Optical scanning apparatus

• US 5,585,639 A
• Filed: 07/27/1995
• Issued: 12/17/1996
• Est. Priority Date: 07/27/1995
• Status: Expired due to Term

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Hewlett-Packard Company (HP Inc.)
• Inventors: Sampas, Nicholas, Dorsel, Andreas
• Primary Examiner(s): Berman, Jack I.
• Assistant Examiner(s): NGUYEN, KIET TUAN
• Application Number:
  US08/508,021
• Time in Patent Office: 509 Days
• Field of Search: 250/458.1, 250/358.1, 250/359.1, 250/339.11, 250/341.8, 250/461.1, 250/461.2, 356/311, 356/317
• US Class Current: 250/458.1
• CPC Class Codes: B01J 2219/00707 separated from the reactor apparatus
• CPC Class Codes: G01N 21/6452 Individual samples arranged in a regular 2D-array, e.g. multiwell plates

Abstract

An optical scanning apparatus for scanning an array of sample regions carried on the surface of a substrate is disclosed. The apparatus includes a beam generator for generating a light beam effective to produce detectable light from such sample regions, and scanning optics for scanning the beam in one direction corresponding to a linear array of such sample regions. Light emitted from the linear array is imaged through an imaging system whose optical axis is angularly offset from the optical axis of the illumination beam, onto a photodetector. The optical configuration achieves high performance with relatively simple optics.

Claims

1. An optical scanning apparatus for scanning an array of sample regions carried on a surface of a substrate, comprising:

a beam generator for generating a light beam effective to produce detectable light from such sample regions,

means for scanning said beam in one direction corresponding to a linear array of such sample regions,

means for imaging light corresponding to light from said linear array of sample regions in response to beam irradiation, where the optical axes of the imaged light, as the beam is scanned in said one direction, (i) are angularly offset from the corresponding optical axes of the light beam, and (ii) intersect the optical axes of the light beam at a surface plane corresponding to the sample regions along said linear array,

detection means for detecting said imaged light from said imaging means, wherein said detection means includes a detector surface and a slit interposed between the imaging means and the detector surface, and said imaging means is effective to image light emission from said sample array through said slit, as said beam is scanned in said one direction.

2. The apparatus of claim 1, wherein said imaging means produces an astigmatic image oriented parallel to said slit, as said beam is scanned across said sample array in said one direction, and said slit is in a plane coincident with said astigmatic image.

3. The apparatus of claim 1, wherein said slit is straight.

4. The apparatus of claim 3, wherein said imaging means includes a lens assembly with a numerical aperture of at least about 0.25.

5. The apparatus of claim 1, wherein said beam has a beam width less than about 5 microns at the focus, and said scanning means is effective to move said beam a total of at least about 10 mm in said one direction.

6. The apparatus of claim 1, wherein said scanning means scans a two-dimensional array of sample regions, and which further includes means for shifting said sample in a direction normal to the direction of beam scanning.

7. The apparatus of claim 1, for scanning an array of sample regions carried on a surface of a transparent substrate, wherein said beam is adapted to impinge upon sample regions on said sample surface through the substrate, and said imaging means is adapted to image light received through the substrate.

8. The apparatus of claim 1, wherein said beam is effective to excite sample fluorescence emission at a selected wavelength, and said detector is effective to detect fluorescence emission at a longer wavelength.

9. The apparatus of claim 8, wherein said detector is a spatially non-resolving detector.

10. The apparatus of claim 1, which further includes control means for (i) controlling said scanning means, (ii) recording the instantaneous position of said beam, and (iii) correlating the instantaneous positions of said beam with signals received from said detector, whereby a map of substrate light emission levels as a function of substrate position can be constructed.

11. An optical scanning apparatus for scanning an array of fluorescent sample regions carried on a surface of a substrate, comprising:

a beam generator for generating a light beam effective to excite fluorescence light emission from said sample regions, said beam having a beam width less than about 5 microns,

means for scanning said beam, over a scanning distance of at least about 2-10 mm, in one direction corresponding to a linear array of said sample regions,

a lens assembly for imaging, with a numerical aperture of at least about 0.25, fluorescence light emission corresponding to light emission from said linear array of sample regions in response to beam excitation, where the optical axes of the imaged light emission, as the beam is scanned in said one direction, are (i) angularly offset from the corresponding optical axes of the scanned beam, and (ii) intersect the optical axes of the light beam at a surface plane corresponding the sample regions along said linear array,

detection means for detecting said imaged light from said lens assembly, wherein said detection means includes a detector surface and a slit interposed between the lens assembly and the detector surface, and said lens assembly is effective to image light emission from said sample array through said slit, as said beam is scanned in said one direction,

shifting means for relatively shifting said sample in a direction normal to the direction of beam scanning in the plane of the sample, and

control means for (i) controlling said scanning means, (ii) recording the instantaneous position of said beam, and (iii) correlating the instantaneous positions of said beam with signals received from said detector, whereby a map of substrate light emission levels as a function of substrate position can be constructed.

12. The apparatus of claim 11, wherein said lens assembly produces an astigmatic image oriented in the direction of said slit, as said beam is scanned across said sample array in said one direction, and said slit is in a plane coincident with said astigmatic image.

13. The apparatus of claim 11, for scanning an array of sample regions carried on a surface of a transparent substrate, wherein said beam is adapted to impinge upon sample regions on said sample surface through the substrate, and said lens assembly is adapted to image light received through the substrate.

14. The apparatus of claim 11, wherein said detector is a spatially non-resolving detector.