Manufacturing process for an electronic device

• US 4,953,277 A
• Filed: 08/07/1989
• Issued: 09/04/1990
• Est. Priority Date: 08/26/1988
• Status: Expired due to Term

• Current Assignee: Robert Bosch GmbH
• Original Assignee: Robert Bosch GmbH
• Inventors: Vogt, Harald, Eisenbarth, Rudolf, Schumacher, Hartmut, Crispin, Norbert
• Primary Examiner(s): Eley, Timothy V.
• Application Number:
  US07/390,644
• Time in Patent Office: 393 Days
• Field of Search: 29/407, 29/593, 29/402.01
• US Class Current: 29/407.05
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: H05K 13/083 Quality monitoring using results from monitoring devices, e.g. feedback loops H05K13/084 takes precedence
• CPC Class Codes: Y10T 29/49004 including measuring or testing of device or component part
• CPC Class Codes: Y10T 29/49718 Repairing
• CPC Class Codes: Y10T 29/49771 Quantitative measuring or gauging

Abstract

A manufacturing process for an electronic device having a storage element, whereby, in various manufacturing stages, the device runs through testing stations. After passing through a testing station, information documenting the respective inspection step is stored in the storage element of the electronic device.

Claims

1. A manufacturing process for an electronic device having a storage element, comprising testing the device during a plurality of manufacturing stages at respective testing stations, and after being tested at a respective testing station, storing information relating to an inspection step performed at the respective inspection station in the storage element of the electronic device.

2. The process recited in claim 1, wherein the step of storing comprises storing information in the storage element of the electronic device comprising specific characteristic values for the respective testing station.

3. The manufacturing process recited in claim 1, wherein the step of storing comprises storing information in the storage element of the electronic device comprising specific characteristic values for the control device.

4. The manufacturing process recited in claim 3, wherein the specific characteristic values comprise characteristic values detected in the testing stations.

5. The process recited in claim 1, further comprising the step of detecting an error if an error occurs, and conveying the test piece, in accordance with the detected error, to a testing or repair station.

6. The process recited in claim 1, further comprising applying a marking to the device in addition to storing the information in the storage element.

7. The process recited in claim 6, wherein the marking is visible.

8. The process recited in claim 6, wherein the marking is legible.

9. The process recited in claim 1, wherein tolerance ranges are provided for the characteristic values specific to the device, and further comprising that when a tolerance range is not observed, removing the tested device at least temporarily from the process and conveying the device to a repair loop to be repaired.

10. The process recited in claim 1, wherein the device is equipped with a warning device, and further comprising detecting the information specific to the testing station and controlling the warning device when the information specific to the testing station is not recognized.