Reduced-mask, split-polysilicon CMOS process, incorporating stacked-capacitor cells, for fabricating multi-megabit dynamic random access memories

• US 5,134,085 A
• Filed: 11/21/1991
• Issued: 07/28/1992
• Est. Priority Date: 11/21/1991
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: McQueen, Anthony M., Lowrey, Tyler A., Gilgen, Brent D., Karniewicz, Joseph J.
• Primary Examiner(s): Thomas, Tom
• Application Number:
  US07/796,099
• Time in Patent Office: 250 Days
• Field of Search: 437/47, 437/48, 437/52, 437/60, 437/228, 437/233, 437/235, 437/919, 437/56, 437/57, 437/59, 437/34, 357/23.6, 357/51
• US Class Current: 438/210
• CPC Class Codes: H10B 12/033 the capacitor extending over the transistor

Abstract

This invention constitutes a 10-12 mask, split-polysilicon process for fabricating dynamic random access memories of the stacked capacitor type for the one-megabit generation and beyond. The process flow is characterized: reduced mask count due to the elimination of the N+ and p+ source-drain masking layers via the split polysilicon technique; an option to further reduce wafer processing by allowing the LOCOS stress relief (pad) oxide layer to later function as the transistor gate dielectric layer; N-channel device optimization via self-aligned punch-through and lightly-doped-drain (LDD) implants, without the addition of extra P-channel masking steps via the split poly approach; use of semi, self-aligned contact of bottom cell plate to access gate diffusion allowing tight spacing between bottom cell plate buried contact and access gate polysilicon; improved refresh characteristics achieved by avoiding reduction of isolation thickness due to the spacer oxide etch; improved refresh characteristics achieved by protecting the sensitive areas of the storage node from damage typically caused by a spacer oxide etch; improved refresh characteristics achieved by eliminating the high-dose N-channel source/drain implantation from the storage node side of the access transistor gate; and improved immunity to soft error upset achieved through the use of an optional self-aligned "Hi-C" implant that is performed without the addition of an extra masking step.

Claims

1. A split-polysilicon CMOS DRAM process incorporating stacked-capacitor cells, said process commencing with a lightly-doped P-type wafer, and comprising the following sequence of steps:

(a) creating N-well regions within certain portions of the wafer;

(b) creating P-well regions within other portions of the wafer;

(c) creating channel-stop regions within portions of the wafer above which field oxide regions will be created;

(d) creating said field oxide regions;

(e) depositing a first polysilicon layer on the surface of the wafer;

(f) doping said first polysilicon layer in order to render it conductive;

(g) patterning N-channel FET gates and N-channel interconnects from said first polysilicon layer and creating an unetched expanse of a portion of said first polysilicon layer in P-channel regions;

(h) depositing a first silicon dioxide spacer layer over the surface of the wafer;

(i) performing an unmasked lightly-doped source/drain implant with phosphorus;

(j) depositing a second silicon dioxide spacer layer;

(k) performing a masking step which exposes said second spacer layer superjacent storage-node contact regions;

(l) performing an anisotropic etch which exposes the storage-node contact regions;

(m) deposition of a second polysilicon layer over the surface of the wafer;

(n) doping said second polysilicon layer in order to render it conductive;

(o) patterning of individual storage-node plates from said second polysilicon layer;

(p) depositing a capacitor dielectric layer over the surface of the wafer;

(q) depositing a third polysilicon layer over the surface of the wafer;

(r) doping said third polysilicon layer in order to render it conductive;

(s) patterning said third polysilicon layer to create a cell plate;

(t) performing an anisotropic oxide spacer etch, which creates spacers from said first and second spacer layers on the edges of the N-channel FET gates on either side of the bitline contact regions, and also exposes the bitline contact regions;

(u) performing an unmasked N+ source/drain implant;

(v) patterning P-channel transistors and P-channel interconnects from the unetched expanse of said first polysilicon layer using a mask which defines P-channel gates and interconnects and blankets the N-channel regions;

(w) performing a P-channel source/drain implant prior to the removal of the mask used to pattern P-channel gates and interconnects;

(x) depositing an interlayer dielectric layer;

(y) performing a masking step which exposes portions of the interlayer dielectric layer superjacent bitline contact regions;

(z) opening bitline contact with an anisotropic etch;

(aa) creation of bitlines; and

(bb) depositing at least one passivation layer.

2. The split-polysilicon CMOS DRAM process of claim 1, wherein an optional unmasked halo implant is performed between steps (g) and (h).

3. The split-polysilicon CMOS DRAM process of claim 1, wherein an optional silicon dioxide densification step is performed between steps (j) and (k).

4. The split-polysilicon CMOS DRAM process of claim 1, wherein an optional "high-C" implant is performed between steps (l) and (m).

5. The split-polysilicon CMOS DRAM process of claim 1, wherein the N-channel N+ source/drain implant is performed using arsenic.

