Micromachined torsional scanner

• US 5,629,790 A
• Filed: 10/18/1993
• Issued: 05/13/1997
• Est. Priority Date: 10/18/1993
• Status: Expired due to Term

• Current Assignee: RPX Clearinghouse LLC (RPX Corporation)
• Original Assignee: Xros, Inc. (Nortel Networks Corporation)
• Inventors: Neukermans, Armand P., Slater, Timothy G.
• Primary Examiner(s): Phan, James
• Application Number:
  US08/139,397
• Time in Patent Office: 1,303 Days
• Field of Search: 359/196-199, 359/201-203, 359/212-214, 359/223-226, 359/230, 359/290-293, 250/230, 250/234, 310/15, 310/36, 310/40 MM
• US Class Current: 359/198.1
• CPC Class Codes: G02B 26/0841 the reflecting element being moved or deformed by electrostatic means
• CPC Class Codes: G02B 26/085 the reflecting means being moved or deformed by electromagnetic means
• CPC Class Codes: G02B 26/0858 the reflecting means being moved or deformed by piezoelectric means
• CPC Class Codes: G02B 26/101 with both horizontal and vertical deflecting means, e.g. raster or XY scanners colour television using laser beams scanning a display screen H04N9/3129

Abstract

A frequency-locked torsional scanner of the type having a micromachined mirror formed on a surface of a silicon wafer section supported within a larger wafer section by a pair of opposed torsion bars. The principal vibrational frequency of the mirror is selected to be at least 20% higher than other modes of vibration. To prevent breakage, the torsion bars are hardened by conversion of at least a surface layer to silicon carbide or nitride. A pair of scanners with orthogonal torsion bars may be mounted in a vacuum enclosure for two-dimensional scanning at different rates suitable for television display. In alternate embodiments, a detector and a scanner may be built on a plate on the same supported wafer section or two scanners may be independently supported or one scanner and one detector may be independently supported as two plates. The mirror may be driven electrostatically, magnetically, or by both methods.

Claims

1. A torsional scanner comprising:

a planar micromachined mirror formed in a surface layer of a silicon wafer section, said mirror having a mirror surface;

a pair of opposed torsion bars for supporting said mirror as an island within the wafer section, said mirror thus supported within the wafer section by said torsion bars exhibiting a plurality of vibrational modes including a principal torsional vibrational mode about an axis that is collinear with said torsion bars, a vertical shaking vibrational mode, a vertical rocking vibrational mode, a lateral shaking vibrational mode, and a lateral rocking vibrational mode, each such vibrational mode of said mirror having a vibrational frequency, the vibrational frequency of the principal torsional vibrational mode being lower by at least 20% than the vibrational frequency of any other vibrational mode of said mirror; and

drive means for communicating a reciprocating torsional force to said mirror, thereby establishing a rotary motion of said mirror about the axis that is collinear with said torsion bars.

2. The scanner of claim 1 wherein said mirror surface is disposed on one side of said silicon wafer section, and the drive means comprises a pair of planar, spaced apart drive electrodes communicating force to said mirror from the side of the mirror on which the mirror surface is disposed.

3. The scanner of claim 1 wherein a second mirror surface is disposed on a side of said silicon section opposite said first mirror surface.

4. The scanner of claim 1 wherein each torsion bar connects to the silicon wafer section by a rounded hinge portion.

5. The scanner of claim 1 wherein said drive means includes:

a magnetic field means disposed adjacent to the mirror; and

a conductive coil carried on said mirror surface that is in a galvanometric relationship with said magnetic field means whereby a torque is applied to said mirror and said torsion bars if an electric current flows through said conductive coil.

6. The scanner of claim 1 wherein said torsional scanner further comprises an evacuated enclosure surrounding said mirror and torsion bars, and said evacuated enclosure includes a window transmissive of light that faces said mirror.

