Electromagnetic profile scanner

• US 5,615,003 A
• Filed: 11/29/1994
• Issued: 03/25/1997
• Est. Priority Date: 11/29/1994
• Status: Expired due to Term

• Current Assignee: Alexander T. Hermary, Terrance J. Hermary
• Original Assignee: Alexander T. Hermary, Terrance J. Hermary
• Inventors: Hermary, Alexander T., Hermary, Terrance J.
• Primary Examiner(s): Buczinski, Stephen C.
• Assistant Examiner(s): Laufer, Pinchus M.
• Application Number:
  US08/346,392
• Time in Patent Office: 847 Days
• Field of Search: 356/3.03, 356/3.06, 356/3.07, 356/376, 250/559.23, 250/559.22, 250/237 G, 235/463, 382/106, 382/199, 382/266
• US Class Current: 356/3.03
• CPC Class Codes: G01B 11/245 using a plurality of fixed, simultaneously operating transducers G01B11/2408 - G01B11/2425, G01B11/255 take precedence
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50

Abstract

A system for determining the shape and dimensions of a surface of an object includes a projector for projecting onto the object a spatially coded pattern of radiation, e.g., light. The system also includes a receiving device capable of imaging the reflected pattern, and a discriminator for determining which portion of the reflected pattern corresponds to which portion of the projected pattern. By this means, a received signal representing less than the complete reflection from the projected pattern can be correlated with a discrete portion of the scanned object. The procedure is repeated to obtain enough reliable data to generate a reasonably reliable surface profile. The resulting set of received signals and correlations are used to calculate the shape and dimensions of the object.

Claims

1. A method of measuring a selected surface of an object at a distance, comprising the steps of:

(a) projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a single pattern of electromagnetic radiation comprising an array of spatially arranged and bounded pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information, said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) receiving at a second predetermined location differing from the first predetermined location radiation reflected from the selected surface of the object and measuring (i) the directional distribution of the radiation over a scan of the object and (ii) a preselected received parameter of the reflected radiation whose variable value over the scan is measured, said received parameter being selected for discriminating between and identifying pattern elements and their types within reflection data derived from radiation originating from the projected pattern and reflected from the selected surface of the object;

(c) converting the received radiation into data representing an image of the reflection of at least a portion of the projected pattern reflected from the selected surface of the object;

(d) using the data obtained in step (c), comparing the data representing the image of the reflection with data representing the projected pattern, so as to match identifiable portions of the image with the corresponding portions of the projected pattern; and

(e) calculating the spatial coordinates of the locations on the surface of the object on which each identifiable portion of the projected pattern fell from data representing (i) the first and second predetermined locations, (ii) the known directions of projection for each portion of the projected pattern matched in step (d), and (iii) measured directions pursuant to step (b), from which each corresponding portion of the image was received.

2. The method defined in claim 1, wherein the first discrete physical characteristic of each pattern element is associated with information distinguishing a pattern element from adjacent pattern elements in the pattern and the second discrete physical characteristic is associated with information providing identification of the type of each discrete pattern element.

3. The method defined in claim 2, wherein:

(i) the first discrete physical characteristic of each pattern element is a preselected relatively abrupt change in a characteristic of the projected radiation across the spatial boundaries of the pattern element, said change producing in the reflected radiation an identifiable change in the preselected parameter;

(ii) each pattern element is comprised of spatially discrete first and second portions, the projected radiation in the first portion producing in the received radiation a value of the preselected parameter differing from that produced by the second portion;

(iii) said portions having a ratio in spatial extent selected to be discernibly different for each type of pattern element; and

(iv) the second discrete physical characteristic of a pattern element is said selected ratio.

4. The method defined in claim 3, wherein said selected ratio for a pattern element is selected from the group consisting of about 2 to 1 and about 1 to 2.

5. The method defined in claim 3, wherein said selected ratio for a pattern element is selected from the group consisting of about 3 to 1 and about 1 to 3.

6. The method defined in claim 2, wherein:

(i) each pattern element comprises a binary subpattern of at least three substantially equal portions beginning with a start portion and ending with an end portion distinguishable from the start portion, whereby the start portion and other portions mutually indistinguishable from the start portion may be denoted by 1 in the binary subpattern and the end portion and other portions mutually indistinguishable from the end portion may be denoted by 0 in the binary subpattern;

(ii) the first discrete physical characteristic of a pattern element is the location of the start portion in the pattern;

(iii) the binary subpattern comprises a first contiguous sequence of at least one 1 including the 1 denoting the start portion and a second contiguous sequence of at least one 0 including the 0 denoting the end portion; and

(iv) the second discrete physical characteristic is the binary subpattern.

7. The method defined in claim 6, wherein the binary subpattern for each pattern element is selected from the group consisting of 100 and 110.

8. The method defined in claim 6, wherein the binary subpattern for each pattern element is selected from the group consisting of 1000, 1100, and 1110.

9. The method defined in claim 2, wherein:

(i) the first discrete physical characteristic of each pattern element is a preselected relatively abrupt change in a characteristic of the projected radiation across the spatial boundaries of the pattern element, said change producing in the reflected radiation an identifiable change in the preselected parameter;

(ii) each pattern element is comprised of spatially discrete first and second portions, the projected radiation in the first portion producing in the received radiation a value of the preselected parameter of the reflected radiation differing from that produced by the second portion, thereby providing a ratio of the value of the preselected parameter in the reflected radiation produced by the projected radiation in the first portion to the value of the preselected parameter in the reflected radiation produced by the projected radiation in the second portion;

(iii) the values of said ratio are selected to be discernibly different for each type of pattern element; and

(iv) the second discrete physical characteristic of a pattern element is said ratio.

