×

Diffuse reflectance probe

  • US 5,625,459 A
  • Filed: 03/03/1995
  • Issued: 04/29/1997
  • Est. Priority Date: 03/03/1995
  • Status: Expired due to Term
First Claim
Patent Images

1. A probe for viewing a sample in a viewing area immediately adjacent the probe comprising:

  • a light transmitting element having a first axis and a first distal end for transmitting light;

    a light collecting element having a second axis and a second distal end being located adjacent to the light transmitting element for collecting light; and

    a sample viewing window disposed adjacent the first and second distal ends, said sample viewing window having sample viewing surface and a light coupling surface including a peripheral bevel surface in communication with the light transmitting element proximate the first distal end and central end face in communication with the light collecting element proximate the second distal end, said light transmitting element and said light collecting element being in optical communication with the viewing area through said window so that when a sample is positioned within the viewing area proximate the sample viewing surface a substantial portion of the light transmitted by light transmitting element is directed from the first distal end to the bevel surface through the window into the viewing area and is reflected by the sample through the window as diffusely reflected light and is collected from the end face by the second distal end of the light collecting element, said bevel surface of the window resulting in a working distance of the viewing area within about 5 mm of said window.

View all claims
  • 12 Assignments
Timeline View
Assignment View
    ×
    ×