Compact reflectometer

• US 4,552,458 A
• Filed: 10/11/1983
• Issued: 11/12/1985
• Est. Priority Date: 10/11/1983
• Status: Expired due to Term

• Current Assignee: Clinical Diagnostic Systems Inc.
• Original Assignee: Eastman Kodak Company
• Inventors: Lowne, Alan J.
• Primary Examiner(s): McGraw, Vincent P.
• Assistant Examiner(s): Thompson, Robert
• Application Number:
  US06/540,729
• Time in Patent Office: 763 Days
• Field of Search: 356/445, 356/446, 356/39, 356/42, 356/38, 356/71, 356/73, 356/447, 356/448, 422/68, 422/57, 422/55, 250/559
• US Class Current: 356/446
• CPC Class Codes: G01N 2021/3181 using LEDs
• CPC Class Codes: G01N 2021/478 Application in testing analytical test strips
• CPC Class Codes: G01N 21/474 Details of optical heads therefor, e.g. using optical fibres
• CPC Class Codes: G01N 21/8483 Investigating reagent band test-element handling not specific to a test method G01N33/4875; analytical elements specific to chemical analysis of biological material G01N33/52; autometer with reagent band G01N35/04
• CPC Class Codes: G01N 2201/1245 Averaging several measurements

Abstract

A thin, compact reflectometer is adapted to support and position a generally planar test element in a predetermined, generally horizontal plane during usage. The reflectometer includes a light source and a detector having major portions of their respective illumination and detection axes extending generally parallel to a planar reflectometer-positioning portion on one of two major surfaces of the reflectometer.

Claims

1. A compact reflectrometer for providing quantitative measurement of reflection densities, said reflectometer comprising

means for supporting a generally planar test element in a predetermined plane, contacting the reflectometer,

planar means on a major exterior surface of the reflectometer for orienting said predetermined plane generally horizontally when said planar means is placed on a rest surface,

a light source constructed to project a beam of light centered on an axis of illumination,

light detector means constructed to receive light centered on an axis of detection, said light source and said detector means being disposed with said axes each being generally parallel to said planar orienting means of the reflectometer,

and reflecting means for (a) reflecting light from said source to a predetermined location in said predetermined plane, said source light traveling from said reflecting means along a first path;

and (b) reflecting to said detector means only light that is diffusely reflected from a test element at said predetermined location in said predetermined plane, such diffusely reflected light traveling from said reflecting means along a second path;

said reflecting means, light source, and detector means being three dimensionally disposed so that said first and second paths do not lie in a common plane.

2. A reflectometer as defined in claim 1, wherein said predetermined plane of the test element is generally parallel to said axes,

and said directing means comprises at least one reflecting surface for reflecting light to and from a test element supported in said predetermined plane.

3. A reflectometer as defined in claim 1, wherein said first path strikes said predetermined plane at a non-orthogonal angle and said diffusely reflected light extends orthogonally from said predetermined plane.

4. A reflectometer as defined in claim 3, wherein said non-orthogonal angle is about 60°

.

5. A reflectometer as defined in claim 1, wherein said reflecting means comprises a single mirror surface disposed to reflect both said source light along said first path and diffusely reflected light along said second path.

6. A reflectometer as defined in claim 1, and further including reference detector means for detecting said light source directly as a reference against which detection by said light detector means is compared, said reflecting means being disposed between said light source and said reference detector means and constructed to pass a fraction of the light received from said light source, to said reference detector means.

7. A reflectometer as defined in claim 1, wherein the total thickness of said reflectometer, is no greater than 2 cm.

8. A reflectometer as defined in claim 1, and further including a light trap disposed to receive light specularly reflected by the supported test element from said light source, and a second light source disposed in said trap with an axis of illumination directed at said reflecting means, said second light source emitting light at a wavelength different from said first-named light source.