10. In a method of measuring a selected surface of an object at a distance, of the type wherein electromagnetic radiation having a structured pattern is projected from a first predetermined location over a predetermined angular range onto the selected surface of the object;

electromagnetic radiation reflected from the selected surface of the object is received at a second predetermined location differing from the first predetermined location, and the directional distribution of the received electromagnetic radiation is measured;

whereby the coordinates of portions of the selected surface are calculated, permitting the surface profile of the selected surface to be simulated;

the improvement comprising;

(a) projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a single structured pattern of electromagnetic radiation comprising an array of spatially arranged pattern elements selected from at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information, said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) receiving at a second predetermined location differing from the first predetermined location electromagnetic radiation reflected from the selected surface of the object and measuring over a scan of the object a preselected parameter of the reflected radiation for discriminating between pattern elements of the electromagnetic radiation originating from the projected pattern and reflected from the selected surface of the object;

(c) converting the received electromagnetic radiation into data representing the distribution over a scan of said preselected parameter associated with an image of the reflection of at least a portion of the projected pattern reflected from the selected surface of the object;

(d) using the data obtained in step (c), comparing the scan distribution data associated with the image of the reflection with data representing the projected pattern, so as to match identifiable portions of the image with corresponding portions of the projected pattern;

whereby the coordinates of the locations on the surface of the object on which each identifiable portion of the projected pattern fell are correlated with the matched data obtained from step (d).

11. A method of measuring a surface portion of an object at a distance, comprising the steps of:

(a) illuminating the object from a first predetermined location over a predetermined angular range with a single projected thin generally fan-shaped beam of electromagnetic radiation that spatially varies along its wider dimension in a pattern comprising a spatially arranged sequence of pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information, said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) detecting electromagnetic radiation reflected from the surface portion of the object over a scan of the object;

(c) converting the detected electromagnetic radiation into data representing the distribution over a scan of a preselected parameter of the reflected radiation associated with an image of the reflection of at least a portion of the projected pattern reflected from the object;

(d) correlating each such distinguishable portion of the projected pattern with the reflection data obtained from step (c) by comparing data representing the pattern of the illuminating beam with the said reflection data, so as to establish a match of an identifiable portion of the reflected radiation and a corresponding portion of the illuminating beam whereby the portion of the surface of the object from which the reflected radiation has been reflected is ascertained; and

(e) computing distance data for a scan of the object and coordinating said distance data with the matched reflected radiation data, thereby generating profile data representing the profile of at least a portion of the scanned object.

12. A method of measuring a selected surface of an object at a distance, comprising the steps of:

(a) projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a single pattern of electromagnetic radiation comprising an array of spatially arranged pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least two contrasting pattern element segments, each of at least two selected ones of said segments representing information of a discrete type;

said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) receiving at a second predetermined location differing from the first predetermined location radiation reflected from the selected surface of the object and measuring (i) the directional distribution of the radiation over a scan of the object and (ii) a preselected parameter of the reflected radiation whose variable value over the scan is measured, said preselected parameter being selected for discriminating between and identifying pattern elements and their types within reflection data derived from radiation originating from the projected pattern and reflected from the selected surface of the object;

(c) the received radiation into data representing an image of the reflection of at least a portion of the projected pattern reflected from the selected surface of the object;

(d) using the data obtained in step (c), comparing the data representing the image of the reflection with data representing the projected pattern, so as to match identifiable portions of the image with the corresponding portions of the projected pattern; and

(e) calculating the spatial coordinates of the locations on the surface of the object on which each identifiable portion of the projected pattern fell from data representing (i) the first and second predetermined locations, (ii) the known directions of projection for each portion of the projected pattern matched in step (d), and (iii) measured directions pursuant to step (b), from which each corresponding portion of the image was received.

13. Apparatus for measuring a surface portion of an object at a distance, comprising:

(a) an illuminator for illuminating the object by projecting from a first predetermined location over a predetermined angular range onto the surface portion of the object an illuminating beam comprising a single spatially varied pattern of electromagnetic radiation selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern, said pattern comprised of an array of spatially arranged pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information;

(b) a detector for receiving electromagnetic radiation reflected from the surface portion of the object;

(c) a converter for converting the received electromagnetic radiation into computer-readable digital reflection data;

(d) a discriminator for processing said data for correlating each said distinguishable portion of the projected pattern with the image of its reflection by comparing transmission data representing the pattern of the illuminating beam with the reflection data, so as to establish a match of an identifiable portion of the reflected radiation and a corresponding portion of the illuminating beam, whereby the portion of the surface of the object from which the reflected radiation has been reflected is ascertained;

(e) a coordinate calculator for computing the spatial coordinates of the portion of that surface of the object on which each distinguishable portion of the pattern falls; and

(f) a profile generator for computing and generating distance data correlated with the computed spatial coordinates of the scanned object thereby to generate data representing the profile of at least a portion of the scanned object.

14. Apparatus for measuring the spatial coordinates of a selected portion of the surface of an object to be measured, comprising:

a laser source;

a cylindrical lens receiving light from the laser source and generating a fan-shaped beam of light;

a mask formed as a pattern comprising a spatially ordered array of pattern elements each including a transparent region followed by an opaque region selected so that each pattern element is identifiable as being of a selected one of at least two types of pattern elements mutually distinguishable from one another by means of the ratio in spatial extent of the transparent and opaque regions therein;

said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

said laser source, cylindrical lens and mask being spatially disposed to project the pattern of the mask onto the selected surface of the object to be measured;

an image sensor having a generally linear array of sensing elements lying generally in the plane of the fan-shaped beam of light, for receiving light reflected from the object to be measured;

said image sensor generating an electronic signal whose amplitude varies over the linear array of sensing elements in accordance with the variation in space of the intensity of the light reflected from the object and received by the image sensor;

a converter for converting the electronic signal produced by the image sensor into computer-readable digital reflection data;

means for identifying within the reflection data information representative of a reflection sequence of pattern elements of the projected pattern;

means for comparing the reflection sequence of pattern elements with each projected sequence of pattern elements of the mask of a sequence length equal to the length of the reflection sequence;

whereby the image data may be correlated with a discrete identified portion of the surface of the object being measured; and

using the principle of triangulation, determining the angles of incidence and reflection of light projected upon and reflected from the selected surface of the object being measured, and using the known geometry of said apparatus including the laser and image sensor thereby to compute the spatial coordinates of the identified portion of the surface of the object;

whereby the spatial coordinates thus computed are correlated uniquely with the pattern projected onto the surface, thereby to generate reliable spatial coordinate information of the identified portion of the surface of the object being measured.

