Test meters

• US 4,949,274 A
• Filed: 10/31/1988
• Issued: 08/14/1990
• Est. Priority Date: 05/22/1987
• Status: Expired due to Term

• Current Assignee: Omega Engineering Incorporated One Omega Drive Stamford CT 06907-0047
• Original Assignee: Omega Engineering Incorporated (Spectris PLC)
• Inventors: Storer, Ian K., Hollander, Milton B., McKinley, William E., Crimmins, James P.
• Primary Examiner(s): Lall, Parshotam S.
• Assistant Examiner(s): Ramirez, Ellis B.
• Application Number:
  US07/312,880
• Time in Patent Office: 652 Days
• Field of Search: 364/481, 364/483, 364/550, 364/551.01, 364/709, 364/710, 364/131, 364/132, 364/513.5, 324/99 D, 324/76 R, 324/73 R, 324/115, 307/152, 381/51, 328/132, 340/661, 340/662, 340/663
• US Class Current: 324/142
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736

Abstract

Test meters, particularly of the type employed for testing electrical circuits, e.g. multimeters, are improved in operational efficiency. In one aspect, remote selection of test and/or report format frees the operators hands for concentration on a test piece. In another test results or format information are conveyed as synthesized speech in any of a number of selectable formats. By combining both aspects in a hand-held multimeter, a high degree of interaction between the operator and the meter is achieved.

Claims

1. A test meter capable of testing and displaying a plurality of parameters and of reporting the results in a plurality of formats, comprising:

first selector switch means responsive to an electrical signal on an electrical conductor, for changing the report format of the test meter through a plurality of report formats in a predetermined sequence;

second selector switch means responsive to an electrical signal on an electrical conductor for changing the test parameter formats of the test meter through a plurality of parameter formats in a predetermined sequence;

an independently locatable and movable probe having an extended multi-conductor lead detachably connected to the test meter;

one of the conductors in the multi-conductor lead being coupled to said first selector switch means and another one of the conductors in said multi-conductor lead being coupled to the second selector switch means;

said probe having a first control switch coupled to send an electrical signal on said one conductor in said lead so as to operate said first selector switch means to change to the report format of said test meter;

and, said probe having a second control switch coupled to send an electrical signal on said other conductor in said lead so as to operate said second selector switch means to change the test parameter format of said test meter.

2. A test meter according to claim 1, wherein said probe further includes a thermocouple for sensing temperature, the thermocouple leads being coupled to the test meter through additional conductors in said multi-conductor lead.

3. A test meter in accordance with claim 1 capable of reporting test results as speech in any one of a plurality of selectable report formats, further comprising:

microprocessor means for controlling the reporting of test results as speech;

means for receiving a test signal, generating a meter output indicative of a measured value of a parameter, and directing said meter output to said microprocessor means;

means for storing a plurality of selectable report formats and directing a selected one to said microprocessor means; and

a speech synthesizer;

wherein said first selector means selectively causes a particular report format to be directed to said microprocessor; and

said microprocessor means is programmed to receive said meter output and cause the speech synthesizer to audibly report test results in a selected format.

4. A test meter according to claim 3 wherein the detachable connection of said probe to said test meter includes connection to said means for receiving test signals and said probe is configured for being held and positioned by hand and said first and second control switches are operable by hand while said probe is held in contact with a desired test point.

5. A test meter according to claim 4 wherein said probe further includes a means for sensing temperature coupled through said multiconductor lead to one half of a separable connector in common with conductors for other components of the probe, and said meter includes on a housing a mating half of a separable connector which is configured to receive said one half of said connector thereby detachably coupling said multi-conductor lead to said meter.

6. A test meter according to claim 1 which further includes means for audibly reporting test information.

7. A test meter according to claim 6 wherein said first selector means enables control of said means for audibly reporting.

8. A test meter according to claim 6 wherein said means for audibly reporting test information comprises:

speech synthesizer means, microprocessor means programmed to function with the speech synthesizer means, and an amplifier and speaker to report test information as speech.

9. A test meter according to claim 8 wherein said means for audibly reporting test information further comprises electronic means for storing a plurality of selectable report formats.

