Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons

• US 5,468,967 A
• Filed: 08/26/1994
• Issued: 11/21/1995
• Est. Priority Date: 08/26/1994
• Status: Expired due to Term

• Current Assignee: National University of Singapore
• Original Assignee: National University of Singapore
• Inventors: Leong, Kin, Chan, Daniel S. H., Phang, Jacob C. H.
• Primary Examiner(s): Beyer, James
• Assistant Examiner(s): Beyer, James
• Application Number:
  US08/295,048
• Time in Patent Office: 452 Days
• Field of Search: 250/397, 250/310, 250/306
• US Class Current: 250/397
• CPC Class Codes: H01J 2237/2445 Photon detectors for X-rays, light, e.g. photomultipliers
• CPC Class Codes: H01J 37/228 whereby illumination and light collection take place in the same area of the discharge
• CPC Class Codes: H01J 37/244 Detectors; Associated components or circuits therefor

Abstract

A parabolic reflector and an inclined planar light reflector in a cathodoluminescence detector are integrated with a set of photo-sensitive solid-state detector cells mounted in quadrature on a supporting plate, and supported by an electron microscope vacuum chamber specimen stage adaptor unit. Designed for CL emission operation in an electron microscope, the parabolic light reflector, the inclined planar light reflector and the photo-sensitive, solid-state detector cells are optically aligned and mechanically combined through the supporting plate of the detector cells. A readily exchangeable unit is thus obtained. The unit is further supported by the specimen stage adaptor unit so as to obtain a mechanical unit which can easily be mounted in and removed from any standard electron microscope vacuum chamber stage as a single integrated unit.

Claims

1. Cathodoluminescence detector apparatus for the vacuum chamber specimen stage of an electron microscope being used for cathodoluminescence microscopy and analysis, comprising:

a) an adaptor unit for mounting the apparatus on said vacuum chamber specimen stage and having means for supporting a specimen;

b) at least one photosensitive member responsive to radiation emitted from a specimen being scanned by an electron beam of the electron microscope;

c) means secured to said adaptor unit for supporting said at least one photosensitive member;

d) means for coupling a detection signal from said at least one photosensitive member;

e) double reflecting means located adjacent said specimen and said at least one photosensitive member and having respective reflective surfaces for reflecting radiation emitted from said specimen to said photosensitive member and collecting backscattered electrons from said specimen for removal, said double reflecting means further comprising,

f) parabolic reflector means for receiving the radiation from said specimen, and

g) planar reflector means for receiving the radiation from said first reflector means and then directing the reflected radiation to said photosensitive member.

2. The apparatus of claim 1 wherein said planar reflector comprises a pyramidal structure having a plurality of inclined reflective surfaces disposed to the side of said adaptor unit and wherein said parabolic reflector has a concave reflective surface disposed toward said plurality of inclined reflective surfaces and said specimen.

3. The apparatus of claim 2 wherein said at least one photosensitive member comprises a plurality of photosensitive members arranged in quadrature around said adaptor unit and facing said inclined reflective surfaces.

4. The apparatus of claim 2 wherein said parabolic reflector means includes an aperture for permitting the electron beam to impinge on said specimen.

5. The apparatus of claim 4 wherein said aperture comprises a central aperture.

6. The apparatus of claim 5 and additionally including electrical insulator means located between said at least one photosensitive member and said means for supporting said photosensitive member.

7. The apparatus of claim 3 wherein said plurality of photosensitive members are arranged in an upright position and facing said inclined reflective surfaces at an angle of substantially 45°

.

8. The apparatus of claim 1 wherein said adaptor unit comprises a first body member for supporting said specimen, a second body member for supporting said means for supporting said at least one photosensitive member and a third body member projecting from said second body member for attachment to said vacuum chamber specimen stage.

9. The apparatus of claim 8 wherein said first body member includes means for receiving a specimen stub which operates to support said specimen.

10. The apparatus of claim 9 wherein said means for receiving the specimen stub comprises a threaded bore.

11. The apparatus of claim 8 wherein said third body member comprises a threaded stud.

12. The apparatus of claim 6 wherein said means for supporting said at least one photosensitive member and said electrical insulator means includes at least one mutually aligned hole therein for connecting said means for coupling a detection signal to the underside surface of said at least one photosensitive member.

13. The apparatus of claim 1 additionally including means for attaching said parabolic reflector means to said means for supporting said at least one photosensitive member.

14. The apparatus of claim 13 wherein said means for attaching comprises means for securing a peripheral edge of said parabolic reflector means to said means for supporting said at least one photosensitive means.