15. Apparatus for measuring a selected surface of an object at a distance comprising

a laser source;

a cylindrical lens through which light from the laser source passes thereby to form a fan-shaped beam of light;

a first mirror for reflecting the fan-shaped beam of light toward the selected surface of the object to be measured;

a mask interposed between the first mirror and the object to be measured and having thereon and superimposing upon the fan-shaped beam of light a single pattern comprised of an array of sequential pattern elements;

each pattern element being a selected one of at least two pattern element types each including a transparent region followed by an opaque region, said pattern elements mutually distinguishable from one another by means of the ratio in spatial extent of the transparent and opaque regions therein;

said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

a second mirror for receiving light reflected from the selected surface of the object;

an image lens for focusing light reflected from the second mirror;

an image sensor having a generally linear array of sensing elements lying generally in the plane of the fan-shaped beam of light;

said image sensor receiving light reflected from the second mirror that is passed through the image lens;

said image sensor being located relative to the second mirror and image lens to receive a focused image of light reflected from the selected surface of the object;

said image sensor generating a received signal whose magnitude over the linear array of sensing elements is proportional to the intensity of the light reflected from the selected surface of the object from one extremity of the selected surface to the other over a scan;

a converter for converting the received signal produced by the image sensor to computer-readable digital reflection data in a sequence correlatable with the sequence of variation of magnitude of the received signal;

pattern element identification means for identifying within said reflection data information representing a sequence of pattern elements of the reflected pattern emanating from the selected surface of the object to be measured;

comparison means for comparing the identified series of pattern elements in the reflection data with each sequence of pattern elements in the transmitted data of sequence length equal to the length of the sequence of reflected pattern element data;

means for matching the apparent sequence of pattern elements in the reflection data to the projected pattern element data to obtain the best match of reflected pattern element data with the transmitted sequence of pattern elements thereby to correlate the reflection data with an identified portion of the object being measured;

means for computing for each intercept of a pattern element with the selected surface of the object being measured the spatial coordinates of that intercept, using the principal of triangulation, measured angles of incidence and reflection of the projected and reflected patterns, and the known geometry of the apparatus including the mirrors, lenses, laser source, and image sensor;

thereby to derive data representing the spatial coordinates of the identifiable portion of the object to be measured.

16. Apparatus as defined in claim 15, wherein the transparent and opaque regions comprise sequential parallel bands alternating between opaque and transparent bands.

17. Apparatus as defined in claim 16, wherein all pattern elements have substantially identical width.

18. Apparatus as defined in claim 17, wherein the pattern element identification means comprises an edge detector for detecting rising and falling edges of the intensity of the reflected light received by the image sensor as embodied in the reflection.

19. Apparatus as defined in claim 18, wherein the pattern elements in the reflection data are identified by comparing, for each successive rising edge, the duty cycle between a rising and consecutive falling edge with the distance between successive rising edges including the duty cycle, thereby to correlate the apparent pattern element type of each received pattern element in the sequence with an identifiable one of the transmitted pattern element types.

20. Apparatus as defined in claim 19, wherein reflection data representing the detected rising and falling edges are tested for validity in accordance with the trend in the spacing of the rising edges, and the reflection data are then rectified by discarding selected spurious rising edges and inserting selected contrived rising edges where the trend of the spacing indicates that spurious edges or missed edges have contaminated the reflection data.

21. Apparatus for measuring a selected surface of an object at a distance, comprising:

(a) a projector for projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a single pattern of electromagnetic radiation comprising an array of spatially arranged pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information, said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) a detector for receiving at a second predetermined location differing from the first predetermined location radiation reflected from the selected surface of the object and measuring (i) the directional distribution of the radiation over a scan of the object and (ii) a preselected received parameter of the reflected radiation whose variable value over the scan is measured, said received parameter being selected for discriminating between and identifying pattern elements and their types within reflection data derived from radiation originating from the projected pattern and reflected from the selected surface of the object;

(c) a converter for converting the received radiation into data representing an image of the reflection of at least a portion of the projected pattern reflected from the selected surface of the object;

(d) a discriminator for comparing the data generated by the converter as representing the image of the reflection with data representing the projected pattern, so as to match identifiable portions of the image with the corresponding portions of the projected pattern; and

(e) a coordinate calculator for calculating the spatial coordinates of the locations on the surface of the object on which each identifiable portion of the projected pattern fell, from data representing (i) the locations of the projector and detector, (ii) the known directions of projection for each portion of the projected pattern matched in the discriminator, and (iii) measured directions pursuant to those received by the detector, from which each corresponding portion of the image was received.

22. Apparatus as defined in claim 21, wherein the radiation is light.

23. Apparatus as defined in claim 21, wherein the types of pattern elements are distinguished from one another by means of a selected structured radiation parameter of the projected electromagnetic radiation whose value is discernibly different for each of the said types, and the reflection of which pattern elements from the object includes over the scan a series of values of the selected received parameter.

24. Apparatus as defined in claim 23, wherein the structured radiation parameter is polarization.

25. Apparatus as defined in claim 23, wherein the structured radiation parameter is wavelength.

26. Apparatus as defined in claim 23, wherein the structured radiation parameter is intensity.

27. Apparatus as defined in claim 22, wherein the projected electromagnetic radiation comprises a series of pattern elements of predetermined width, and the structured radiation parameter is the relative width within each pattern element of a selected relative value of a measurable characteristic of the radiation as compared with the width of the pattern element as a whole.

