Method of and apparatus for multiplexed automatic testing of electronic circuits and the like

  • US 4,620,304 A
  • Filed: 03/13/1985
  • Issued: 10/28/1986
  • Est. Priority Date: 09/13/1982
  • Status: Expired due to Term
First Claim
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1. A method of performing a test on electronic circuits and the like comprising a relatively large number of nodes, that comprises, assigning each node to a connection point in a group of connection points connectable at any given time with only a predetermined number of signal lines connectable with test equipment, the predetermined number of signal lines being less than the number of connection points in the group;

  • controlling said assigning of the nodes of specific connection points in a manner that insures that no more sets of nodes, used simultaneously in any test, are assigned to the same group of connection points than there are signal lines connectable to that group of connection points, wherein, at a given time, a set of nodes is defined as a set consisting of all the nodes in a group that are logically capable, according to the predetermined test, of being driven or sensed by a common instrument at that given time; and

    selectively connecting the connection points to the test equipment to connect the test equipment to the nodes for conducting desired testing.

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