Method for the determination of species in solution with an optical wave-guide

• US 4,608,344 A
• Filed: 05/18/1983
• Issued: 08/26/1986
• Est. Priority Date: 09/18/1981
• Status: Expired

• Current Assignee: Battelle Memorial Institute
• Original Assignee: Battelle Memorial Institute
• Inventors: Dahne, Claus, Place, John F., Carter, Timothy J. N.
• Primary Examiner(s): Richman, Barry S.
• Assistant Examiner(s): Gzybowski, Michael S.
• Application Number:
  US06/499,164
• Time in Patent Office: 1,196 Days
• Field of Search: 356/440, 356/435, 356/436, 356/445, 356/448, 356/414, 356/417, 356/418, 422/55-60, 422/68, 422/73, 422/86, 435/7, 436/164, 436/165, 436/34, 436/514, 436/527, 436/535, 436/805
• US Class Current: 436/34
• CPC Class Codes: G01N 21/6452 Individual samples arranged in a regular 2D-array, e.g. multiwell plates
• CPC Class Codes: G01N 21/648 using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
• CPC Class Codes: G01N 21/7703 using reagent-clad optical fibres or optical waveguides using measurement of total internal reflection or attenuated total reflection G01N21/552; optical fibres or waveguides per se G02B
• CPC Class Codes: G01N 33/553 Metal or metal coated
• CPC Class Codes: Y10S 436/805 Optical property

Abstract

An analyte in solution is made to react with a spectific reactant coated on the wave-guide thus modifying the optical properties thereof. The index of refraction of the wave-guide material is higher than that of the reaction medium which ensures that a light signal injected into said guide be carried by multiple total reflection, the distance of penetration of the evanescent wave associated with the totally reflected signal being of the same order of magnitude or greater than the thickness of the analyte-reactant product layer.

Claims

1. A method of determining the presence of an analyte in solution, which comprises the steps of:

(a) applying a film of a reactant to a surface of an optical waveguide having a refractive index n₁ ;

(b) injecting a light signal of a wave length λ

into said waveguide at one end thereof and measuring at another end of said waveguide a light signal modification resulting from an evanescent light component associated with said signal in said waveguide, said light signal being internally reflected at an angle θ

of internal reflection;

3. The method defined in claim 1 wherein the electric field E of said evanescent component at a depth of penetration dp corresponding to the thickness of said reactant product layer is at least 0.1 of the value Eo of the electric field at zero depth.

4. The method defined in claim 1 in which said modification refers to the adsorption of the light signal, said modification leading to a decrease with time of the light signal measured at an output of said waveguide.

5. The method defined in claim 1 in which said modification is the generation of a fluorescent light signal, said fluorescent light signal increasing with time as measured at an output of said waveguide.

6. The method defined in claim 1 in which modification is the scattering of said light wave signal, the extent of such scattering increasing with time and being measurable partly laterally of the scattering region and partly at an output of the waveguide.

7. The method defined in claim 1 in which a polarized light signal is used and in which said modification affects elliptical polarization parameters of said signal,

8. The method defined in claim 1 in which the waveguide is selected from light transparent plate, rod or fiber with refractive index of at least 1.4.

9. The method defined in claim 1 in which the waveguide is a single-mode or multi-mode optical fiber.

10. The method defined in claim 1 in which a multi-mode fiber is used as said waveguide, and comprising using modes sufficiently shallow, with regard to the fiber axis, to ensure total reflection and sufficiently steep to ensure a high linear density of light signal/coating interaction sites.

11. The method defined in claim 1 in which the waveguide is a multi-mode fiber and in which the modes are selected with an initial reflecting angle close to the critical angle, whereby in the course of the reaction a slight change in the refractive index n₂ of the rare medium that occurs due to the growing of the analyte-reactant product will result in at least partial refraction of the light outside the waveguide.

12. The method defined in claim 1 wherein the light signal modification in step (b) is monitored with time, and the rate data so obtained is correlated with corresponding standard reference rate data obtained in a similar manner from calibrating samples of said analyte.

13. The method defined in claim 11 wherein a reference quantity of the analyte is contacted with said film while adding beforehand or simultaneously therewith a reference amount of reactant for causing the latter to competitively react with the analyte in the solution and said reference quantity on the surface.

14. The method defined in claim 11 in which there is added in the analyte solution a tracer quantity of pure analyte in labelled form, the presence of a label in the reactant analyte product layer on the waveguide surface causing the said modification to the light signal travelling through said waveguide, the magnitude of said modification being in direct relation with the ratio of labelled analyte in the solution.

15. The method defined in claim 11 wherein said film of said reactant on said surface is in excess of that stoichiometrically needed for binding the analyte in the solution to be determined, contacting said coated surface with the analyte solution for totally binding said analyte to be determined, adding to the analyte solution a reference amount of analyte in pure labelled form to react with the still unused excess of reactant, the presence of said label in the reactant analyte product causing the said light signal modification occurring to the light signal, the magnitude of said modification being in direct proportion to the ratio of the labelled analyte to the analyte originally in the solution.

16. The method defined in claim 11 in which the analyte prossesses more than one binding site for specifically binding more than one kind of reactant, comprising contacting said surface coated with a first reactant with said analyte solution, adding a reference quantity of a second reactant for having said second reactant to bind to a second binding site of said analyte, the said light signal modification being the result of the binding of said second reactant on the said second binding site of the analyte bonded by a first binding site on said first reactant on the surface.

17. The method defined in claim 11 in which said rate data are interpreted in terms of the slope of the rate curves pertaining to the reaction under test and can be extrapolated to determine equilibrium conditions.

2. (c) contacting said film with a solution of an analyte in a liquid phase of refractive index n₂ less than n₁ whereby said analyte reacts with said reactant to form a layer of analyte-reactant product on said waveguide of a thickness less than λ

; and

(d) controlling the depth of penetration dp of said evanescent light component associated with said signal in said waveguide in accordance with the relation

space="preserve" listing-type="equation">dp=λ

/2π

(sin.sup.2 θ

-(n.sub.2 /n.sub.1).sup.2).sup.1/2

so that said depth of penetration dp substantially matches or exceeds the thickness of said analyte-reactant product layer and the measurement in step (b) takes place while the reaction occurs without interference from spurious signals from the liquid phase surrounding said layer.