28. Apparatus as defined in claim 27, wherein the measurable characteristic is intensity.

29. Apparatus as defined in claim 23, wherein each pattern element is divided into a low-intensity portion of a first variable width and a high-intensity portion of a second variable width, and wherein the structured radiation parameter is the ratio of the width of the high intensity portion of the pattern element to the width of the pattern element.

30. Apparatus as defined in claim 29, wherein the received parameter comprises the intensity within a predetermined bandwidth of the radiation reflected from the object, said predetermined bandwidth overlapping at least a known portion of the bandwidth of the projected radiation.

31. Apparatus as defined in claim 30, wherein the radiation is light.

32. Apparatus as defined in claim 31, comprising means for coordinating means (a) through (e) to perform a series of scans of adjacent surface portions of the object.

33. Apparatus as defined in claim 23, wherein each pattern element comprises a mark and a contiguous space, each projected pattern element is of a width selected to be substantially uniform as projected, and wherein the ratio of the width of the mark to the space is selected for each pattern element to be one of at least two mutually distinguishable values.

34. Apparatus as defined in claim 23, wherein each pattern element comprises a mark and a contiguous space, each projected pattern element is of a width selected to be substantially uniform as the pattern falls upon the object, and wherein the ratio of the width of the mark to the space is selected for each pattern element to be one of at least two mutually distinguishable values.

35. Apparatus as defined in claim 23, wherein each pattern element comprises a mark and a contiguous space, each projected pattern element is of a width selected according to a predetermined scheme, and wherein the ratio of the width of the mark to the space is selected for each pattern element to be one of at least two mutually distinguishable values.

36. Apparatus as defined in claim 35, wherein the received parameter comprises the intensity of the radiation reflected from the object.

37. Apparatus as defined in claim 35, wherein the received parameter comprises the intensity within a predetermined bandwidth of the radiation reflected from the object, said predetermined bandwidth overlapping at least a known portion of the bandwidth of the projected radiation.

38. Apparatus as defined in claim 37 wherein means (c) and (d) comprise an edge detector for edge detection of rising and falling edges of amplitude data representative of the intensity of the electromagnetic radiation received from sequential portions of the surface of the scanned object over the scan;

computing means for computation of the duty cycle comprising the ratio of the signal width between a rising edge and the next following falling edge to the signal width between that rising edge and the next following rising edge; and

comparison means for comparing the ratio of the width of an apparent mark to the width of an apparent space in each apparent received pattern element with contiguous sequences of pattern elements in the projected pattern of sequence length equal to the apparent sequence length of the received pattern element over the scan so as to correlate the spatial sequence of received pattern elements detected within the reflection data with a corresponding sequence of pattern elements in the pattern projected onto the object being measured.

39. Apparatus as defined in claim 38 wherein means (d) further comprises means for applying a pattern matching routine to a series of difference data representing the difference between the reflection data and a corresponding series of portions of the data representing the projected pattern, said portions being selected to comprise a contiguous series of pattern elements equal in number to the number of apparent pattern elements contained in the image of the reflection.

40. Apparatus as defined in claim 39, wherein the pattern matching routine comprises a least squares fitting routine.

41. Apparatus as defined in claim 39 wherein the radiation is light.

42. Apparatus as defined in claim 41, comprising means for coordinating means (a) through (e) to perform a series of scans of adjacent surface portions of the object.

43. Apparatus as defined in claim 42, wherein the pattern elements in the reflection data are identified by comparing, for each successive rising edge, the duty cycle between a rising and consecutive falling edge with the distance between successive rising edges including the duty cycle, thereby to correlate the apparent pattern element type of each received pattern element in the sequence with an identifiable one of the transmitted pattern element types.

44. Apparatus as defined in claim 39, additionally comprising:

(f) means for recognizing and deriving at least one apparent sequence of pattern elements from the reflected pattern signal data;

(g) means for iteratively comparing a selected pattern parameter of selected individual ones of the apparent received pattern elements in said apparent sequence relative to a prediction for each such selected apparent received individual pattern element based upon the sequence of pattern elements in the transmitted pattern and based upon the values of the selected pattern parameter for selected apparent received pattern elements adjacent such selected individual pattern element; and

(h) means for selecting for recomputing the sequence number value of selected ones of the pattern elements recognized in the received pattern element data based upon the result of the comparison performed by the comparison means;

thereby to generate a validated sequence of pattern elements.

45. Apparatus as defined in claim 44, wherein the selected pattern parameter is the width of the mark of a pattern element.

46. Apparatus as defined in claim 45, wherein means (h) comprises means for inserting an additional pattern element in sequence before a given apparent pattern element in the received signal data when the observed apparent width of the given apparent pattern element is greater than the average apparent pattern element width of selected pattern elements in the vicinity of the given pattern element by more than a preselected fraction of said average width.

47. Apparatus as defined in claim 45, wherein means (h) comprises means for deleting a given apparatus pattern element from an observed sequence of apparent pattern elements in the received signal data when the observed apparent width of the given apparent pattern element is less than the average apparent pattern element width of selected pattern elements in the vicinity of the given pattern element by more than a preselected fraction of said average width.

48. Apparatus as defined in claim 45, wherein means (h) comprises

means for inserting an additional pattern element in sequence before a given apparent pattern element in the received signal data when the observed apparent width of the given apparent pattern element is greater than the average apparent pattern element width of selected pattern elements in the vicinity of the given pattern element by more than a preselected fraction of said average width;

and

means for deleting a given apparatus pattern element from an observed sequence of apparent pattern elements in the received signal data when the observed apparent width of the given apparent pattern element is less than the average apparent pattern element width of selected pattern elements in the vicinity of the given pattern element by more than a preselected fraction of said average width.

49. Apparatus as defined in claim 39, wherein each pattern element as it falls on the object is of dimensions large compared to the dimensions of expected small aberrations in the profile of the object.

