Method for discrimination and simultaneous or separate measurement of single or multiple electronic events in an opto-electronic detector
First Claim
1. A method for discrimination and measurement of single electron and multiple electron events in an opto-electronic detector having an output providing a signal representing each event, each signal being associated with a center of gravity which has a time coordinate, comprising:
- creating a time window having a selected duration commencing with the beginning of each signal at said output;
determining a parameter value of each signal dependent on the time coordinate of the center of gravity of the signal within the time window; and
comparing the parameter value with a reference value corresponding to the parameter value for a single electron event.
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Abstract
A method for discrimination and simultaneous or separate measurement of single or multiple electronic events in an opto-electronic detector, such as a photo-multiplier, wherein information for the discrimination of these events is obtained from the signal progression occurring at the detector output within a predeterminable time window. According to this method, a characteristic parameter (TM ; tb -ta) is obtained for the temporal "center of gravity" of the progression of the signal itself or its integral over the time window (TF), the value of which is compared with a reference value (TS ; C1) which this parameter assumes during a single photo-electron event.
15 Citations
11 Claims
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1. A method for discrimination and measurement of single electron and multiple electron events in an opto-electronic detector having an output providing a signal representing each event, each signal being associated with a center of gravity which has a time coordinate, comprising:
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creating a time window having a selected duration commencing with the beginning of each signal at said output; determining a parameter value of each signal dependent on the time coordinate of the center of gravity of the signal within the time window; and comparing the parameter value with a reference value corresponding to the parameter value for a single electron event. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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Specification