Multiply-tuned probe for magnetic resonance imaging or spectroscopy

• US 5,243,289 A
• Filed: 08/09/1991
• Issued: 09/07/1993
• Est. Priority Date: 08/09/1991
• Status: Expired due to Fees

• Current Assignee: Trustees Of The University Of Pennsylvania (University of Pennsylvania)
• Original Assignee: Trustees Of The University Of Pennsylvania (University of Pennsylvania)
• Inventors: Blum, Haywood, Mitchell, Matthew D.
• Primary Examiner(s): Tokar, Michael J.
• Application Number:
  US07/743,785
• Time in Patent Office: 760 Days
• Field of Search: 324/300, 324/307, 324/309, 324/310, 324/311, 324/312, 324/313, 324/314, 324/318, 324/322, 335/219, 128/653.5
• US Class Current: 324/322
• CPC Class Codes: G01R 33/3635 Multi-frequency operation

Abstract

A multiply-tuned probe for magnetic resonance imaging or spectroscopy in which a driving inductor is separately coupled to two or more trap inductors. The impedance match at each frequency is adjusted independently of the impedance match at the other frequencies and independent of the tuning by using a novel coil geometry with no overcoupling. In a preferred embodiment, a triple-tuned probe has a first inductor L₁ disposed in a first plane and tuned to a first resonant frequency and a second inductor L₂ disposed in a second plane parallel to the first plane and tuned to a second resonant frequency. A driving and receiving primary inductor L_p is disposed in a third plane parallel to the first and second planes and placed with respect to the first and second inductors L₁ and L₂ such that mutual inductance between L₁ and L_p in between L₂ and L_p is adjustable in accordance with the positions of the inductors L₁, L₂ and L_p. A sample surface inductor L_s tuned to a third resonant frequency provides the third frequency. Mutual inductance between L₁ and L_p in between L₂ and L_p is changed by repositioning the inductors L₁, L₂ and L_p to vary the amount of overlap between the cross-sections of the primary inductor L_p and the circular coils L₁, L₂ and the distances between inductors L₁ and L_p and between inductors L₂ and L_p. Since each inductive coupling adds another variable to the probe circuit, more and easier ways are provided for adjusting the tuning and impedance matching.

Claims

1. A multi-frequency tuned probe, comprising:

a first substantially planar inductor L1 disposed in a first plane;

first means for tuning said first planar inductor L1 to a first resonant frequency;

a second substantially planar inductor L2 disposed in a second plane, parallel to said first plane;

second means for tuning said second planar inductor L2 to a second resonant frequency; and

a substantially planar driving and receiving primary inductor Lp disposed in a third plane which is parallel to said first and second planes, said primary inductor Lp being adapted to transmit and receive RF pulses and signals and being disposed with respect to said first and second inductors L1 and L2 such that mutual inductance between L1 and Lp and between L2 and Lp occurs when a current is applied to L1, L2 and Lp, said mutual inductance being adjustable in accordance with the respective distances between each of said inductors L1, L2 and Lp in a direction perpendicular to said first, second and third planes and in accordance with the amount of overlap among said inductors L1, L2 and Lp in coordinate directions parallel to said first, second and third planes.

2. A multi-frequency tuned probe as in claim 1, further comprising a sample surface inductor Ls for transmitting and receiving RF pulses and signals and third means for tuning said sample surface inductor Ls to a third resonant frequency.

3. A multi-frequency tuned probe as in claim 2, wherein said first inductor L1 and second inductor L2 comprise coaxially disposed circular coils.

4. A multi-frequency tuned probe as in claim 3, wherein said primary inductor Lp comprises a primary circular coil disposed between said first inductor L1 and second inductor L2 such that at least a portion of a cross-section of said primary circular coil overlaps a cross-section of said coaxially disposed circular coils in said coordinate directions parallel to said first, second and third planes.

5. A multi-frequency tuned probe as in claim 4, wherein said mutual inductance between L1 and Lp and between L2 and Lp is changed in accordance with the amount of overlap between the cross-sections of said primary circular coil and said coaxially disposed circular coils and the distances between inductors L1 and Lp and between inductors L2 and Lp.

6. A multi-frequency tuned probe as in claim 4, wherein said primary circular coil is coaxial with said coaxially disposed circular coils.

7. A multi-frequency tuned probe as in claim 2, wherein said first tuning means comprises a first variable capacitance C1 electrically connected in parallel with said first inductor L1 so as to form a first tank circuit which is tuned to said first resonant frequency by adjusting a capacitance of said first variable capacitance C1 and said second tuning mean comprises a second variable capacitance C2 electrically connected in parallel with said second inductor L2 so as to form a second tank circuit which is tuned to said second resonant frequency by adjusting a capacitance of said second variable capacitance C2.

8. A multi-frequency tuned probe as in claim 7, further comprising a sample variable capacitance Cs electrically connected in series with said sample surface inductor Ls and said first and second tank circuits, said sample surface inductor Ls being tuned to said third resonant frequency by adjusting a capacitance of said sample variable capacitance Cs.

9. A multi-frequency tuned probe as in claim 8, further comprising a transmission line connected to said primary inductor Lp, wherein said first inductor L1, said second inductor L2 and said sample surface inductor Ls are respectively impedance matched to said transmission line at said first, second and third resonant frequencies simultaneously by adjusting capacitances of said first variable capacitance C1, said second variable capacitance C2, and said sample variable capacitance Cs.

10. A multi-frequency tuned probe, comprising:

at least two trap circuits disposed concentrically about a common axis;

means for tuning each trap circuit to a desired resonant frequency; and

a driving and receiving primary inductor Lp substantially concentrically disposed with respect to said at least two trap circuits about said common axis such that mutual inductance between Lp and each of said trap circuits occurs when a current is applied to said trap circuits and Lp, said mutual inductance being adjustable in accordance with the respective distances between Lp and each of said trip circuits along said common axis.