Reflection density measuring system
First Claim
Patent Images
1. A reflection density measuring system comprising a means for projecting an irradiation light onto the surface-to-be-measured of a sample and at least first and second of photodetectors each of which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in thatwhen the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h1 and h2, the angles θ
- which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ
1 and θ
2, and the distances r between the center of the light inlet side element of the first photodetector and the optical axis of the irradiation light and between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r1 and r2,the first photodetector is disposed so that h1 is smaller than value h10 which is the value of h at which output I1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I1 with the distance h when the distance h is varied under the combination of r1 and θ
1, and the second photodetector is disposed so that h2 is larger than value h20 which is the value of h at which output I2 of the photosensor of the second photodetector takes a peak value on an output curve representing the change of the output I2 with the distance h when the distance h is varied under the combination of r2 and θ
2,the reflection density of the surface-to-be-measured being determined on the basis of the sum of the outputs of the photosensors.
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Abstract
A reflection density measuring system comprises a light source for projecting an irradiation light onto the surface-to-be-measured of a sample and a photodetector which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light receiving surface of the photodetector. The distance r between the center of the light receiving surface of the photodetector and the optical axis of the irradiation light is ro, the distance h between the center of the light receiving surface and the surface-to-be-measured as measured along the optical axis of the irradiation light is ho, and the angle θ which the light receiving surface forms with the surface-to-be-measured is θo, ho being the value of h at which output I of the photosensor takes a peak value on an output curve representing the change of the output I of the photosensor with the distance h when the distance h is varied under the combination of ro and θo.
106 Citations
9 Claims
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1. A reflection density measuring system comprising a means for projecting an irradiation light onto the surface-to-be-measured of a sample and at least first and second of photodetectors each of which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that
when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h1 and h2, the angles θ - which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ
1 and θ
2, and the distances r between the center of the light inlet side element of the first photodetector and the optical axis of the irradiation light and between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r1 and r2,the first photodetector is disposed so that h1 is smaller than value h10 which is the value of h at which output I1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I1 with the distance h when the distance h is varied under the combination of r1 and θ
1, and the second photodetector is disposed so that h2 is larger than value h20 which is the value of h at which output I2 of the photosensor of the second photodetector takes a peak value on an output curve representing the change of the output I2 with the distance h when the distance h is varied under the combination of r2 and θ
2,the reflection density of the surface-to-be-measured being determined on the basis of the sum of the outputs of the photosensors. - View Dependent Claims (2, 3, 4)
- which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ
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5. A reflection density measuring system comprising a means for projecting an irradiation light onto the surface-to-be-measured of a sample and at least first and second photodetectors each of which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that
when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h1 and h2, the angles θ - which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ
1 and θ
2, and the distances r between the center of the light inlet side element of the first photodetector and the optical axis of the irradiation light and between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r1 and r2,the first photodetector is disposed so that h1 is smaller than value h10 which is the value of h at which output I1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I1 with the distance h when the distance h is varied under the combination of r1 and θ
1, and the second photodetector is disposed so that h2 is larger than value h20 which is the value of h at which output I2 of the photosensor of the second photodetector takes a peak value on an output curve representing the change of the output I2 with the distance h when the distance h is varied under the combination of r2 and θ
2,the reflection density of the surface-to-be-measured being determined on the basis of the highest of the outputs of the photosensors. - View Dependent Claims (6, 7, 8)
- which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ
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9. A reflection density measuring system comprising means for projecting an irradiation light onto a surface-to-be-measured of a sample at at least first and second photodetectors each of which as a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light inlet side element of the photodetector, characterized in that
when the distances h between the center of the light inlet side element of the first photodetector and a regular position of the surface-to-be-measured of the sample and between the center of the light inlet side element of the second photodetector and the regular position as measured along the optical axis of the irradiation light are respectively represented by h1 and h2, the angles θ - which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ
1 and θ
2, and the distances r between the center of the light inlet side element of the second photodetector and the optical axis are respectively represented by r1 and r2,the first photodetector is disposed so that h1 is smaller than a value h10 which is the value of h at which output I1 of the photosensor of the first photodetector takes a peak value on an output curve representing the change of the output I1 with the distance h when the distance h is varied under the combination of r1 and θ
1, and the second photodetector is disposed so that h2 is larger than value h20 which is the value of h at which output h2 is larger than value h20 which is the value of h at which output I2 of the photosensor of the second photodector takes a peak value on an output curve representing the change of the output I2 with the distance h when the distance h is varied under the combination of r2 and θ
2,the reflection density of the surface-to-be-measured being determined on the basis of a combination of the outputs of the photosensors.
- which the light inlet side elements of the first and second photodetector respectively form with the surface-to-be-measured are respectively represented by θ
Specification
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Current AssigneeFuji Photo Film Co Limited (Fujifilm Holdings Corporation)
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Original AssigneeFuji Photo Film Co Limited (Fujifilm Holdings Corporation)
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InventorsOgura, Nobuhiko
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Primary Examiner(s)Rosenberger, Richard A.
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Application NumberUS07/019,402Time in Patent Office782 DaysField of Search356/445, 356/446, 356/447, 356/448, 356/430, 356/431US Class Current356/446CPC Class CodesG01N 2021/478 Application in testing anal...G01N 21/474 Details of optical heads th...