50. Apparatus as defined in claim 21, wherein each pattern element as it falls on the object is of dimensions large compared to the dimensions of expected small aberrations in the profile of the object.

51. Apparatus defined in claim 21, wherein the first discrete physical characteristic of each pattern element is associated with information distinguishing a pattern element from adjacent pattern elements in the pattern and the second discrete physical characteristic is associated with information providing identification of the type of each discrete pattern element.

52. Apparatus defined in claim 51, wherein:

(i) the first discrete physical characteristic of each pattern element is a preselected relatively abrupt change in a characteristic of the projected radiation across the spatial boundaries of the pattern element, said change producing in the reflected radiation an identifiable change in the preselected parameter;

(ii) each pattern element is comprised of spatially discrete first and second portions, the projected radiation in the first portion producing in the received radiation a value of the preselected parameter differing from that produced by the second portion;

(iii) said portions having a ratio in spatial extent selected to be discernibly different for each type of pattern element; and

(iv) the second physical characteristic of a discrete pattern element is said selected ratio.

53. Apparatus defined in claim 52, wherein said selected ratio for a pattern element is selected from the group consisting of about 2 to 1 and about 1 to 2.

54. Apparatus defined in claim 52, wherein said selected ratio for a pattern element is selected from the group consisting of about 3 to 1 and about 1 to 3.

55. Apparatus defined in claim 51, wherein:

(i) each pattern element comprises a binary subpattern of at least three substantially equal portions beginning with a start portion and ending with an end portion distinguishable from the start portion, whereby the start portion and other portions mutually indistinguishable from the start portion may be denoted by 1 in the binary subpattern and the end portion and other portions mutually indistinguishable from the end portion may be denoted by 0 in the binary subpattern;

(ii) the first discrete physical characteristic of a pattern element is the location of the start portion in the pattern;

(iii) the binary subpattern comprises a first contiguous sequence of at least one 1 including the 1 denoting the start portion and a second contiguous sequence of at least one 0 including the 0 denoting the end portion; and

(iv) the second discrete physical characteristic is the binary subpattern.

56. The method defined in claim 55, wherein the binary subpattern for each pattern element is selected from the group consisting of 100 and 110.

57. The method defined in claim 55, wherein the binary subpattern for each pattern element is selected from the group consisting of 1000, 1100, and 1110.

58. The method defined in claim 51, wherein:

(i) the first discrete physical characteristic of each pattern element is a preselected relatively abrupt change in a characteristic of the projected radiation across the spatial boundaries of the pattern element, said change producing in the reflected radiation an identifiable change in the preselected parameter;

(ii) each pattern element is comprised of spatially discrete first and second portions, the projected radiation in the first portion producing in the received radiation a value of the preselected parameter differing from that produced by the second portion, thereby providing a ratio of the value of the preselected parameter in the reflected radiation produced by the projected radiation in the first portion to the value of the preselected parameter in the reflected radiation produced by the projected radiation in the second portion;

(iii) the values of said ratio are selected to be discernibly different for each type of pattern element; and

(iv) the second discrete physical characteristic of a pattern element is said ratio.

59. In or for use with apparatus for measuring a selected surface of an object at a distance, of the type having a projector for projecting electromagnetic radiation having a structured pattern from a first predetermined location over a predetermined angular range onto the selected surface of the object;

a detector at a second predetermined location differing from the first predetermined location for receiving electromagnetic radiation reflected from the selected surface of the object, and measuring means for measuring the directional distribution of the received electromagnetic radiation;

whereby the coordinates of portions of the selected surface are calculated, permitting the surface profile of the selected surface to be simulated;

the improvement comprising;

(a) a projector for projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a single structured pattern of electromagnetic radiation comprising spatially varied pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information;

said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) a detector for detecting at a second predetermined location differing from the first predetermined location electromagnetic radiation reflected from the selected surface of the object and measuring over a scan of the object a preselected received parameter of the reflected radiation for discriminating between pattern elements of the electromagnetic radiation originating from the projected pattern and reflected from the selected surface of the object;

(c) a converter for converting the detected electromagnetic radiation into data representing the distribution over a scan of said preselected received parameter of the reflected radiation associated with an image of the reflection of at least a portion of the projected pattern reflected from the selected surface of the object;

(d) a discriminator for comparing the scan distribution data associated with the image of the reflection with data representing the projected pattern, so as to match identifiable portions of the image with the corresponding portions of the projected pattern;

whereby the coordinates of the locations on the surface of the object on which each identifiable portion of the projected pattern fell are correlated with the matched data.

60. Apparatus as defined in claim 59, comprising means for coordinating means (a) through (e) to perform a series of scans of adjacent surface portions of the object.

61. Apparatus as defined in claim 59, wherein the types of pattern elements are distinguished from one another by means of a selected structured parameter of the projected electromagnetic radiation whose value is discernably different for each of the said types, and the reflection of which pattern elements from the object includes over the scan a series of values of the received parameter.

62. Apparatus as defined in claim 61, wherein each pattern element is divided into a low-intensity portion of a first variable width and a high-intensity portion of a second variable width, and wherein the structured radiation parameter is the ratio of the width of the high intensity portion of the pattern element to the width of the pattern element.

63. Apparatus as defined in claim 62, wherein the received parameter comprises the intensity within a predetermined bandwidth of the radiation reflected from the object, said predetermined bandwidth overlapping at least a known portion of the bandwidth of the projected radiation.

64. Apparatus as defined in claim 63, wherein the radiation is light.

65. Apparatus as defined in claim 63 wherein means (c) and (d) comprise

an edge detector for edge detection of rising and falling edges of amplitude data representative of the intensity of the electromagnetic radiation received from sequential portions of the surface of the scanned object over the scan;

computing means for computation of the duty cycle comprising the ratio of the signal width between a rising edge and the next following falling edge to the signal width between that rising edge and the next following rising edge; and

comparison means for comparing the ratio of the width of an apparent mark to the width of an apparent space in each apparent received pattern element with contiguous sequences of pattern elements in the projected pattern of sequence length equal to the apparent sequence length of the received pattern element over the scan so as to correlate the spatial sequence of received pattern elements detected within the reflection data with a corresponding sequence of pattern elements in the pattern projected onto the object being measured.