6. The split-polysilicon CMOS DRAM process of claim 1, wherein an optional anneal step is performed at approximately 600°

C. between steps u and v.

7. The split-polysilicon CMOS DRAM process of claim 1, wherein an optional threshold voltage enhancement implant is performed between steps (d) and (e).

8. The split-polysilicon CMOS DRAM process of claim 1, wherein the patterning of said third polysilicon layer in step (s) is performed with a photoresist masking step, followed by an etch step.

9. The split-polysilicon CMOS DRAM process of claim 8, wherein the anisotropic oxide spacer etch of step (t) is performed with the mask utilized for step (s) in place.

10. A split-polysilicon CMOS DRAM process incorporating stacked-capacitor cells, said process commencing with a lightly-doped P-type wafer, and comprising the following sequence of steps:

(a) creating N-well regions within certain portions of the wafer;

(b) creating P-well regions within outer portions of the wafer;

(c) creating channel-stop regions within portions of the wafer above which device isolation regions will be created;

(d) creating said device isolation regions;

(e) creating a first conductive layer, which blankets the wafer'"'"'s surface;

(f) patterning N-channel FET gates and N-channel interconnects from said first conductive layer and creating an expanse of unetched first conductive layer material in P-channel regions;

(g) depositing at least one dielectric spacer layer, which blankets the wafer'"'"'s surface;

(h) performing a masking step which exposes portions of the spacer layer superjacent storage-node contact regions;

(i) performing an anisotropic etch which exposes the storage-node contact regions;

(j) creating a second conductive layer, which blankets the wafer'"'"'s surface;

(k) patterning individual storage-node plates from said second polysilicon layer;

(l) creating a capacitor dielectric layer;

(m) creating a third conductive layer;

(n) patterning the third conductive layer to create a cell plate;

(o) performing an anisotropic oxide spacer etch, which creates spacers from said first and second dielectric spacer layers on the edges of the N-channel FET gates on either side of the bitline contact regions, and also exposes the bitline contact regions;

(p) performing an unmasked N+ source/drain implant;

(g) patterning P-channel FET gates and P-channel interconnects from the unetched expanse of said first conductive layer using a mask which defines P-channel gates and interconnects and blankets the N-channel regions;

(r) performing a P-channel source/drain implant prior to the removal of the photoresist mask used to pattern P-channel gates and interconnects;

(s) depositing an interlayer dielectric layer;

(t) performing a masking step which exposes portions of the interlayer dielectric lay superjacent bitline contact regions;

(u) creating bitline contact openings with an anisotropic etch;

(v) creation of bitlines; and

(w) deposition of at least one passivation layer.

11. The split-polysilicon CMOS DRAM process of claim 10, wherein an optional threshold voltage enhancement implant is performed between steps (d) and (e).

12. The split-polysilicon CMOS DRAM process of claim 10, wherein said first conductive layer is comprised of a lower layer of doped polysilicon and an upper layer of refractory metal silicide.

13. The split-polysilicon CMOS DRAM process of claim 12, which further comprises the steps of depositing a silicon dioxide capping layer on top of said refractory metal silicide layer, and depositing a silicon nitride capping layer on top of said silicon dioxide capping layer, then patterning said first conductive layer, said refractory metal silicide layer, and both capping layers in one step during N-channel FET gates and interconnect patterning.

14. The split-polysilicon CMOS DRAM process of claim 10, wherein an optional unmasked halo implant is performed between steps (g) and (h).

15. The split-polysilicon CMOS DRAM process of claim 10, wherein an optional unmasked phosphorus lightly-doped source/drain implant is performed between steps (h) and (i).

16. The split-polysilicon CMOS DRAM process of claim 15, wherein a second dielectric spacer layer is deposited immediately following the lightly-doped source/drain implant.

17. The split-polysilicon CMOS DRAM process of claim 16, wherein an optional oxide densification step is performed immediately following the deposition of said second dielectric spacer layer.

18. The split-polysilicon CMOS DRAM process of claim 10, wherein an optional "high-C" implant is performed between steps (i) and (j).

19. The split-polysilicon CMOS DRAM process of claim 10, wherein an optional anneal step is performed at approximately 600°

C. between steps (p) and (q).

20. The split-polysilicon CMOS DRAM process of claim 10, wherein said bitlines are created by the following sequence of steps:

(a) conformally depositing a refractory metal layer on the surface of the wafer, to the extent that it fills said bitline contact openings;

(b) planarizing the wafer so as to leave refractory metal plugs within the bitline contact openings;

(c) depositing a metal layer, which blankets the wafer'"'"'s surface; and

(d) patterning said metal layer to create bitlines.

21. The split-polysilicon CMOS DRAM process of claim 10, wherein said second and third conductive layers are doped polysilicon.

22. The split-polysilicon CMOS DRAM process of claim 10, wherein step (w) comprises the steps of depositing a silicon dioxide passivation layer, following by the subsequent depositing of a silicon nitride passivation layer.

23. The split-polysilicon CMOS DRAM process of claim 10, wherein P-channel transistor gates and interconnects are undercut beneath the mask used to pattern them with an anisotropic etch having an isotropic component.