Method of electroplating a precious metal on a semiconductor device, integrated circuit or the like

• US 5,039,381 A
• Filed: 05/25/1989
• Issued: 08/13/1991
• Est. Priority Date: 05/25/1989
• Status: Expired due to Fees

• Current Assignee: Edward J. Mullarkey
• Original Assignee: Edward J. Mullarkey
• Inventors: Mullarkey, Edward J.
• Primary Examiner(s): Niebling, John F.
• Assistant Examiner(s): Leader, William T.
• Application Number:
  US07/356,955
• Time in Patent Office: 810 Days
• Field of Search: 204/34.5, 204/15, 204/47.5, 204/47, 204/46.1, 204/52.1, 204/58.5, 204/DIG. 9
• US Class Current: 205/103
• CPC Class Codes: C25D 5/007 Electroplating using magnetic fields, e.g. magnets
• CPC Class Codes: C25D 5/611 Smooth layers
• CPC Class Codes: C25D 5/617 Crystalline layers
• CPC Class Codes: C25D 5/627 Electroplating characterised by the visual appearance of the layers, e.g. colour, brightness or mat appearance
• CPC Class Codes: C25D 7/12 Semiconductors
• CPC Class Codes: H01L 21/2885 using an external electrical current, i.e. electro-deposition
• CPC Class Codes: Y10S 204/09 Wave forms

Abstract

A method for electroplating a layer of a precious metal, copper or aluminum on a surface of a semiconductor device, an integrated circuit, or the like employs an electrolytic cell in which the cathode comprises a semiconductor device, an integrated circuit device, or the like, having a surface for receiving the precious metal layer. The surface is oriented in a position normal to a vector representing the acceleration of gravity and facing the anode of the cell. An electroplating direct current on the order of about 0.1 milliamp/cm² is employed while superimposing a time varying electromagnetic field in the range of about 1 to about 100 megahertz on the direct current. The electroplating current and the electromagnetic field are employed in the absence of convection, i.e. stirring, in the electrolyte. The product produced by the described method comprises a smooth, evenly distributed layer of the precious metal having a microstructure that is characteristic of single crystals.

Claims

1. A method for electroplating a layer of a precious metal or copper on a surface of a semiconductor device, which method comprises:

(a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising a semiconductor device having a surface for receiving a layer of precious metal or copper;

(b) orienting the semiconductor device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and

(c) employing an electroplating direct current on the order of about 0.1 milliamp/cm² in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of about 1 to about 100 megahertz on the electroplating current, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the semiconductor device surface.

2. A method as defined by claim 1, wherein the electroplating direct current and the electromagnetic field are employed for a time sufficient to produce a smooth, evenly distributed layer of the precious metal or copper having a thickness in the range of about 1 to 10 microns.

3. A method as defined by claim 1, wherein the precious metal is selected from the group consisting of gold, silver and palladium.

4. A method as defined by claim 1, wherein the precious metal comprises gold.

5. A method as defined by claim 1, wherein steps (a)-(c) are conducted at ambient temperature.

6. A method as defined by claim 1, wherein the electromagnetic field is about 10 megahertz.

7. A method as defined by claim 1 wherein the aqueous electrolyte contains a copper compound dissolved therein and a layer of copper is formed on the surface of the semiconductor device.

8. A method as defined by claim 1 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.

9. A method for electroplating a layer of precious metal or copper on a surface of a semiconductor device, which method comprises

(a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising a semiconductor device having a surface for receiving a layer of precious metal or copper;

(b) orienting the semiconductor device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and

(c) employing an electroplating direct current on the order of about 0.1 milliamp/cm² in the electrolytic cell while superimposing an alternating current electromagnetic field on the electroplating current, said direct current being at or below a value at which the current yield for the deposition is 100 percent, and said electromagnetic field being in the range from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the semiconductor device surface.

10. A method as defined by claim 9, wherein the electromagnetic field is from about 10 to about 15 megahertz.

11. A method as defined by claim 9, wherein the electromagnetic field is about 12 megahertz.

12. A method as defined by claim 9 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.

13. A method for electroplating a layer of precious metal or copper on a surface of an integrated circuit device, which method comprises:

(a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising an integrated circuit device having a surface for receiving a layer of precious metal or copper;

(b) orienting the integrated circuit device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and

(c) employing an electroplating direct current not greater than about 0.1 milliamp/cm² in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of about 10 to about 15 megahertz on the electroplating current, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the integrated circuit device surface.

15. A method as defined by claim 13, wherein the precious metal is selected from the group consisting of gold, silver and palladium.

16. A method as defined by claim 13, wherein the precious metal comprises gold.

17. A method as defined by claim 13, wherein steps (a)-(c) are conducted at ambient temperature.

18. A method as defined by claim 13, wherein the electromagnetic field is about 12 megahertz.

19. A method as defined by claim 13 wherein the aqueous electrolyte contains a copper compound dissolved therein and a layer of copper is formed on the surface of the semiconductor device.

20. A method as defined by claim 13 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.

21. A method for electroplating a layer of precious metal or copper on a surface of an integrated circuit device, which method comprises

(a) providing an electrolytic cell comprising a cathode, an anode, a direct current source and an aqueous electrolyte containing a precious metal compound or a copper compound dissolved therein, said cathode comprising an integrated circuit device having a surface for receiving a layer of precious metal or copper;

(b) orienting the integrated circuit device surface for receiving a layer of the precious metal or copper in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and

(c) employing an electroplating direct current on the order of about 0.1 milliamp/cm² in the electrolytic cell while superimposing an alternating current electromagnetic field on the electroplating current, said direct current being at a value at which the current yield for the deposition is 100%, and said electromagnetic field being in the range from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed int he absence of convection in the electrolyte whereby a smooth, evenly distributed layer of the precious metal or copper is formed on the integrated circuit device surface.

14. A method as defined by claim 23, wherein the electroplating direct current and the electromagnetic field are employed for a time sufficient to produce a smooth layer of the precious metal or copper having a thickness in the range of about 1 to 10 microns.

22. A method as defined by claim 21, wherein the electromagnetic field is from about 10 to about 15 megahertz.

23. A method as defined by claim 21, wherein the electromagnetic field is about 12 megahertz.

24. A method as defined by claim 21 wherein the evenly distributed layer of the precious metal or copper formed on the semiconductor device surface has a microstructure that is characteristic of single crystals.

25. A method for electroplating a layer of aluminum on a surface of a workpiece, which method comprises:

(a) providing an electrolytic cell comprising a cathode, anode, a direct current source and a liquid electrolyte containing an aluminum compound dissolved therein, said cathode comprising a workpiece having a surface for receiving a layer of aluminum;

(b) orienting the workpiece surface for receiving a layer of the aluminum in a position normal to a vector representing the acceleration of gravity and facing the anode of the electrolytic cell, the anode being positioned in the direction of the acceleration of gravity with respect to said surface; and

(c) employing an electroplating direct current not greater than about 0.1 milliamp/cm² in the electrolytic cell while superimposing an alternating current electromagnetic field in the range of from about 1 to about 100 megahertz, the strength of said electromagnetic field being sufficiently large to enhance the diffusion, mobility or mass transport of electrolyte ions in solution, said electroplating current and said electromagnetic field being employed in the absence of convection in the electrolyte, whereby a smooth, evenly distributed layer of the aluminum is formed on the workpiece surface.

26. A method as defined by claim 25 wherein the evenly distributed layer of aluminum formed on the workpiece surface has a microstructure that is characteristic of single crystals.