66. Apparatus as defined in claim 65 wherein means (d) comprises means for applying a pattern matching routine to a series of difference data representing the difference between the reflection data and a corresponding series of portions of the data representing the projected pattern, said portions being selected to comprise a contiguous series of pattern elements equal in number to the number of apparent pattern elements contained in the image of the reflection.

67. Apparatus as defined in claim 66 comprising testing means for testing the validity of data representing the detected rising and falling edges in accordance with the trend in the spacing of the rising edges, and rectification means for rectifying the reflection data by discarding selected spurious rising edges and inserting selected contrived rising edges where the trend of the spacing indicates that spurious edges or missed edges have contaminated the reflection data.

68. Apparatus as defined in claim 59, wherein each pattern element as it falls on the object is of dimensions large compared to the dimensions of expected small aberrations in the profile of the object.

69. Apparatus for measuring a surface portion of an object at a distance, comprising:

(a) an illuminator for illuminating the object by projecting from a first predetermined location over a predetermined angular range onto the surface portion of the object a single illuminating beam comprising a projected thin generally fan-shaped beam of electromagnetic radiation that spatially varies along its wider dimension in a pattern comprising a spatially arranged sequence of pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information, said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) a detector for receiving electromagnetic radiation reflected from the surface portion of the object over a scan of the object;

(c) a converter for converting the received electromagnetic radiation into data representing the distribution over a scan of a preselected parameter of the reflected radiation associated with an image of the reflection of at least a portion of the projected pattern reflected from the surface portion of the object;

(d) a discriminator for correlating each such distinguishable portion of the projected pattern with the reflection data generated by the converter by comparing data representing the pattern of the illuminating beam with the said reflection data, so as to establish a match of an identifiable portion of the reflected radiation and a corresponding portion of the illuminating beam whereby the portion of the surface of the object from which the reflected radiation has been reflected is ascertained; and

(e) a profile generator for computing distance data for a scan of the object and coordinating said distance data with the matched reflected radiation data thereby generating profile data representing the profile of at least a portion of the scanned object.

70. In or for use in apparatus for measuring a selected surface of an object at a distance that includes:

(a) a projector for projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a pattern of electromagnetic radiation;

(b) a detector for receiving at a second predetermined location differing from the first predetermined location radiation reflected from the selected surface of the object and measuring radiation reflected from the object including the directional distribution of the electromagnetic radiation over a scan of the object;

(c) a converter for converting the received electromagnetic radiation into data representing an image of the reflection of at least a portion of the projected pattern reflected from the selected surface of the object; and

(d) a coordinate calculator for calculating the spatial coordinates of the locations on the surface of the object on which each identifiable portion of the projected pattern fell, from data representing (i) the locations of the projector and detector, (ii) the known directions of projection for each portion of the projected pattern, and (iii) measured directions from which the reflected radiation was received;

the improvement comprising;

(e) a projector for projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a single selected pattern of electromagnetic radiation comprising an array of spatially arranged pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information, said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern; and

(f) a discriminator for comparing the data generated by the converter with data representing the projected pattern, so as to match identifiable portions of the image with the corresponding portions of the projected pattern, thereby to associate identifiable portions of the image and the measured radiation associated therewith with the spatial coordinates of the locations on the surface of the scanned object on which identifiable portions of the projected pattern fell.

71. Apparatus for measuring a selected surface of an object at a distance, comprising:

(a) a projector for projecting from a first predetermined location over a predetermined angular range onto the selected surface of the object a single pattern of electromagnetic radiation comprising an array of spatially arranged pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information, said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern;

(b) a detector for receiving at a second predetermined location differing from the first predetermined location electromagnetic radiation reflected from the selected surface of the object and measuring (i) the directional distribution of the electromagnetic radiation over a scan of the object and (ii) a preselected received parameter of the reflected radiation whose variable value over the scan is measured, said preselected received parameter being selected for discriminating between and identifying pattern elements and their types within reflection data derived from electromagnetic radiation originating from the projected pattern and reflected from the selected surface of the object;

(c) a converter for converting the received electromagnetic radiation into data representing an image of the reflection of at least a portion of the projected pattern reflected from the selected surface of the object;

(d) a discriminator for comparing the data generated by the converter with data representing the projected pattern, so as to match identifiable portions of the image with the corresponding portions of the projected pattern; and

(e) a coordinate calculator for calculating the spatial coordinates of the locations on the surface of the object on which each identifiable portion of the projected pattern fell, from data representing (i) the locations of the projector and detector, (ii) the known directions of projection for each portion of the projected pattern matched in the discriminator, and (iii) measured directions pursuant to those received by the detector, from which each corresponding portion of the image was received.

72. In a method for unambiguously identifying the location of a point within the view of a two- or three-dimensional measurement sensor with a single projected pattern of electromagnetic radiation comprising the steps of:

(a) projecting a binary pattern of radiation having unique codes over any span of N segments out of a total of as many as 2^N segments onto a surface to be measured, so that said segments form uniquely identifiable local patterns;

(b) recording reflected radiation with a detector and generating a recorded signal;

(c) analyzing the recorded signal and providing a digital representation thereof; and

(d) identifying the location of the point in the pattern by comparing the digital representation with a known reference pattern digital representation;

the improvement comprising;

selecting each segment to have a selected one of two mutually distinguishable spatial structures.

73. The improvement as defined in claim 72, wherein each segment comprises a mark and a contiguous space, each segment is of a width selected to be substantially uniform as projected, and wherein the ratio of the width of the mark to the space is selected for each segment to be one of two mutually distinguishable values.