10. An electronic multimeter having a plurality of selectable test and report formats comprising:

selector means including first microprocessor means, operably responsive to a remote electronic stimulus as well as switching means on the meter, for causing the meter to operate in any one of a plurality of sequentially selectable desired test parameter formats and in any one of a plurality of separately sequentially selectable report formats;

an independently locatable and moveable probe means for receiving a test signal, said probe means being detachably coupled to said test meter by an extended multi-conductor lead for transmitting a test signal to said test meter through at least one of said conductors;

said probe further having control switch means thereon for sending an electronic stimulus over a predetermined conductor of said multi-conductor lead to operate said selector means;

an autoranging multimeter circuit capable of generating a meter output responsive to said test signal and indicative of a measured value of a parameter, and directing said meter output to a second microprocessor means;

third microprocessor means for storing a plurality of selectable report formats and directing a selected one to a second microprocessor under direction of said selector means;

a speech synthesizer means; and

a second microprocessor means programmed to receive said meter output and a selected report format to cause the speech synthesizer means to audibly report test results in a selected format.

11. A multimeter according to claim 10 wherein said probe comprises a contact probe configured for being held and positioned in the locale of a desired test point by hand and said control switch means is operable by hand while said probe is held in contact with a desired test point.

12. A multimeter according to claim 11 wherein said control switch means located on said probe and operable by hand, includes two independently operable switches, one switch being coupled to said selector means to control test format and the other being coupled to said selector means to control report format.

13. A test meter according to claim 12 wherein electronic means are further provided for storing a plurality of test format messages and for directing a selected of said messages to said second microprocessor;

and

said second microprocessor is programmed to cause the speech synthesizer to audibly report a test format message in response to selection of a given test format.

14. A test meter for measuring and displaying a selected one of a plurality of different parameters and having speech generating means to produce audible speech of the selected parameter, comprising:

first microprocessor means for generating a plurality of meter data signals related to the current operation of the meter and the measured value of the selected parameter;

second microprocessor means operatively connected to the first microprocessor means, for storing words to be audibly reproduced in a desired language and representative of various measurements, functions and modes related to parameters that can be measured and displayed by the meter; and

third microprocessor means effectively coupled between the first microprocessor means and the second microprocessor means for delivering, as determined by said plurality of meter data signals from the first microprocessor means, a plurality of command signals to the second means to cause the latter to generate audible reproductions of selected ones of said plurality of signals in conformance with rules applicable to the desired language.

15. A test meter according to claim 14 wherein the second and third microprocessors together define a speech module which is detachable and replaceable independently of said first microprocessor means.

16. A test meter according to claim 14 and further including:

means for generating a first temperature signal representative of a measurement with a first temperature probe;

means for generating a second temperature signal representative of a measurement with a second temperature probe; and

means for generating a signal representative of the difference between the first and second temperature signals.

17. A test meter according to claim 14 wherein said first, second and third microprocessor means together form an integral microprocessor unit.

18. A test meter according to claim 14 wherein said first microprocessor means is further capable of generating speech request signals on demand;

and said third microprocessor means includes;

means responsive to a speech request signal from the first microprocessor for initiating the delivery of said plurality of command signals to the second microprocessor means.

19. A test meter according to claim 18 and further including:

directing means in said first microprocessor means for delivering, effectively in response to a speech request signal, said plurality of meter data signals to the third microprocessor means.

20. A meter according to claim 19 and further including:

means in said third microprocessor means for storing speech rule signals for determining a sequence of command signals needed to produce said audible reproductions compatible with the desired language.

21. A test meter according to claim 20 and further including:

an independently locatable and moveable contact probe coupled to said test meter by an extending multiconductor lead configured for being held and positioned at a desired test point by hand, and switch means on said probe for sending a signal through a conductor of said lead to initiate said speech request signal from said first microprocessor means.

22. A test meter according to claim 19 and further including:

electronic means for selecting a desired display resolution of parameter measurement and producing a round-off signal indicative thereof; and

electronic means responsive to the round-off signal for controlling the selection of the command signals to establish an audible pronunciation of the displayed parameter measurement.

23. A test meter according to claim 22 and further including:

means for rounding-off displayed parameter measurements to a desired place on the right side of the decimal point and generating said round-off signal indicative thereof.

24. A test meter according to claim 23 wherein said plurality of meter data signals that are delivered to the third microprocessor includes said round-off signal.