7. A micromachined scanner assembly comprising:

a micromachined mirror formed on a surface of a silicon wafer island supported within a first wafer section by a pair of opposed torsion bars, said mirror thus supported within the wafer section by said torsion bars exhibiting a plurality of vibrational modes including a principal torsional vibrational mode about an axis that is collinear with said torsion bars, a vertical shaking vibrational mode, a vertical rocking vibrational mode, a lateral shaking vibrational mode, and a lateral rocking vibrational mode, each such vibrational mode of said mirror having a vibrational frequency, the vibrational frequency of the principal torsional vibrational mode being lower by at least 20% than the vibrational frequency of any other vibrational mode of said mirror; and

magnetic drive means for communicating a torsional force to said silicon wafer island, said magnetic drive means including;

a conductive coil disposed on said silicon wafer island; and

a magnetic field means disposed adjacent to said silicon wafer island in a galvanometric relationship with said conductive coil.

8. A torsional scanner assembly comprising:

a planar frame having opposed, axially aligned torsion bars that support a planar, central mirror plate, said frame, torsion bars and mirror plate all monolithically fabricated from a planar semiconductor stress-free single crystal silicon layer of a substrate;

said central mirror plate thus supported within the planar frame by said torsion bars having a center, defining a mirror rest plane if no external force is applied to said central mirror plate, and also exhibiting a plurality of vibrational modes including a principal torsional vibrational mode about an axis that is collinear with said torsion bars, a vertical shaking vibrational mode, a vertical rocking vibrational mode, a lateral shaking vibrational mode, and a lateral rocking vibrational mode, each such vibrational mode of said central mirror plate having a vibrational frequency, the vibrational frequency of the principal torsional vibrational mode being lower by at least 20% than the vibrational frequency of any other vibrational mode of said central mirror plate; and

drive means for imparting rotary motion to said central mirror plate about the axis that is collinear with said torsion bars.

9. The scanner of claim 8 wherein said central mirror plate has front and back sides, and said drive means comprises a pair of electrodes spaced apart from the front side of the central mirror plate, the electrodes being displaced from the torsion bars.

10. The scanner of claim 9 wherein said drive means includes means for applying voltage first to one electrode and then to the other electrode in an oscillatory manner.

11. The scanner of claim 8 wherein said central mirror plate has front and back sides, and said drive means comprises a pair of electrodes spaced apart from the back side of the central mirror plate, the electrodes being displaced from the torsion bars.

12. The scanner of claim 11 wherein said drive means includes means for applying voltage first to one electrode and then to the other electrode in an oscillatory manner.

13. The scanner of claim 8 wherein said central mirror plate has front and back sides and said drive means comprises two pairs of electrodes, a first pair spaced apart from the front side of the central mirror plate and a second pair spaced apart from the back side of the central mirror plate, the electrodes spaced apart both from the front side and from the back side of the central mirror plate being displaced from the torsion bars.

14. The scanner of claim 13 wherein said drive means includes means for applying voltage in an oscillatory manner first to a first pair of electrodes arranged diagonally across the torsion bars, and then to a second pair of electrodes arranged diagonally across the torsion bars.

15. The scanner of claim 8 wherein said drive means comprises:

means for applying a magnetic field substantially parallel to the mirror rest plane of said central mirror plate; and

a coil means disposed on said central mirror plate and in the magnetic field.

16. The scanner of claim 8 wherein said single crystal silicon layer is in a Simox wafer.

17. The scanner of claim 8 wherein said single crystal silicon layer is in a silicon-on-insulator wafer.

18. The scanner of claim 8 further comprising torsion sensing means disposed on one of said torsion bars for generating a torsion signal that indicates angular deflection of said central mirror plate.

19. The scanner of claim 18 wherein said torsion sensing means comprises at least three electrical contacts on said torsion bar, and means for applying an electric current across at least a pair of said contacts, and the torsion signal is sensed from a pair of said contacts.

20. The scanner of claim 19 wherein an A.C. current is applied across the pair of contacts whereby the torsion signal becomes a modulation envelope of that A.C. current.

