System and method for measuring the operation of a device
First Claim
1. A measurement system for measuring the operation of a device, the measurement system comprising:
- a plurality of virtual sensors wherein ranges of output from said plurality of virtual sensors define a multi-dimensional virtual sensor space;
a normal operation determiner, coupled to said plurality of virtual sensors at least during installation, for defining at least one multi-dimensional normal operation region from at least one datapoint within said multi-dimensional virtual sensor space, said at least one datapoint being defined from output of said plurality of virtual sensors received at least during said installation; and
an abnormal condition determiner, coupled to said plurality of virtual sensors during a period of regular operation, for providing an abnormality indication when output of said plurality of virtual sensors during said period of regular operation does not fall within said at least one multi-dimensional normal operation region.
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Abstract
A system and method for measuring the operation of a device is disclosed. A plurality of virtual sensors which define a multi-dimensional virtual sensor space sense the operation of the device. A normal operation determiner determines at least one region of normal operation for the device. An abnormal condition determiner provides a warning when the operation does not fall within the normal operation region which is defined within the multi-dimensional virtual sensor space. A maintenance method and system are also disclosed for maintaining at least one device. The maintenance system includes a measurement system and an abnormality processor. The measurement system measures the operation of the device and provides an indication of when the device is not operating normally. The abnormality processor predicts, based on the output of the measurement system, when the device is likely to fail.
207 Citations
24 Claims
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1. A measurement system for measuring the operation of a device, the measurement system comprising:
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a plurality of virtual sensors wherein ranges of output from said plurality of virtual sensors define a multi-dimensional virtual sensor space; a normal operation determiner, coupled to said plurality of virtual sensors at least during installation, for defining at least one multi-dimensional normal operation region from at least one datapoint within said multi-dimensional virtual sensor space, said at least one datapoint being defined from output of said plurality of virtual sensors received at least during said installation; and an abnormal condition determiner, coupled to said plurality of virtual sensors during a period of regular operation, for providing an abnormality indication when output of said plurality of virtual sensors during said period of regular operation does not fall within said at least one multi-dimensional normal operation region. - View Dependent Claims (2, 3, 4, 5)
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6. A maintenance system for maintaining at least one device, the system comprising:
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a region and path storage unit for storing;
(i) at least one multi-dimensional normal operation region defined by at least one multi-dimensional state previously defined by an operator as indicating normal operation of said at least one device; and
(ii) a list of failure paths, each failure path ending in at least one different failure and each failure path having a multiplicity of multi-dimensional nodes, wherein each multi-dimensional node is defined by a multi-dimensional abnormal operation region defined by at least one multi-dimensional state previously defined by said operator as indicating abnormal operation of said at least one device;a measurement system comprising; measurement means for measuring the operation of said at least one device; comparison means for comparing output of said measurement means with said at least one multi-dimensional normal operation region and for providing an abnormality indication when said output of said measurement means does not fall within at least one of said at least one multi-dimensional normal operation region; and an abnormality processor for determining when said abnormality indication falls within at least one of said multi-dimensional nodes of said failure paths and for predicting therefrom when said at least one device is likely to fail. - View Dependent Claims (7, 8, 9, 10, 11, 12)
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13. A method of measuring the operation of a device, the method comprising the steps of:
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defining a multi-dimensional virtual sensor space from ranges of output data of a plurality of virtual sensors; determining at least one multi-dimensional normal operation region from at least one datapoint within said multi-dimensional virtual sensor space, said at least one datapoint being defined from output data of said plurality of virtual sensors received at least during an installation period; and providing an abnormality indication when output data of said plurality of virtual sensors during a period of regular operation does not fall within said at least one multi-dimensional normal operation region. - View Dependent Claims (14, 15, 16, 17)
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18. A method for maintaining at least one device comprising the steps of:
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storing;
(i) at least one multi-dimensional normal operation region defined by at least one multi-dimensional state previously defined by an operator as indicating normal operation of said at least one device; and
(ii) a list of failure paths, each failure path ending in at least one different failure and each failure path having a multiplicity of multi-dimensional nodes, wherein each multi-dimensional node is defined by a multi-dimensional abnormal operation region defined by at least one multi-dimensional state previously defined by said operator as indicating abnormal operation of said at least one device;measuring the operation of said at least one device; comparing output of said step of measuring with said at least one multi-dimensional normal operation region; providing an abnormality indication when said output of said step of measuring does not fall within at least one of said at least one multi-dimensional normal operation region; and verifying when said abnormality indication falls within at least one of said multi-dimensional nodes of said failure paths and predicting therefrom when said at least one device is likely to fail. - View Dependent Claims (19, 20, 21, 22, 23, 24)
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Specification