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Temperature difference detecting element using semiconductive ceramic material

  • US 4,938,244 A
  • Filed: 10/05/1988
  • Issued: 07/03/1990
  • Est. Priority Date: 10/05/1987
  • Status: Expired due to Term
First Claim
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1. A temperature difference detecting element comprising:

  • a substrate having two opposite major surfaces, said substrate being an integral plate formed of semiconductive ceramic material and having first and second regions defined therein which are opposite to each other and extend along the longitudinal direction of said two major surfaces, said substrate being associated with a plurality of thermoelements arranged in the longitudinal direction of said major surfaces,each said thermoelement comprising a respective portion of the semiconductive ceramic material in said substrate, and a pair of hot-side and cold-side electrodes provided on said semiconductive ceramic material with a prescribed spacing therebetween, forming a hot junction and a cold junction respectively,a plurality of said hot-side electrodes and a plurality of said cold-side electrodes being provided independently of each other on said substrate,said plurality of hot-side electrodes being arranged on said first region of said substrate adjacent to each other,said plurality of cold-side electrodes being arranged on said second region of said substrate adjacent to each other; and

    conductive path means for electrically connecting a hot-side electrode of at least one of said plurality of thermoelements with the cold-side electrode of a thermoelement adjacent thereto, thereby to sequentially electrically connect said plurality of thermoelements in series with each other;

    wherein said hot-side electrodes, said cold-side electrodes and said conductive path means are formed on at least one of said two major surfaces of said substrate.

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