21. The scanner of claim 18 wherein said torsion sensing means comprises:

at least four electrical contacts disposed on said torsion bar with a pair of said contacts being disposed along a line that is substantially parallel to the axis for the principal torsional vibrational mode, which axis is collinear with said torsion bars; and

means for applying an electric current across a first pair of said contacts while the torsion signal is sensed from a second pair of said contacts oriented perpendicular to a line joining the first pair of said contacts.

22. The scanner of claim 21 wherein an A.C. current is applied across the pair of contacts whereby the torsion signal becomes a modulation envelope of that A.C. current.

23. The scanner of claim 8 further comprising torsion sensing means disposed on one of said torsion bars for generating a torsion signal that is fed back for establishing oscillation of said central mirror plate at the vibrational frequency of the principal torsional vibrational mode of said central mirror plate.

24. The scanner of claim 23 wherein said torsion sensing means comprises at least three electrical contacts on said torsion bar, and means for applying an electric current across at least a pair of said contacts, and the torsion signal is sensed from a pair of said contacts.

25. The scanner of claim 24 wherein an A.C. current is applied across the pair of contacts whereby the torsion signal becomes a modulation envelope of that A.C. current.

26. The scanner of claim 23 wherein said torsion sensing means comprises:

at least four electrical contacts disposed on said torsion bar with a pair of said contacts being disposed along a line that is substantially parallel to the axis for the principal torsional vibrational mode, which axis is collinear with said torsion bars; and

means for applying an electric current across a first pair of said contacts while the torsion signal is sensed from a second pair of said contacts oriented perpendicular to a line joining the first pair of said contacts.

27. The scanner of claim 26 wherein an A.C. current is applied across the pair of contacts whereby the torsion signal becomes a modulation envelope of that A.C. current.

28. The scanner of claim 8 wherein said central mirror plate is disposed in a sealed vacuum housing having a transparent thin film window over the central mirror plate.

29. The scanner of claim 28 wherein said thin film window is selected from the group of silicon nitride, silicon carbide, boron nitride, oxynitride or silicon.

30. The scanner of claim 8 wherein said semiconductor substrate is a silicon material which has both a <

100>

crystallographic direction and a <

110>

crystallographic direction, and said torsion bars are oriented in the <

110>

direction for an n-type silicon layer.

31. The scanner of claim 8 wherein said semiconductor substrate is a silicon material which has both a <

100>

crystallographic direction and a <

110>

crystallographic direction, and said torsion bars are oriented in the <

100>

direction for a p-type silicon layer.

32. The scanner of claim 8 wherein said central mirror plate has a central mirror portion surrounded by a light detector portion, both portions moving together.

33. The scanner of claim 8 wherein said torsion bars are joined to said frame with rounded corners.

34. The scanner of claim 8 wherein said torsion bars have a surface layer of silicon carbide or silicon nitride.

35. The scanner of claim 8 wherein said planar frame is mounted on a second scanner having a scan axis that is not parallel to the axially aligned torsion bars supporting the central mirror plate.

36. The scanner of claim 35 wherein said second scanner comprises:

a larger silicon section that encompasses said planar frame, torsion bars and central mirror plate; and

a second pair of axially aligned torsion bars disposed between said planar frame and said larger silicon section for supporting said planar frame within said larger silicon section;

said second pair of torsion bars and larger silicon section being fabricated from the same planar semiconductor stress-free single crystal silicon layer as said central mirror plate, torsion bars, and planar frame;

said second pair of torsion bars being oriented collinear with the scan axis of said second scanner whereby said second pair of torsion bars permits rotation of said planar frame about the scan axis.

37. The scanner of claim 36 further comprising second drive means for imparting rotary motion to said planar frame about the scan axis of said second scanner.

38. The scanner of claim 37 wherein one of said drive means employs electrostatic force, and the other drive means employs magnetic force.

39. The scanner of claim 37 wherein said drive means for imparting rotary motion to said central mirror plate employs electrostatic force, and said second drive means for imparting rotary motion to said planar frame employs magnetic force.

40. The scanner of claim 8 wherein the central mirror plate is substantially thinner than the planar frame.

41. The scanner of claim 8 wherein mass around the center of said central mirror plate is mostly etched away.