74. The improvement as defined in claim 72, wherein each segment comprises a mark and a contiguous space, each segment is of a width selected to be substantially uniform as the pattern falls upon the object, and wherein the ratio of the width of the mark to the space is selected for each segment to be one of two mutually distinguishable values.

75. The improvement as defined in claim 72, wherein each segment comprises a mark and a contiguous space, each segment as projected is of a width selected according to a predetermined scheme, and wherein the ratio of the width of the mark to the space is selected for each segment to be one of two mutually distinguishable values.

76. The improvement as defined in claim 72, wherein each discrete spatial structure comprises a binary subpattern comprised of a contiguous sequence of one preselected binary value followed by a second contiguous spatial sequence of the other binary value.

77. The improvement as defined in claim 76, wherein the binary subpatterns are 100 and 110.

78. The improvement as defined in claim 76, wherein the binary subpatterns are 1000 and 1110.

79. In or for use in an apparatus for measuring a surface portion of an object at a distance, means for imposing on projected electromagnetic radiation a single spatially varied pattern comprising an array of spatially arranged and bounded pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least a first and a second discrete physical characteristic, each discrete physical characteristic being associated with a discrete type of information;

said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern.

80. Means as defined in claim 79, wherein each pattern element is comprised of a plurality of parallel bands, each band having a selected one of at least two mutually distinguishable intensities.

81. Means as defined in claim 79, wherein each pattern element is comprised of a plurality of parallel bands, each band having a selected one of at least two mutually distinguishable wavelengths.

82. Means as defined in claim 79, wherein each pattern element is comprised of a plurality of parallel bands, each band having a selected one of at least two mutually distinguishable polarizations.

83. Means as defined in claim 79, wherein each pattern element is comprised of a plurality of parallel bands alternating between high and low intensity, the bands each having a selected one of at least two mutually distinguishable widths.

84. Means as defined in claim 83 wherein the pattern elements are arranged in a sequence that can be represented by a binary number comprising 1'"'"'s and 0'"'"'s, where each 0 represents a narrow high-intensity band followed by a wide low-intensity band, and each 1 represents a wide high-intensity band followed by a narrow low-intensity band, and where any sequence of 1'"'"'s and 0'"'"'s greater in length than a predetermined sequence is unique.

85. Means as defined in claim 83, embodied in a mask.

86. Means as defined in claim 79, wherein the pattern is comprised of a plurality of parallel bands of alternating high and low intensity and a selected one of at least two mutually distinguishable widths, so arranged that when read from one end of the pattern, the pattern comprises pattern elements each comprising a high intensity band and a following low intensity band;

the first discrete characteristic of a pattern element being the rising edge of the high intensity band, providing the start of the pattern element; and

the second discrete physical characteristic being the width of the high intensity band relative to the width of the low intensity band, providing identification of the type of the pattern element.

87. Means as defined in claim 79, comprising a liquid crystal pattern.

88. In or for use in an apparatus for measuring a surface portion of an object at a distance, means for imposing on projected electromagnetic radiation a single spatially varied pattern comprising an array of spatially arranged pattern elements of at least two mutually distinguishable types, where each pattern element comprises at least two contrasting pattern element segments, each of at least two selected ones of said segments representing information of a discrete type;

said pattern being selected so that any portion of the pattern of at least some preselected minimum size is distinguishable from any other portion of the pattern.

89. Means as defined in claim 88, wherein the pattern is comprised of a plurality of pattern element segments of alternating high and low intensity and a selected one of at least two mutually distinguishable widths, so arranged that when read from one end of the pattern, the pattern comprises pattern elements of substantially uniform width, each pattern element comprising a high intensity pattern element segment and a following low intensity pattern element segment;

the high intensity pattern element segment providing information identifying the start of the pattern element; and

the width of the high intensity pattern element segments relative to the width of the low intensity pattern element segments providing information identifying the type of the pattern element.

90. In a method of measuring a selected surface of an object at a distance that comprises the steps of projecting a pattern on the object, detecting and observing the reflection of that pattern, and correlating distance data for the selected surface of the object determined by triangulation with data representing elements of the reflected pattern or an identifiable portion thereof, and wherein some of the pattern data may be missing or contaminated;

an improved method of pattern element recovery comprising;

computing from apparently reliable observed reflection data the pattern trend of an identifiable portion of the reflected pattern;

estimating the expected value of a selected parameter within the observed data associated with the next adjacent observed portion of the pattern outside the reliable data;

testing the observed value of said parameter for the next adjacent observed portion of the pattern so as to assess the degree of correspondence between the observed and estimated expected values for such parameter at such next adjacent observed portion of the pattern; and

accepting, rejecting, or relocating the position of the next adjacent observed portion of the pattern in dependence upon the degree of correspondence, and, where such next adjacent portion of the observed pattern is to be relocated, relocating data associated with said next adjacent portion to a position further away from the apparently reliable observed reflection data and inserting a parameter value for data located between the reliable data and the relocated data;

so as to provide data representing an apparent continuity of the reflected pattern in correspondence with the transmitted pattern, as embodied in the reflected pattern data.

91. In or in combination with apparatus for measuring a selected surface of an object at a distance that includes a projector for projecting a pattern on the object, a receiver for detecting and observing the reflection of that pattern, a correlator for correlating distance data for the selected surface of the object determined by triangulation with data representing elements of the reflected pattern or an identifiable portion thereof, and wherein some of the pattern data may be missing or contaminated;

pattern element recovery apparatus comprising;

means for computing from apparently reliable observed reflection data the pattern trend of an identifiable portion of the reflected pattern;

means for estimating the expected value of a selected parameter within the observed data associated with the next adjacent observed portion of the pattern outside the reliable data;

means for testing the observed value of said parameter for the next adjacent observed portion of the pattern so as to assess the degree of correspondence between the observed and estimated expected values for such parameter at such next adjacent observed portion of the pattern; and

means for accepting, rejecting, or relocating the position of the next adjacent observed portion of the pattern in dependence upon the degree of correspondence, and, where such next adjacent portion of the observed pattern is to be relocated, relocating data associated with said next adjacent portion to a position further away from the apparently reliable observed reflection data and inserting a parameter value for data located between the reliable data and the relocated data;

so as to provide data representing an apparent continuity of the reflected pattern in correspondence with the transmitted pattern, as embodied in the reflected pattern data.

