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Method of calibrating an analytical instrument

  • US 5,552,997 A
  • Filed: 07/14/1994
  • Issued: 09/03/1996
  • Est. Priority Date: 04/20/1990
  • Status: Expired due to Term
First Claim
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1. A method of calibrating an X-ray spectrometer comprising the steps of(a) generating x-rays from at least one standard sample,(b) measuring intensities of said x-rays for different concentrations of said standard sample,(c) forming a representation of intensity versus concentration for each measured value of intensity with said different concentrations,(d) determining if a best straight calibration line can be formed from said representation, and if not(e) changing instrument parameters and/or sample preparation to achieve said best straight calibration line, and(f) repeating said steps (a)-(d) to calibrate said x-ray spectrometer.

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