parallel to said easy axis, and said detection means sensing signals indicative of the resistivity of said film whilst said application means selectively applies said first and second bias fields in a plurality of different relationships, said relationships being chosen such that said components h_x and h_y may be derived from said signals.

2. Apparatus according to claim 1 wherein said application means selectively reverses the directions of said bias fields such that said first magnetic bias field initially has a value +H₁ which may be reversed to -H₁ and said second magnetic bias field initially has a value +H₂ which may be reversed to -H₂, said control means causing said first and second bias fields to be simultaneously applied and said detection means sensing signals, A'"'"', B'"'"', C'"'"' and D'"'"' under conditions of simultaneously applied bias fields as follows:

A'"'"' represents film resistivity with H₂ positive and H₁ negative

B'"'"' represents film resistivity with H₂ positive and H₁ positive

C'"'"' represents film resistivity with H₂ negative and H₁ negative

D'"'"' represents film resistivity with H₂ negative and H₁ positive,

whereby said component h_x is related to [(A'"'"'+C'"'"')-(B'"'"'+D'"'"')] and said component h_y is related to [(B'"'"'+A'"'"')-(D'"'"'+C'"'"')].

3. Apparatus according to claim 1 wherein said element comprises a nickel iron alloy deposited on to an insulating planar substrate.

4. Apparatus according to claim 1 wherein said application means for applying said first bias field includes at least one planar electrical conductor, said conductor lying adjacent said film and electrically insulated from said film, said conductor being connectable to an electrical current source to cause an electrical current to flow through said conductor in a direction substantially parallel to said easy axis.

5. Apparatus according to claim 1 wherein said application means for applying said second bias field includes at least one planar electrical conductor, said conductor lying adjacent said film and electrically insulated from said film, said conductor being connectable to an electrical current source to cause an electrical current to flow through said conductor in a direction substantially at right angles to said easy axis.

6. Apparatus according to claim 1 wherein said control means includes a timing control circuit connected to said application means, said timing control circuit enabling said application means to repeatedly apply said first and second bias fields in said chosen plurality of different relationships in a particular sequence, whereby said signals indicative of the resistivity of said film are repeatedly generated in correspondence to said particular sequence.

7. Apparatus according to claim 1 wherein said detection means includes respective sampling units for each of said chosen relationships, each of said sampling units being connected to said timing control circuit, causing each of said signals to be independently sampled.