92. In a method of measuring a selected surface of an object at a distance that comprises the steps of projecting a pattern on the object, such pattern being comprised of pattern elements of substantially uniform width but having variable-width bright marks of at least two mutually distinguishable mark widths, and detecting the reflection of that pattern to generate observed reflection data representative of an observed sequence of pattern elements corresponding to a valid sequence of transmitted pattern elements within the pattern, so as to correlate distance data for the selected surface of the object determined by triangulation with received pattern element data;

and wherein some of the observed reflection data may be missing or contaminated;

a method of pattern element recovery for validating a sequence of pattern elements represented by corrected reflection data comprising;

computing from reflection data accepted as reliable data the trend of the reflected pattern in the reflection data;

estimating the expected sequence number in the sequence of pattern elements for the next observed data outside the reliable data for that pattern element apparently next in sequence in said trend so as to assess the degree of correspondence between the observed and estimated sequence numbers; and

accepting, rejecting, or offsetting the data associated with the pattern element apparently next in sequence in the trend in dependence upon the degree of correspondence, and, where such observed pattern element position is to be offset, relocating such pattern element to a position further away from the sequence of positions in the established pattern trend, and inserting data corresponding to a contrived pattern element between the established trend and the offset pattern elements;

so as to provide data representing an apparent continuity of the reflected pattern data in correspondence with the transmitted pattern.

93. In or in combination with apparatus for measuring a selected surface of an object at a distance that includes a projector for projecting a pattern on the object, such pattern being comprised of pattern elements of substantially uniform width but having variable-width bright marks of at least two mutually distinguishable mark widths, a receiver for detecting the reflection of that pattern to generate observed reflection data representative of an observed sequence of pattern elements corresponding to a valid sequence of transmitted pattern elements within the pattern, a correlator for correlating distance data for the selected surface of the object determined by triangulation with the observed sequence of pattern elements;

and wherein some of the expected observed reflection data may be missing or contaminated;

pattern element recovery apparatus for validating a sequence of pattern elements represented by corrected reflection data comprising;

means for computing from reflection data accepted as reliable data the trend of the reflected pattern in the reflection data;

means for estimating the expected sequence number in the sequence of pattern elements for the next observed data outside the reliable data for that pattern element apparently next in sequence in said trend so as to assess the degree of correspondence between the observed and estimated sequence numbers; and

means for accepting, rejecting, or offsetting the data associated with the pattern element apparently next in sequence in the trend in dependence upon the degree of correspondence, and, where such observed pattern element position is to be offset, relocating such pattern element to a position further away from the sequence of positions in the established pattern trend, and inserting data corresponding to a contrived pattern element between the established trend and the offset pattern elements;

so as to provide data representing an apparent continuity of the reflected pattern data in correspondence with the transmitted pattern.

94. In or in combination use with apparatus for measuring a selected surface of an object at a distance that comprises means for projecting a pattern of electromagnetic radiation on the object, means for detecting and observing the reflection of that pattern, means for correlating distance data for the selected surface of the object with spatial coordinates on that surface determined by triangulation with data representing elements of the reflected pattern or an identifiable portion thereof, and wherein some of the pattern data may be missing or contaminated;

pattern element recovery apparatus comprising;

means for computing from apparently reliable observed reflection data the pattern trend of an identifiable portion of the reflected pattern;

means for estimating the expected value of a selected parameter within the observed data associated with the next adjacent observed portion of the pattern outside the reliable data;

means for testing the observed value of said parameter for the next adjacent observed portion of the pattern so as to assess the degree of correspondence between the observed and estimated expected values for such parameter at such next adjacent observed portion of the pattern; and

means for accepting, rejecting, or relocating the position of the next adjacent observed portion of the pattern in dependence upon the degree of correspondence, and, where such next adjacent portion of the observed pattern is to be relocated, relocating data associated with said next adjacent portion to a position further away from the apparently reliable observed reflection data and inserting a parameter value for data located between the reliable data and the relocated data;

so as to provide a data signal representing an apparent continuity of the reflected pattern in correspondence with the transmitted pattern, as embodied in the reflected pattern data.

95. In or in combination with apparatus for measuring a selected surface of an object at a distance that comprises means for projecting a pattern of electromagnetic radiation on the object, such pattern being comprised of pattern elements of substantially uniform width but having variable-width bright marks of at least two mutually distinguishable mark widths, means for detecting the reflection of that pattern to generate observed reflection data representative of an observed sequence of pattern elements corresponding to a valid sequence of transmitted pattern elements within the pattern, and means for correlating distance data for the selected surface of the object with spatial coordinates on that surface determined by triangulation and wherein some of the expected observed reflection data may be missing or contaminated;

pattern element recovery apparatus for validating a sequence of pattern elements represented by corrected reflection data comprising;

means for computing from reflection data accepted as reliable data the trend of the reflected pattern in the reflection data;

means for estimating the expected sequence number in the sequence of pattern elements for the next observed data outside the reliable data for that pattern element apparently next in sequence in said trend so as to assess the degree of correspondence between the observed and estimated sequence numbers; and

means for accepting, rejecting, or offsetting the data associated with the pattern element apparently next in sequence in the trend in dependence upon the degree of correspondence, and, where such observed pattern element position is to be offset, relocating such pattern element to a position further away from the sequence of positions in the established pattern trend, and inserting data corresponding to a contrived pattern element between the established trend and the offset pattern elements;

so as to provide a data signal representing an apparent continuity of the reflected pattern data in correspondence with the transmitted pattern.