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Method for measuring contact resistance

  • US 5,365,180 A
  • Filed: 04/16/1993
  • Issued: 11/15/1994
  • Est. Priority Date: 04/16/1993
  • Status: Expired due to Term
First Claim
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1. A method for measuring contact resistance between a test fixture and a device under test during device testing, the method comprising the steps of:

  • positioning one of a device under test and a test fixture relative to the other to establish an electrical contact;

    forcing a first test current between two pins of the device under test through an isolating diode and measuring a first voltage drop associated therewith;

    forcing a second test current between said two pins of the device under test through said isolating diode and measuring a second voltage drop associated therewith, said second test current having a different amperage than said first test current; and

    determining the dynamic resistance of the test path using the values of the forced currents and the measured voltage drops and using the determined dynamic resistance in the determination of the contact resistances between the test fixture and the device under test.

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